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Application filed by Panasonic Taiwan Co LtdfiledCriticalPanasonic Taiwan Co Ltd
Priority to TW095106589ApriorityCriticalpatent/TW200732915A/en
Publication of TW200732915ApublicationCriticalpatent/TW200732915A/en
Application grantedgrantedCritical
Publication of TWI296081BpublicationCriticalpatent/TWI296081B/zh
A test method of I2C signal is used to determine whether the tested data of I2C signal are wrong or not. The method includes the following steps as: (A) acquiring the I2C signal of an electronic apparatus; (B) depending on the preset form to analyze the I2C signal and then acquire the tested data; (C) digitizing the tested data and depending on the established transforming table to transform them to be an easily readable data form; and (D) showing the readable data. Comparing to the current waveform that is generated by an oscilloscope is difficult to read. This method is directly showing the tested data, so that the tested data are easier to read and the time for testing is shorter.
TW095106589A2006-02-272006-02-27Test method and system thereof of I2C signal
TW200732915A
(en)