TW200618405A - The electrical contact probe - Google Patents
The electrical contact probeInfo
- Publication number
- TW200618405A TW200618405A TW093136249A TW93136249A TW200618405A TW 200618405 A TW200618405 A TW 200618405A TW 093136249 A TW093136249 A TW 093136249A TW 93136249 A TW93136249 A TW 93136249A TW 200618405 A TW200618405 A TW 200618405A
- Authority
- TW
- Taiwan
- Prior art keywords
- electrical contact
- contact probe
- plunger
- resilient parts
- offer
- Prior art date
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
This apparatus is applied for electrical connection temporary. The main components are upper plunger, lower plunger and resilient parts, which are fixed in upper and lower cover. When IC is pressed down, the resilient parts will offer the contact force to make a success connection between IC and tester circuits.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93136249A TWI253790B (en) | 2004-11-24 | 2004-11-24 | The electrical contact probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW93136249A TWI253790B (en) | 2004-11-24 | 2004-11-24 | The electrical contact probe |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI253790B TWI253790B (en) | 2006-04-21 |
TW200618405A true TW200618405A (en) | 2006-06-01 |
Family
ID=37586721
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW93136249A TWI253790B (en) | 2004-11-24 | 2004-11-24 | The electrical contact probe |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI253790B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI412749B (en) * | 2010-06-23 | 2013-10-21 | Yamaichi Electronics Co Ltd | A contact head, a probe having the same, and an electrical connection device using the probe |
TWI421503B (en) * | 2010-06-01 | 2014-01-01 | Nts Co Ltd | Inspecting probe for electronic component |
-
2004
- 2004-11-24 TW TW93136249A patent/TWI253790B/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI421503B (en) * | 2010-06-01 | 2014-01-01 | Nts Co Ltd | Inspecting probe for electronic component |
US8975906B2 (en) | 2010-06-01 | 2015-03-10 | Nts Co., Ltd. | Probe for inspecting electronic component |
TWI412749B (en) * | 2010-06-23 | 2013-10-21 | Yamaichi Electronics Co Ltd | A contact head, a probe having the same, and an electrical connection device using the probe |
Also Published As
Publication number | Publication date |
---|---|
TWI253790B (en) | 2006-04-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |