TW200610968A - Conductive line inductor measurement and modeling method and system - Google Patents

Conductive line inductor measurement and modeling method and system

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Publication number
TW200610968A
TW200610968A TW093128930A TW93128930A TW200610968A TW 200610968 A TW200610968 A TW 200610968A TW 093128930 A TW093128930 A TW 093128930A TW 93128930 A TW93128930 A TW 93128930A TW 200610968 A TW200610968 A TW 200610968A
Authority
TW
Taiwan
Prior art keywords
inductor
conductive line
data
time domain
frequency domain
Prior art date
Application number
TW093128930A
Other languages
Chinese (zh)
Other versions
TWI284206B (en
Inventor
Yung-Jaen Hsu
Ming-Shiang Chiou
Original Assignee
Frontend Analog And Digital Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Frontend Analog And Digital Technology Corp filed Critical Frontend Analog And Digital Technology Corp
Priority to TW93128930A priority Critical patent/TWI284206B/en
Publication of TW200610968A publication Critical patent/TW200610968A/en
Application granted granted Critical
Publication of TWI284206B publication Critical patent/TWI284206B/en

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Abstract

The method for measurement and modeling conductive line inductor comprises: measurement of a conductive line inductor to obtain a set of time domain raw data representing characteristics of said inductor; conversion of said time domain raw data into frequency domain raw data; calibration and correction of embedded errors according to said frequency domain raw data to obtain clean frequency domain data representing characteristics of said device; conversion of said frequency domain data into time domain clean data; and establishment of equivalent model of the inductor according to said time domain data. The time domain raw data are obtained by applying to said inductor an ultra short impulse and measuring said impulse and its response from said inductor. Conversion between said time domain data and said frequency domain data may be Fourier transform. Due to the regular geometric shape of the conductive line inductor, features of each section of the inductor are calculated by formulas. This invention also discloses system measurement and modeling conductive line inductor using the above method.
TW93128930A 2004-09-23 2004-09-23 Conductive line inductor measurement and modeling method and system TWI284206B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93128930A TWI284206B (en) 2004-09-23 2004-09-23 Conductive line inductor measurement and modeling method and system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93128930A TWI284206B (en) 2004-09-23 2004-09-23 Conductive line inductor measurement and modeling method and system

Publications (2)

Publication Number Publication Date
TW200610968A true TW200610968A (en) 2006-04-01
TWI284206B TWI284206B (en) 2007-07-21

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ID=39455034

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93128930A TWI284206B (en) 2004-09-23 2004-09-23 Conductive line inductor measurement and modeling method and system

Country Status (1)

Country Link
TW (1) TWI284206B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9709599B2 (en) 2014-01-09 2017-07-18 Taiwan Semiconductor Manufacturing Co., Ltd. Membrane probe card
CN109299534A (en) * 2018-09-20 2019-02-01 深圳市博科技股份有限公司 A kind of modeling method and device of printed circuit board

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412755B (en) * 2010-05-24 2013-10-21 Nat Chinyi University Of Technology Branch Coupling Capacitance Tester and Its Method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9709599B2 (en) 2014-01-09 2017-07-18 Taiwan Semiconductor Manufacturing Co., Ltd. Membrane probe card
TWI615616B (en) * 2014-01-09 2018-02-21 台灣積體電路製造股份有限公司 Membrane probe card and manufacturing method thereof
CN109299534A (en) * 2018-09-20 2019-02-01 深圳市博科技股份有限公司 A kind of modeling method and device of printed circuit board

Also Published As

Publication number Publication date
TWI284206B (en) 2007-07-21

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