TW200708934A - Test system and method for automatically controlling motherboard - Google Patents

Test system and method for automatically controlling motherboard

Info

Publication number
TW200708934A
TW200708934A TW094129223A TW94129223A TW200708934A TW 200708934 A TW200708934 A TW 200708934A TW 094129223 A TW094129223 A TW 094129223A TW 94129223 A TW94129223 A TW 94129223A TW 200708934 A TW200708934 A TW 200708934A
Authority
TW
Taiwan
Prior art keywords
test
host system
testing
motherboards
jigs
Prior art date
Application number
TW094129223A
Other languages
Chinese (zh)
Inventor
ming-long Huang
Original Assignee
Universal Scient Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universal Scient Ind Co Ltd filed Critical Universal Scient Ind Co Ltd
Priority to TW094129223A priority Critical patent/TW200708934A/en
Publication of TW200708934A publication Critical patent/TW200708934A/en

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The present invention discloses a test system for automatically controlling motherboards and testing a plurality of motherboards at the same time. A network system is provided among a control host system and a plurality of test jigs, so that the communication among the control host system and the testing jigs can be transmitted via the network system. The cotnrol host system can also use a signal-generating unit to output test signals for the test jigs to test motherboards to be tested. Therefore, when the control host system is running a control program, each test host system can be controlled to boot so as to enable each test jib to run a testing program to test motherboards to be tested. The control host system can also provide a shared storage space to save the test results returned from the test jigs via a network system. Accordingly, the testing hardware and the human resources required by the testing process can be decreased and the test efficiency is enhanced.
TW094129223A 2005-08-26 2005-08-26 Test system and method for automatically controlling motherboard TW200708934A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW094129223A TW200708934A (en) 2005-08-26 2005-08-26 Test system and method for automatically controlling motherboard

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094129223A TW200708934A (en) 2005-08-26 2005-08-26 Test system and method for automatically controlling motherboard

Publications (1)

Publication Number Publication Date
TW200708934A true TW200708934A (en) 2007-03-01

Family

ID=57910993

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094129223A TW200708934A (en) 2005-08-26 2005-08-26 Test system and method for automatically controlling motherboard

Country Status (1)

Country Link
TW (1) TW200708934A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI400693B (en) * 2008-11-27 2013-07-01 Tangtop Technology Co Ltd Method and structure for compensating signal delay
TWI797799B (en) * 2021-10-28 2023-04-01 融程電訊股份有限公司 Testing method and testing system with dynamically adjusted test items

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI400693B (en) * 2008-11-27 2013-07-01 Tangtop Technology Co Ltd Method and structure for compensating signal delay
TWI797799B (en) * 2021-10-28 2023-04-01 融程電訊股份有限公司 Testing method and testing system with dynamically adjusted test items

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