TW200617665A - Apparatus and method for prolonging useful life of non-volatile memory - Google Patents

Apparatus and method for prolonging useful life of non-volatile memory

Info

Publication number
TW200617665A
TW200617665A TW093136473A TW93136473A TW200617665A TW 200617665 A TW200617665 A TW 200617665A TW 093136473 A TW093136473 A TW 093136473A TW 93136473 A TW93136473 A TW 93136473A TW 200617665 A TW200617665 A TW 200617665A
Authority
TW
Taiwan
Prior art keywords
volatile memory
sector
useful life
pattern
host
Prior art date
Application number
TW093136473A
Other languages
English (en)
Other versions
TWI257044B (en
Inventor
Mien-Chih Chen
Original Assignee
Hon Hai Prec Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Hai Prec Ind Co Ltd filed Critical Hon Hai Prec Ind Co Ltd
Priority to TW093136473A priority Critical patent/TWI257044B/zh
Priority to US11/285,260 priority patent/US20060117134A1/en
Publication of TW200617665A publication Critical patent/TW200617665A/zh
Application granted granted Critical
Publication of TWI257044B publication Critical patent/TWI257044B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/76Masking faults in memories by using spares or by reconfiguring using address translation or modifications

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
TW093136473A 2004-11-26 2004-11-26 Apparatus and method for prolonging useful life of non-volatile memory TWI257044B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW093136473A TWI257044B (en) 2004-11-26 2004-11-26 Apparatus and method for prolonging useful life of non-volatile memory
US11/285,260 US20060117134A1 (en) 2004-11-26 2005-11-21 System and method for prolonging usage lifetime of a non-volatile memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW093136473A TWI257044B (en) 2004-11-26 2004-11-26 Apparatus and method for prolonging useful life of non-volatile memory

Publications (2)

Publication Number Publication Date
TW200617665A true TW200617665A (en) 2006-06-01
TWI257044B TWI257044B (en) 2006-06-21

Family

ID=36568499

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093136473A TWI257044B (en) 2004-11-26 2004-11-26 Apparatus and method for prolonging useful life of non-volatile memory

Country Status (2)

Country Link
US (1) US20060117134A1 (zh)
TW (1) TWI257044B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI475569B (zh) * 2006-11-24 2015-03-01 Lsi Corp 延遲記憶體壽命減少操作之系統、方法及電腦程式產品

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI690860B (zh) * 2019-01-04 2020-04-11 大陸商深圳衡宇芯片科技有限公司 訓練人工智慧估測儲存裝置的使用壽命的方法

Family Cites Families (12)

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Publication number Priority date Publication date Assignee Title
US5822781A (en) * 1992-10-30 1998-10-13 Intel Corporation Sector-based storage device emulator having variable-sized sector
US5384744A (en) * 1992-11-23 1995-01-24 Paradigm Technology, Inc. Look ahead flag for FIFO
US5490264A (en) * 1993-09-30 1996-02-06 Intel Corporation Generally-diagonal mapping of address space for row/column organizer memories
US5832493A (en) * 1997-04-24 1998-11-03 Trimble Navigation Limited Flash file management system
JP3898305B2 (ja) * 1997-10-31 2007-03-28 富士通株式会社 半導体記憶装置、半導体記憶装置の制御装置及び制御方法
US6636941B1 (en) * 2000-01-18 2003-10-21 International Business Machines Corporation Enhanced stable disk storage
KR100351935B1 (ko) * 2000-05-10 2002-09-12 삼성전자 주식회사 강유전체 랜덤 액세스 메모리 장치 및 그것의 읽기/쓰기동작을 제어하는 방법
US6725342B1 (en) * 2000-09-26 2004-04-20 Intel Corporation Non-volatile mass storage cache coherency apparatus
US6574708B2 (en) * 2001-05-18 2003-06-03 Broadcom Corporation Source controlled cache allocation
US7000063B2 (en) * 2001-10-05 2006-02-14 Matrix Semiconductor, Inc. Write-many memory device and method for limiting a number of writes to the write-many memory device
US6621746B1 (en) * 2002-02-27 2003-09-16 Microsoft Corporation Monitoring entropic conditions of a flash memory device as an indicator for invoking erasure operations
JP4063694B2 (ja) * 2003-03-11 2008-03-19 株式会社日立グローバルストレージテクノロジーズ 磁気ディスク装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI475569B (zh) * 2006-11-24 2015-03-01 Lsi Corp 延遲記憶體壽命減少操作之系統、方法及電腦程式產品

Also Published As

Publication number Publication date
US20060117134A1 (en) 2006-06-01
TWI257044B (en) 2006-06-21

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees