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Application filed by Mjc Probe IncfiledCriticalMjc Probe Inc
Priority to TW094103724ApriorityCriticalpatent/TW200628800A/en
Publication of TW200628800ApublicationCriticalpatent/TW200628800A/en
Testing Or Measuring Of Semiconductors Or The Like
(AREA)
Abstract
The present invention relates to a cantilever probe, comprising a fixing part and a pole connected to the fixing part; the elasticity coefficient of the pole is different from that of the fixing part; thus, the resilience of the probe of the present invention can be increased to prevent elasticity fatigue of the probe.