TW200618405A - The electrical contact probe - Google Patents

The electrical contact probe

Info

Publication number
TW200618405A
TW200618405A TW093136249A TW93136249A TW200618405A TW 200618405 A TW200618405 A TW 200618405A TW 093136249 A TW093136249 A TW 093136249A TW 93136249 A TW93136249 A TW 93136249A TW 200618405 A TW200618405 A TW 200618405A
Authority
TW
Taiwan
Prior art keywords
electrical contact
contact probe
plunger
resilient parts
offer
Prior art date
Application number
TW093136249A
Other languages
Chinese (zh)
Other versions
TWI253790B (en
Inventor
Roger Chen
Original Assignee
Roger Chen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Roger Chen filed Critical Roger Chen
Priority to TW93136249A priority Critical patent/TWI253790B/en
Application granted granted Critical
Publication of TWI253790B publication Critical patent/TWI253790B/en
Publication of TW200618405A publication Critical patent/TW200618405A/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

This apparatus is applied for electrical connection temporary. The main components are upper plunger, lower plunger and resilient parts, which are fixed in upper and lower cover. When IC is pressed down, the resilient parts will offer the contact force to make a success connection between IC and tester circuits.
TW93136249A 2004-11-24 2004-11-24 The electrical contact probe TWI253790B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93136249A TWI253790B (en) 2004-11-24 2004-11-24 The electrical contact probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93136249A TWI253790B (en) 2004-11-24 2004-11-24 The electrical contact probe

Publications (2)

Publication Number Publication Date
TWI253790B TWI253790B (en) 2006-04-21
TW200618405A true TW200618405A (en) 2006-06-01

Family

ID=37586721

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93136249A TWI253790B (en) 2004-11-24 2004-11-24 The electrical contact probe

Country Status (1)

Country Link
TW (1) TWI253790B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412749B (en) * 2010-06-23 2013-10-21 Yamaichi Electronics Co Ltd A contact head, a probe having the same, and an electrical connection device using the probe
TWI421503B (en) * 2010-06-01 2014-01-01 Nts Co Ltd Inspecting probe for electronic component

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI421503B (en) * 2010-06-01 2014-01-01 Nts Co Ltd Inspecting probe for electronic component
US8975906B2 (en) 2010-06-01 2015-03-10 Nts Co., Ltd. Probe for inspecting electronic component
TWI412749B (en) * 2010-06-23 2013-10-21 Yamaichi Electronics Co Ltd A contact head, a probe having the same, and an electrical connection device using the probe

Also Published As

Publication number Publication date
TWI253790B (en) 2006-04-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees