TW200604498A - Light detector - Google Patents

Light detector

Info

Publication number
TW200604498A
TW200604498A TW094122239A TW94122239A TW200604498A TW 200604498 A TW200604498 A TW 200604498A TW 094122239 A TW094122239 A TW 094122239A TW 94122239 A TW94122239 A TW 94122239A TW 200604498 A TW200604498 A TW 200604498A
Authority
TW
Taiwan
Prior art keywords
light
detecting element
sensitivity distribution
predetermined
light detector
Prior art date
Application number
TW094122239A
Other languages
Chinese (zh)
Inventor
Makoto Suzuki
Hidehiro Kume
Takanori Nakaya
Yasushi Ohbayashi
Original Assignee
Hamamatsu Photonics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics Kk filed Critical Hamamatsu Photonics Kk
Publication of TW200604498A publication Critical patent/TW200604498A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/20—Filters
    • G02B5/28—Interference filters
    • G02B5/285—Interference filters comprising deposited thin solid films
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0204—Compact construction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0214—Constructional arrangements for removing stray light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0488—Optical or mechanical part supplementary adjustable parts with spectral filtering
    • G01J1/0492—Optical or mechanical part supplementary adjustable parts with spectral filtering using at least two different filters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)

Abstract

A light detector, comprising: a light detecting element 60, which has a predetermined sensitivity distribution with respect to a predetermined wave-length range of the light; and a compensation optical system 20, which includes a compensation filter with a sensitivity distribution reverse to the predetermined sensitivity distribution of the said light detecting element and a selection filter for selecting the light of the predetermined wave-length range to penetrate through, the light penetrating through the compensation optical system 20 irradiating to said light detecting element.
TW094122239A 2004-07-05 2005-07-01 Light detector TW200604498A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004198559A JP2006017684A (en) 2004-07-05 2004-07-05 Photodetector

Publications (1)

Publication Number Publication Date
TW200604498A true TW200604498A (en) 2006-02-01

Family

ID=35782654

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094122239A TW200604498A (en) 2004-07-05 2005-07-01 Light detector

Country Status (3)

Country Link
JP (1) JP2006017684A (en)
TW (1) TW200604498A (en)
WO (1) WO2006003843A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007094338A1 (en) 2006-02-17 2007-08-23 National University Corporation Toyohashi University Of Technology Method for forming functional spectrum filter
JP6166150B2 (en) * 2013-10-29 2017-07-19 アルプス電気株式会社 Receiver
US10627227B2 (en) 2016-09-16 2020-04-21 Centre National De La Recherche Scientifique Optical device for characterization of a sample

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5317351A (en) * 1976-07-31 1978-02-17 Toshiba Corp Optical filter
JPH0262922A (en) * 1988-08-30 1990-03-02 Kyocera Corp Optical sensor
JPH0264503A (en) * 1988-08-31 1990-03-05 Matsushita Electric Ind Co Ltd Optical device and its assembling method
JPH041536A (en) * 1990-04-18 1992-01-07 Nippon Laser Denshi Kk Optical power meter
JPH0670584B2 (en) * 1990-06-26 1994-09-07 スガ試験機株式会社 Irradiance meter that follows the cosine law
JP2000304604A (en) * 1999-04-23 2000-11-02 Matsushita Electric Works Ltd Illuminance sensor
JP2001015774A (en) * 1999-06-28 2001-01-19 Minolta Co Ltd Optical sensor
JP2003057111A (en) * 2001-08-20 2003-02-26 Osaka Gas Co Ltd Flame sensor
JP3618090B2 (en) * 2001-10-23 2005-02-09 株式会社ニレコ Collimator and spectrophotometer
JP2004271460A (en) * 2003-03-11 2004-09-30 Yokogawa Electric Corp Optical power meter

Also Published As

Publication number Publication date
WO2006003843A1 (en) 2006-01-12
JP2006017684A (en) 2006-01-19

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