TW200732915A - Test method and system thereof of I2C signal - Google Patents

Test method and system thereof of I2C signal

Info

Publication number
TW200732915A
TW200732915A TW095106589A TW95106589A TW200732915A TW 200732915 A TW200732915 A TW 200732915A TW 095106589 A TW095106589 A TW 095106589A TW 95106589 A TW95106589 A TW 95106589A TW 200732915 A TW200732915 A TW 200732915A
Authority
TW
Taiwan
Prior art keywords
signal
data
tested data
test method
tested
Prior art date
Application number
TW095106589A
Other languages
Chinese (zh)
Other versions
TWI296081B (en
Inventor
Yi-Tzung Liau
Jen-Yi Hung
Ming-Bian Li
Original Assignee
Panasonic Taiwan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Taiwan Co Ltd filed Critical Panasonic Taiwan Co Ltd
Priority to TW095106589A priority Critical patent/TW200732915A/en
Publication of TW200732915A publication Critical patent/TW200732915A/en
Application granted granted Critical
Publication of TWI296081B publication Critical patent/TWI296081B/zh

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Debugging And Monitoring (AREA)

Abstract

A test method of I2C signal is used to determine whether the tested data of I2C signal are wrong or not. The method includes the following steps as: (A) acquiring the I2C signal of an electronic apparatus; (B) depending on the preset form to analyze the I2C signal and then acquire the tested data; (C) digitizing the tested data and depending on the established transforming table to transform them to be an easily readable data form; and (D) showing the readable data. Comparing to the current waveform that is generated by an oscilloscope is difficult to read. This method is directly showing the tested data, so that the tested data are easier to read and the time for testing is shorter.
TW095106589A 2006-02-27 2006-02-27 Test method and system thereof of I2C signal TW200732915A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095106589A TW200732915A (en) 2006-02-27 2006-02-27 Test method and system thereof of I2C signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095106589A TW200732915A (en) 2006-02-27 2006-02-27 Test method and system thereof of I2C signal

Publications (2)

Publication Number Publication Date
TW200732915A true TW200732915A (en) 2007-09-01
TWI296081B TWI296081B (en) 2008-04-21

Family

ID=45068639

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095106589A TW200732915A (en) 2006-02-27 2006-02-27 Test method and system thereof of I2C signal

Country Status (1)

Country Link
TW (1) TW200732915A (en)

Also Published As

Publication number Publication date
TWI296081B (en) 2008-04-21

Similar Documents

Publication Publication Date Title
MY155846A (en) A method for testing in a reconfigurable tester
WO2006068936A3 (en) A method and system for testing semiconductor devices
SG126066A1 (en) Inspection method and system using multifrequency phase analysis
TW200637161A (en) Correlation circuit for time-interleaved ADC and method thereof
WO2003065890A3 (en) Test equipment and portable test device
DE50200869D1 (en) METHOD AND DEVICE FOR CHARACTERIZING A SIGNAL AND METHOD AND DEVICE FOR GENERATING AN INDEXED SIGNAL
TW200714903A (en) Carousel device, system and method for electronic circuit tester
ATE381706T1 (en) DEVICE AND METHOD FOR MEASURING COMPONENTS
WO2004075011A3 (en) Methods and apparatus for data analysis
WO2006004829A3 (en) Precise time measurement apparatus and method
TW200739104A (en) Method and device for the testing of non-componented circuit boards
MX2019015763A (en) Techniques for detecting media playback errors.
UA74399C2 (en) Method for testing waveform quality and a device for the realization of the method (variants)
ITPR20060012A1 (en) PROCEDURE AND APPARATUS FOR ASSESSING THE SURFACE POLLUTION LEVEL OF AN ISOLATOR OUTDOOR IN MEDIUM / HIGH VOLTAGE.
TW200801935A (en) Sampling a device bus
WO2008114700A1 (en) Measuring apparatus, measuring method, testing apparatus, electronic device and program
US20140375346A1 (en) Test control device and method for testing signal integrities of electronic product
TW200739109A (en) Test method, test system and assist board
TW200636272A (en) Test equipment, test method, manufacturing method of electronic device, test simulator, and test simulation method
US20100052712A1 (en) Test apparatus for testing circuit board
TW200612239A (en) Methods and apparatus for providing scan patterns to an electronic device
WO2008022251A3 (en) Multiple probe acquisition system
TW200716989A (en) Testing apparatus, fixture board and pin electronics card
TW200507144A (en) Automatic test system with easily modified software
CN105004981A (en) LED chip service life accelerated estimation method

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees