TW200731506A - Integrated circuit for programming an electrical fuse and device thereof - Google Patents

Integrated circuit for programming an electrical fuse and device thereof

Info

Publication number
TW200731506A
TW200731506A TW096100793A TW96100793A TW200731506A TW 200731506 A TW200731506 A TW 200731506A TW 096100793 A TW096100793 A TW 096100793A TW 96100793 A TW96100793 A TW 96100793A TW 200731506 A TW200731506 A TW 200731506A
Authority
TW
Taiwan
Prior art keywords
programming
electrical fuse
integrated circuit
same
resistance level
Prior art date
Application number
TW096100793A
Other languages
English (en)
Other versions
TWI327371B (en
Inventor
Yung-Lung Lin
Jui-Jen Wu
Hung-Jen Liao
Original Assignee
Taiwan Semiconductor Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg Co Ltd filed Critical Taiwan Semiconductor Mfg Co Ltd
Publication of TW200731506A publication Critical patent/TW200731506A/zh
Application granted granted Critical
Publication of TWI327371B publication Critical patent/TWI327371B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Read Only Memory (AREA)
TW096100793A 2006-01-10 2007-01-09 Integrated circuit for programming an electrical fuse and device thereof TWI327371B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/328,780 US7271644B2 (en) 2006-01-10 2006-01-10 Multi-state electrical fuse

Publications (2)

Publication Number Publication Date
TW200731506A true TW200731506A (en) 2007-08-16
TWI327371B TWI327371B (en) 2010-07-11

Family

ID=38232234

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096100793A TWI327371B (en) 2006-01-10 2007-01-09 Integrated circuit for programming an electrical fuse and device thereof

Country Status (2)

Country Link
US (1) US7271644B2 (zh)
TW (1) TWI327371B (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7459956B2 (en) * 2004-05-05 2008-12-02 Taiwan Semiconductor Manufacturing Co., Ltd. Storing information with electrical fuse for device trimming
DE102005019587B4 (de) * 2005-04-27 2007-05-10 Infineon Technologies Ag Fuse-Speicherzelle mit verbessertem Schutz gegen unberechtigten Zugriff
US7688654B2 (en) * 2006-06-30 2010-03-30 International Business Machines Corporation Structure for differential eFUSE sensing without reference fuses
US7477555B2 (en) * 2006-06-30 2009-01-13 International Business Machines Corporation System and method for differential eFUSE sensing without reference fuses
US7689950B2 (en) * 2007-01-12 2010-03-30 International Business Machines Corporation Implementing Efuse sense amplifier testing without blowing the Efuse
US7489572B2 (en) * 2007-01-12 2009-02-10 International Business Machines Corporation Method for implementing eFuse sense amplifier testing without blowing the eFuse
JP2009016568A (ja) * 2007-07-04 2009-01-22 Toshiba Corp 半導体集積回路装置
US20090135640A1 (en) * 2007-11-28 2009-05-28 International Business Machines Corporation Electromigration-programmable semiconductor device with bidirectional resistance change
US7598803B2 (en) 2007-12-26 2009-10-06 National Kaohsiung University Of Applied Sciences Combined phase-locked loop and amplitude-locked loop module for switching FM signals
TWI494934B (zh) 2013-10-25 2015-08-01 Nuvoton Technology Corp 熔絲電路
JP2015211326A (ja) * 2014-04-25 2015-11-24 株式会社東芝 プログラマブル論理回路および不揮発性ｆｐｇａ

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5966339A (en) * 1998-06-02 1999-10-12 International Business Machines Corporation Programmable/reprogrammable fuse
US7459956B2 (en) * 2004-05-05 2008-12-02 Taiwan Semiconductor Manufacturing Co., Ltd. Storing information with electrical fuse for device trimming
US6956784B1 (en) * 2004-08-03 2005-10-18 Analog Devices, Inc. Writable memory

Also Published As

Publication number Publication date
US7271644B2 (en) 2007-09-18
US20070159231A1 (en) 2007-07-12
TWI327371B (en) 2010-07-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees