TW200513665A - Analog-to-digital converter with built-in circuit function test and the testing method - Google Patents

Analog-to-digital converter with built-in circuit function test and the testing method

Info

Publication number
TW200513665A
TW200513665A TW092127874A TW92127874A TW200513665A TW 200513665 A TW200513665 A TW 200513665A TW 092127874 A TW092127874 A TW 092127874A TW 92127874 A TW92127874 A TW 92127874A TW 200513665 A TW200513665 A TW 200513665A
Authority
TW
Taiwan
Prior art keywords
analog
digital converter
built
function test
testing method
Prior art date
Application number
TW092127874A
Other languages
Chinese (zh)
Other versions
TWI220028B (en
Inventor
Chun-An Tang
zhao-qi Yang
Original Assignee
Elan Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Priority to TW92127874A priority Critical patent/TWI220028B/en
Application granted granted Critical
Publication of TWI220028B publication Critical patent/TWI220028B/en
Publication of TW200513665A publication Critical patent/TW200513665A/en

Links

Landscapes

  • Analogue/Digital Conversion (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention provides an analog--to-digital converter with built-in circuit function test and the testing method, which is to switch the analog-to-digital converter into an analog-to-digital converter in less number of bits, and individually testing each converter with less number of bits after switching to reduce the noise interference; and, only using the logical testing machine to complete the testing for circuit functions of analog-to-digital converter.
TW92127874A 2003-10-07 2003-10-07 Analog-to-digital converter with built-in circuit function test and the testing method TWI220028B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW92127874A TWI220028B (en) 2003-10-07 2003-10-07 Analog-to-digital converter with built-in circuit function test and the testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92127874A TWI220028B (en) 2003-10-07 2003-10-07 Analog-to-digital converter with built-in circuit function test and the testing method

Publications (2)

Publication Number Publication Date
TWI220028B TWI220028B (en) 2004-08-01
TW200513665A true TW200513665A (en) 2005-04-16

Family

ID=34076647

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92127874A TWI220028B (en) 2003-10-07 2003-10-07 Analog-to-digital converter with built-in circuit function test and the testing method

Country Status (1)

Country Link
TW (1) TWI220028B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407702B (en) * 2010-04-27 2013-09-01 Univ Nat Taiwan Analog-to-digital converter with sub-range and method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407702B (en) * 2010-04-27 2013-09-01 Univ Nat Taiwan Analog-to-digital converter with sub-range and method thereof

Also Published As

Publication number Publication date
TWI220028B (en) 2004-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees