TW200717633A - Semiconductor cleaning formulation containing phosphonic acid and ascorbic acid, and cleaning method - Google Patents
Semiconductor cleaning formulation containing phosphonic acid and ascorbic acid, and cleaning methodInfo
- Publication number
- TW200717633A TW200717633A TW095119239A TW95119239A TW200717633A TW 200717633 A TW200717633 A TW 200717633A TW 095119239 A TW095119239 A TW 095119239A TW 95119239 A TW95119239 A TW 95119239A TW 200717633 A TW200717633 A TW 200717633A
- Authority
- TW
- Taiwan
- Prior art keywords
- acid
- cleaning
- ascorbic acid
- phosphonic acid
- semiconductor
- Prior art date
Links
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 title abstract 6
- 238000004140 cleaning Methods 0.000 title abstract 6
- 239000000203 mixture Substances 0.000 title abstract 5
- ABLZXFCXXLZCGV-UHFFFAOYSA-N Phosphorous acid Chemical compound OP(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 title abstract 3
- 229960005070 ascorbic acid Drugs 0.000 title abstract 3
- 235000010323 ascorbic acid Nutrition 0.000 title abstract 3
- 239000011668 ascorbic acid Substances 0.000 title abstract 3
- 238000000034 method Methods 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 3
- 238000009472 formulation Methods 0.000 title 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 abstract 2
- 150000007514 bases Chemical class 0.000 abstract 2
- DDFHBQSCUXNBSA-UHFFFAOYSA-N 5-(5-carboxythiophen-2-yl)thiophene-2-carboxylic acid Chemical compound S1C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)S1 DDFHBQSCUXNBSA-UHFFFAOYSA-N 0.000 abstract 1
- KVBCYCWRDBDGBG-UHFFFAOYSA-N azane;dihydrofluoride Chemical compound [NH4+].F.[F-] KVBCYCWRDBDGBG-UHFFFAOYSA-N 0.000 abstract 1
- 239000003795 chemical substances by application Substances 0.000 abstract 1
- 239000007788 liquid Substances 0.000 abstract 1
- 239000003960 organic solvent Substances 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
- H01L21/02071—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a delineation, e.g. RIE, of conductive layers
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
- C11D7/04—Water-soluble compounds
- C11D7/08—Acids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
- C11D7/04—Water-soluble compounds
- C11D7/10—Salts
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/26—Organic compounds containing oxygen
- C11D7/265—Carboxylic acids or salts thereof
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/34—Organic compounds containing sulfur
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/50—Solvents
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/426—Stripping or agents therefor using liquids only containing organic halogen compounds; containing organic sulfonic acids or salts thereof; containing sulfoxides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
Abstract
To provide a semiconductor cleaning liquid composition containing phosphonic acid and ascorbic acid, and provide a relevant method of cleaning. A composition that in the operation of semiconductor wafer processing, is used for cleaning performed to remove residues; and a relevant method of cleaning. The composition comprises at least one fluorocompound (a) selected from among hydrofluoric acid, acid ammonium fluoride and ammonium fluoride, at least one organic solvent (b), phosphonic acid (c), ascorbic acid (d), at least one basic compound (e) and water (f). Further, as an optional component of the composition, there may be added at least one mercapto-having anticorrosive agent (g).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005161748 | 2005-06-01 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200717633A true TW200717633A (en) | 2007-05-01 |
Family
ID=37481478
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095119239A TW200717633A (en) | 2005-06-01 | 2006-05-30 | Semiconductor cleaning formulation containing phosphonic acid and ascorbic acid, and cleaning method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2006129549A1 (en) |
TW (1) | TW200717633A (en) |
WO (1) | WO2006129549A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107210215A (en) * | 2015-02-12 | 2017-09-26 | 富士胶片株式会社 | The treatment fluid and the manufacture method of semiconductor-based panel products that remove liquid and minimizing technology, the treatment fluid of the compound of III V group elements, the oxidation resistance liquid of III V group elements and semiconductor substrate of the oxide of III V group elements |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9058975B2 (en) | 2006-06-09 | 2015-06-16 | Lam Research Corporation | Cleaning solution formulations for substrates |
JP5871562B2 (en) * | 2011-11-01 | 2016-03-01 | 東京応化工業株式会社 | Stripping solution for photolithography and pattern forming method |
JP6157081B2 (en) * | 2012-09-24 | 2017-07-05 | 東京応化工業株式会社 | Stripping solution for photolithography and pattern forming method |
US9536730B2 (en) | 2012-10-23 | 2017-01-03 | Air Products And Chemicals, Inc. | Cleaning formulations |
KR101764577B1 (en) | 2015-08-13 | 2017-08-23 | 엘티씨 (주) | Composition of stripping solution for liquid crystal display process photoresist |
JP6681750B2 (en) * | 2016-03-04 | 2020-04-15 | 東京応化工業株式会社 | Cleaning liquid and cleaning method |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002069495A (en) * | 2000-06-16 | 2002-03-08 | Kao Corp | Detergent composition |
JP4535629B2 (en) * | 2001-02-21 | 2010-09-01 | ルネサスエレクトロニクス株式会社 | Manufacturing method of semiconductor device |
JP4159944B2 (en) * | 2003-07-31 | 2008-10-01 | 花王株式会社 | Resist stripping composition |
-
2006
- 2006-05-25 JP JP2007518938A patent/JPWO2006129549A1/en active Pending
- 2006-05-25 WO PCT/JP2006/310464 patent/WO2006129549A1/en active Application Filing
- 2006-05-30 TW TW095119239A patent/TW200717633A/en unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107210215A (en) * | 2015-02-12 | 2017-09-26 | 富士胶片株式会社 | The treatment fluid and the manufacture method of semiconductor-based panel products that remove liquid and minimizing technology, the treatment fluid of the compound of III V group elements, the oxidation resistance liquid of III V group elements and semiconductor substrate of the oxide of III V group elements |
US11145514B2 (en) | 2015-02-12 | 2021-10-12 | Fujifilm Corporation | Removal liquid and method for removing oxide of group III-V element, treatment liquid for treating compound of group III-V element, oxidation prevention liquid for preventing oxidation of group III-V element, treatment liquid for treating semiconductor substrate, and method for producing semiconductor substrate product |
CN107210215B (en) * | 2015-02-12 | 2022-01-11 | 富士胶片株式会社 | III-V group element antioxidant solution, treatment solution, oxide removing solution and method, semiconductor substrate treatment solution and method for manufacturing semiconductor substrate |
Also Published As
Publication number | Publication date |
---|---|
JPWO2006129549A1 (en) | 2008-12-25 |
WO2006129549A1 (en) | 2006-12-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200702435A (en) | Phosphonic acid-containing formulation for cleaning semiconductor wafer and cleaning method | |
TW200940706A (en) | Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions | |
SG136966A1 (en) | Composition for stripping and cleaning and use thereof | |
TW200717633A (en) | Semiconductor cleaning formulation containing phosphonic acid and ascorbic acid, and cleaning method | |
TW200710205A (en) | Dense fluid compositions for removal of hardened photoresist, post-etch residue and/or bottom anti-reflective coating layers | |
ATE405622T1 (en) | AQUEOUS PHOSPHORIC ACID COMPOSITION FOR CLEANING SEMICONDUCTOR DEVICES | |
SG168509A1 (en) | Semi-aqueous stripping and cleaning formulation for metal substrate and methods for using same | |
SG134279A1 (en) | Cleaning formulations | |
TW200630482A (en) | Aqueous based residue removers comprising fluoride | |
MY130650A (en) | Compositions for removing etching residue and use thereof | |
DK1664935T3 (en) | Microelectronics cleaning compositions | |
JP2006504847A5 (en) | ||
DE602005018075D1 (en) | CLEANING AGENT FOR MICROELECTRONIC SUBSTRATE | |
EP1212150A4 (en) | Lactam compositions for cleaning organic and plasma etched residues for semiconductor devices | |
ATE331020T1 (en) | COMPOSITIONS FOR CLEANING AND REMOVAL OF ORGANIC AND PLASMA ETCH RESIDUE ON SEMICONDUCTOR DEVICES | |
MY146827A (en) | Aqueous cleaning composition for removing residues and method using same | |
CN101717939A (en) | Alkaline aqueous solution composition for treating a substrate | |
AR069784A1 (en) | CLEANING ALKALINE COMPOSITIONS | |
ATE533833T1 (en) | AQUEOUS CLEANING COMPOSITION AND METHOD OF USE | |
SG152961A1 (en) | Flouride-containing photoresist stripper or residue removing cleaning compositions containing conjugate oligomeric or polymeric material of alpha-hydroxycarbonyl compound/amine or ammonia reaction | |
CN103975052B (en) | There is the microelectronic substrate Cleasing compositions of copper/polyarenazole polymer inhibitory action | |
WO2006121580A3 (en) | Compositions for the removal of post-etch and ashed photoresist residues and bulk photoresist | |
WO2004042794B1 (en) | Removal of particle contamination on patterned slilicon/silicon dioxide using supercritical carbon dioxide/chemical formulations | |
AR053210A1 (en) | LIQUID COMPOSITION FOR CLEANING HARD SURFACES | |
JP2012505293A5 (en) |