TW200624793A - Probe for an atomic force microscope - Google Patents

Probe for an atomic force microscope

Info

Publication number
TW200624793A
TW200624793A TW094101142A TW94101142A TW200624793A TW 200624793 A TW200624793 A TW 200624793A TW 094101142 A TW094101142 A TW 094101142A TW 94101142 A TW94101142 A TW 94101142A TW 200624793 A TW200624793 A TW 200624793A
Authority
TW
Taiwan
Prior art keywords
probe
atomic force
force microscope
sample
quality factor
Prior art date
Application number
TW094101142A
Other languages
English (en)
Other versions
TWI388834B (zh
Inventor
Mervyn John Miles
Andrew David Laver Humphris
Jamie Kayne Hobbs
Original Assignee
Univ Biristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Biristol filed Critical Univ Biristol
Priority to TW94101142A priority Critical patent/TWI388834B/zh
Publication of TW200624793A publication Critical patent/TW200624793A/zh
Application granted granted Critical
Publication of TWI388834B publication Critical patent/TWI388834B/zh

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
TW94101142A 2005-01-14 2005-01-14 用於原子力顯微鏡或奈米微影術之探針、原子力顯微鏡、以及自具有奈米特徵圖案之樣本之掃描區域中收集影像資料的方法 TWI388834B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94101142A TWI388834B (zh) 2005-01-14 2005-01-14 用於原子力顯微鏡或奈米微影術之探針、原子力顯微鏡、以及自具有奈米特徵圖案之樣本之掃描區域中收集影像資料的方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94101142A TWI388834B (zh) 2005-01-14 2005-01-14 用於原子力顯微鏡或奈米微影術之探針、原子力顯微鏡、以及自具有奈米特徵圖案之樣本之掃描區域中收集影像資料的方法

Publications (2)

Publication Number Publication Date
TW200624793A true TW200624793A (en) 2006-07-16
TWI388834B TWI388834B (zh) 2013-03-11

Family

ID=48471161

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94101142A TWI388834B (zh) 2005-01-14 2005-01-14 用於原子力顯微鏡或奈米微影術之探針、原子力顯微鏡、以及自具有奈米特徵圖案之樣本之掃描區域中收集影像資料的方法

Country Status (1)

Country Link
TW (1) TWI388834B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI588491B (zh) * 2012-04-02 2017-06-21 荷蘭Ｔｎｏ自然科學組織公司 掃描探針顯微鏡之懸臂的機械性能之校正
TWI603087B (zh) * 2014-06-25 2017-10-21 Ｄｃｇ系統公司 電子裝置的奈米探測方法
CN112513648A (zh) * 2018-05-25 2021-03-16 分子前景公司 用于针对样本改善光透导力的使用传感器分子的扫描探针显微镜
CN115078771A (zh) * 2021-03-11 2022-09-20 百及纳米技术(上海)有限公司 探针测量的控制方法、处理方法以及装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017181135A (ja) * 2016-03-29 2017-10-05 株式会社日立ハイテクサイエンス 走査型プローブ顕微鏡及びそのプローブ接触検出方法
EP3422104A1 (en) * 2017-06-29 2019-01-02 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Method, atomic force microscopy system and computer program product
EP3447504A1 (en) 2017-08-24 2019-02-27 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Atomic force microscopy cantilever, system and method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI588491B (zh) * 2012-04-02 2017-06-21 荷蘭Ｔｎｏ自然科學組織公司 掃描探針顯微鏡之懸臂的機械性能之校正
TWI603087B (zh) * 2014-06-25 2017-10-21 Ｄｃｇ系統公司 電子裝置的奈米探測方法
CN112513648A (zh) * 2018-05-25 2021-03-16 分子前景公司 用于针对样本改善光透导力的使用传感器分子的扫描探针显微镜
CN115078771A (zh) * 2021-03-11 2022-09-20 百及纳米技术(上海)有限公司 探针测量的控制方法、处理方法以及装置

Also Published As

Publication number Publication date
TWI388834B (zh) 2013-03-11

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees