TW200723419A - Lead-free solder bump - Google Patents
Lead-free solder bumpInfo
- Publication number
- TW200723419A TW200723419A TW094142246A TW94142246A TW200723419A TW 200723419 A TW200723419 A TW 200723419A TW 094142246 A TW094142246 A TW 094142246A TW 94142246 A TW94142246 A TW 94142246A TW 200723419 A TW200723419 A TW 200723419A
- Authority
- TW
- Taiwan
- Prior art keywords
- solder bump
- lead
- free solder
- bump
- silver
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Abstract
A lead-free solder bump is provided, which is a Tin-Silver-Copper (Sn-Ag-Cu) bump, wherein a silver (Ag) content thereof is less than or equal to 2 wt%. Thus, ductility of the lead-free solder bump can be increased by decreasing the silver (Ag) content. Furthermore, at least one trace element selected from stibium (Sb), zinc (Zn), nickel (Ni), and germanium (Ge) is incorporated into the lead-free solder bump with a content less than or equal to 1 wt%. A thickness of an intermetallic compound (IMC) formed between the lead-free solder bump and a bump pad where the solder bump is mounted can therefore be reduced to provide the entire solder bump structure with additional stress endurance, so as to increase reliability of packaged products.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094142246A TWI299533B (en) | 2005-12-01 | 2005-12-01 | Lead-free solder bump |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094142246A TWI299533B (en) | 2005-12-01 | 2005-12-01 | Lead-free solder bump |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200723419A true TW200723419A (en) | 2007-06-16 |
TWI299533B TWI299533B (en) | 2008-08-01 |
Family
ID=45069715
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094142246A TWI299533B (en) | 2005-12-01 | 2005-12-01 | Lead-free solder bump |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI299533B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI684017B (en) * | 2018-02-13 | 2020-02-01 | 矽品精密工業股份有限公司 | Bump testing apparatus and method |
-
2005
- 2005-12-01 TW TW094142246A patent/TWI299533B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI684017B (en) * | 2018-02-13 | 2020-02-01 | 矽品精密工業股份有限公司 | Bump testing apparatus and method |
Also Published As
Publication number | Publication date |
---|---|
TWI299533B (en) | 2008-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |