TW200513665A - Analog-to-digital converter with built-in circuit function test and the testing method - Google Patents
Analog-to-digital converter with built-in circuit function test and the testing methodInfo
- Publication number
- TW200513665A TW200513665A TW092127874A TW92127874A TW200513665A TW 200513665 A TW200513665 A TW 200513665A TW 092127874 A TW092127874 A TW 092127874A TW 92127874 A TW92127874 A TW 92127874A TW 200513665 A TW200513665 A TW 200513665A
- Authority
- TW
- Taiwan
- Prior art keywords
- analog
- digital converter
- built
- function test
- testing method
- Prior art date
Links
Landscapes
- Analogue/Digital Conversion (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention provides an analog--to-digital converter with built-in circuit function test and the testing method, which is to switch the analog-to-digital converter into an analog-to-digital converter in less number of bits, and individually testing each converter with less number of bits after switching to reduce the noise interference; and, only using the logical testing machine to complete the testing for circuit functions of analog-to-digital converter.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW92127874A TWI220028B (en) | 2003-10-07 | 2003-10-07 | Analog-to-digital converter with built-in circuit function test and the testing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW92127874A TWI220028B (en) | 2003-10-07 | 2003-10-07 | Analog-to-digital converter with built-in circuit function test and the testing method |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI220028B TWI220028B (en) | 2004-08-01 |
TW200513665A true TW200513665A (en) | 2005-04-16 |
Family
ID=34076647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW92127874A TWI220028B (en) | 2003-10-07 | 2003-10-07 | Analog-to-digital converter with built-in circuit function test and the testing method |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI220028B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI407702B (en) * | 2010-04-27 | 2013-09-01 | Univ Nat Taiwan | Analog-to-digital converter with sub-range and method thereof |
-
2003
- 2003-10-07 TW TW92127874A patent/TWI220028B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI407702B (en) * | 2010-04-27 | 2013-09-01 | Univ Nat Taiwan | Analog-to-digital converter with sub-range and method thereof |
Also Published As
Publication number | Publication date |
---|---|
TWI220028B (en) | 2004-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |