Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics CorpfiledCriticalAu Optronics Corp
Priority to TW94134487ApriorityCriticalpatent/TWI272389B/en
Application grantedgrantedCritical
Publication of TWI272389BpublicationCriticalpatent/TWI272389B/en
Publication of TW200714902ApublicationCriticalpatent/TW200714902A/en
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections
(AREA)
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Abstract
An inspection device for a substrate is disclosed. The device includes a pair of probe frames and a flexible member. The probe frames are electrically connected to the substrate. The flexible member electrically connects the probe frames.