TW200717775A - Monolithically integrated circuit arrangement for thermal time determination, and method for determining a time interval - Google Patents

Monolithically integrated circuit arrangement for thermal time determination, and method for determining a time interval

Info

Publication number
TW200717775A
TW200717775A TW095127415A TW95127415A TW200717775A TW 200717775 A TW200717775 A TW 200717775A TW 095127415 A TW095127415 A TW 095127415A TW 95127415 A TW95127415 A TW 95127415A TW 200717775 A TW200717775 A TW 200717775A
Authority
TW
Taiwan
Prior art keywords
determining
integrated circuit
circuit arrangement
monolithically integrated
time interval
Prior art date
Application number
TW095127415A
Other languages
Chinese (zh)
Inventor
Peter Flohrs
Hartmut Michel
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of TW200717775A publication Critical patent/TW200717775A/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/60—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being bipolar transistors
    • H03K17/602—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being bipolar transistors in integrated circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/28—Modifications for introducing a time delay before switching
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/296—Time-programme switches providing a choice of time-intervals for executing more than one switching action and automatically terminating their operation after the programme is completed
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

The invention proposes a monolithically integrated circuit arrangement having a first temperature sensor (1) and at least one second temperature sensor (2) and also a method for determining a time interval, where the first temperature sensor (1) and the second temperature sensor (2) have a different form of thermal coupling to a heat source (4).
TW095127415A 2005-07-29 2006-07-27 Monolithically integrated circuit arrangement for thermal time determination, and method for determining a time interval TW200717775A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE200510035605 DE102005035605A1 (en) 2005-07-29 2005-07-29 Monolithic integrated circuit arrangement, has first temperature sensor and second temperature sensor and has different form of thermal coupling to heat source, evaluation circuit is provided for evaluation of temperature gradient

Publications (1)

Publication Number Publication Date
TW200717775A true TW200717775A (en) 2007-05-01

Family

ID=37650341

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127415A TW200717775A (en) 2005-07-29 2006-07-27 Monolithically integrated circuit arrangement for thermal time determination, and method for determining a time interval

Country Status (3)

Country Link
DE (1) DE102005035605A1 (en)
TW (1) TW200717775A (en)
WO (1) WO2007012554A1 (en)

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US8908995B2 (en) 2009-01-12 2014-12-09 Intermec Ip Corp. Semi-automatic dimensioning with imager on a portable device
US9779546B2 (en) 2012-05-04 2017-10-03 Intermec Ip Corp. Volume dimensioning systems and methods
US10007858B2 (en) 2012-05-15 2018-06-26 Honeywell International Inc. Terminals and methods for dimensioning objects
US10321127B2 (en) 2012-08-20 2019-06-11 Intermec Ip Corp. Volume dimensioning system calibration systems and methods
US9939259B2 (en) 2012-10-04 2018-04-10 Hand Held Products, Inc. Measuring object dimensions using mobile computer
US20140104413A1 (en) 2012-10-16 2014-04-17 Hand Held Products, Inc. Integrated dimensioning and weighing system
US10228452B2 (en) 2013-06-07 2019-03-12 Hand Held Products, Inc. Method of error correction for 3D imaging device
US9823059B2 (en) 2014-08-06 2017-11-21 Hand Held Products, Inc. Dimensioning system with guided alignment
US10810715B2 (en) 2014-10-10 2020-10-20 Hand Held Products, Inc System and method for picking validation
US9779276B2 (en) 2014-10-10 2017-10-03 Hand Held Products, Inc. Depth sensor based auto-focus system for an indicia scanner
US10775165B2 (en) 2014-10-10 2020-09-15 Hand Held Products, Inc. Methods for improving the accuracy of dimensioning-system measurements
US9897434B2 (en) 2014-10-21 2018-02-20 Hand Held Products, Inc. Handheld dimensioning system with measurement-conformance feedback
US9752864B2 (en) 2014-10-21 2017-09-05 Hand Held Products, Inc. Handheld dimensioning system with feedback
US10060729B2 (en) 2014-10-21 2018-08-28 Hand Held Products, Inc. Handheld dimensioner with data-quality indication
US9786101B2 (en) 2015-05-19 2017-10-10 Hand Held Products, Inc. Evaluating image values
US10066982B2 (en) 2015-06-16 2018-09-04 Hand Held Products, Inc. Calibrating a volume dimensioner
US20160377414A1 (en) 2015-06-23 2016-12-29 Hand Held Products, Inc. Optical pattern projector
US9835486B2 (en) 2015-07-07 2017-12-05 Hand Held Products, Inc. Mobile dimensioner apparatus for use in commerce
EP3396313B1 (en) 2015-07-15 2020-10-21 Hand Held Products, Inc. Mobile dimensioning method and device with dynamic accuracy compatible with nist standard
US20170017301A1 (en) 2015-07-16 2017-01-19 Hand Held Products, Inc. Adjusting dimensioning results using augmented reality
US10094650B2 (en) 2015-07-16 2018-10-09 Hand Held Products, Inc. Dimensioning and imaging items
US10249030B2 (en) 2015-10-30 2019-04-02 Hand Held Products, Inc. Image transformation for indicia reading
US10225544B2 (en) 2015-11-19 2019-03-05 Hand Held Products, Inc. High resolution dot pattern
US10025314B2 (en) 2016-01-27 2018-07-17 Hand Held Products, Inc. Vehicle positioning and object avoidance
US10339352B2 (en) 2016-06-03 2019-07-02 Hand Held Products, Inc. Wearable metrological apparatus
US9940721B2 (en) 2016-06-10 2018-04-10 Hand Held Products, Inc. Scene change detection in a dimensioner
US10163216B2 (en) 2016-06-15 2018-12-25 Hand Held Products, Inc. Automatic mode switching in a volume dimensioner
US10909708B2 (en) 2016-12-09 2021-02-02 Hand Held Products, Inc. Calibrating a dimensioner using ratios of measurable parameters of optic ally-perceptible geometric elements
US11047672B2 (en) 2017-03-28 2021-06-29 Hand Held Products, Inc. System for optically dimensioning
US10733748B2 (en) 2017-07-24 2020-08-04 Hand Held Products, Inc. Dual-pattern optical 3D dimensioning
US10584962B2 (en) 2018-05-01 2020-03-10 Hand Held Products, Inc System and method for validating physical-item security
US11639846B2 (en) 2019-09-27 2023-05-02 Honeywell International Inc. Dual-pattern optical 3D dimensioning

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Publication number Priority date Publication date Assignee Title
US4058779A (en) * 1976-10-28 1977-11-15 Bell Telephone Laboratories, Incorporated Transistor oscillator circuit using thermal feedback for oscillation
DE2853238A1 (en) * 1978-12-09 1980-07-10 Itt Ind Gmbh Deutsche Monolithic, integrated time switching component - has power stage heating integrated circuit and controlled by switching stage assigned to differential amplifier
GB2248151A (en) * 1990-09-24 1992-03-25 Philips Electronic Associated Temperature sensing and protection circuit.
EP0927461B1 (en) * 1996-09-18 2001-10-17 Infineon Technologies AG Temperature protected electric switching component
US5838187A (en) * 1997-02-10 1998-11-17 Lucent Technologies Inc. Integrated circuit thermal shutdown system utilizing a thermal sensor
GB2327161B (en) * 1997-07-10 2001-05-16 Ericsson Telefon Ab L M Timing circuit
DE19832558B4 (en) * 1998-07-20 2005-10-06 Infineon Technologies Ag Semiconductor arrangement with at least one semiconductor chip

Also Published As

Publication number Publication date
DE102005035605A1 (en) 2007-02-01
WO2007012554A1 (en) 2007-02-01

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