TW200512951A - Fabrication of conductive metal layer on semiconductor devices - Google Patents
Fabrication of conductive metal layer on semiconductor devicesInfo
- Publication number
- TW200512951A TW200512951A TW092125951A TW92125951A TW200512951A TW 200512951 A TW200512951 A TW 200512951A TW 092125951 A TW092125951 A TW 092125951A TW 92125951 A TW92125951 A TW 92125951A TW 200512951 A TW200512951 A TW 200512951A
- Authority
- TW
- Taiwan
- Prior art keywords
- conductive metal
- light emitting
- fabrication
- emitting device
- metal layer
- Prior art date
Links
- 239000002184 metal Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 2
- 238000009713 electroplating Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28575—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0093—Wafer bonding; Removal of the growth substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/024—Arrangements for thermal management
- H01S5/02461—Structure or details of the laser chip to manipulate the heat flow, e.g. passive layers in the chip with a low heat conductivity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0213—Sapphire, quartz or diamond based substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0217—Removal of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0421—Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Led Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Semiconductor Lasers (AREA)
Abstract
A method for fabrication of a light emitting device on a substrate, the light emitting device having a wafer with multiply epitaxial layers and an ohmic contact layer on the epitaxial layers remote from the substrate. The method includes the steps: (a) applying to the ohmic contact layer a seed layer of a thermally conductive metal; (b) electroplating a relatively thick layer of the conductive metal on the seed layer; and (c) removing substrate. A corresponding light emitting device is also disclosed. The light emitting device is a GaN emitting diode or laser diode.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
MYPI20030358 | 2003-09-19 | ||
PCT/SG2003/000222 WO2005029572A1 (en) | 2003-09-19 | 2003-09-19 | Fabrication of conductive metal layer on semiconductor devices |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200512951A true TW200512951A (en) | 2005-04-01 |
TWI241030B TWI241030B (en) | 2005-10-01 |
Family
ID=34374556
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092125951A TWI241030B (en) | 2003-09-19 | 2003-09-19 | Fabrication of conductive metal layer on semiconductor devices |
Country Status (7)
Country | Link |
---|---|
US (1) | US20080210970A1 (en) |
EP (1) | EP1668687A4 (en) |
JP (1) | JP2007529099A (en) |
CN (2) | CN100452328C (en) |
AU (1) | AU2003263726A1 (en) |
TW (1) | TWI241030B (en) |
WO (1) | WO2005029572A1 (en) |
Cited By (1)
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---|---|---|---|---|
TWI741791B (en) * | 2020-09-16 | 2021-10-01 | 南亞科技股份有限公司 | Wafer inspection method and system |
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US7119025B2 (en) * | 2004-04-08 | 2006-10-10 | Micron Technology, Inc. | Methods of eliminating pattern collapse on photoresist patterns |
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US7378288B2 (en) | 2005-01-11 | 2008-05-27 | Semileds Corporation | Systems and methods for producing light emitting diode array |
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US8680534B2 (en) | 2005-01-11 | 2014-03-25 | Semileds Corporation | Vertical light emitting diodes (LED) having metal substrate and spin coated phosphor layer for producing white light |
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SG133432A1 (en) * | 2005-12-20 | 2007-07-30 | Tinggi Tech Private Ltd | Localized annealing during semiconductor device fabrication |
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WO2009005477A1 (en) * | 2007-07-04 | 2009-01-08 | Tinggi Technologies Private Limited | Separation of semiconductor devices |
SG148895A1 (en) | 2007-07-04 | 2009-01-29 | Tinggi Technologies Private Ltd | Separation of semiconductor devices for light emission |
US8102045B2 (en) | 2007-08-08 | 2012-01-24 | Infineon Technologies Ag | Integrated circuit with galvanically bonded heat sink |
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US11295963B2 (en) | 2016-11-14 | 2022-04-05 | King Abdullah University Of Science And Technology | Microfabrication techniques and devices for thermal management of electronic devices |
CN113862770B (en) * | 2021-09-28 | 2023-12-26 | 北京航空航天大学杭州创新研究院 | Method for preparing patterned electrode by adopting deplating process |
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-
2003
- 2003-09-19 CN CNB038270897A patent/CN100452328C/en not_active Expired - Fee Related
- 2003-09-19 CN CN2008101307473A patent/CN101373807B/en not_active Expired - Fee Related
- 2003-09-19 EP EP03818738A patent/EP1668687A4/en not_active Withdrawn
- 2003-09-19 TW TW092125951A patent/TWI241030B/en not_active IP Right Cessation
- 2003-09-19 WO PCT/SG2003/000222 patent/WO2005029572A1/en active Application Filing
- 2003-09-19 AU AU2003263726A patent/AU2003263726A1/en not_active Abandoned
- 2003-09-19 US US10/572,524 patent/US20080210970A1/en not_active Abandoned
- 2003-09-19 JP JP2005509087A patent/JP2007529099A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI741791B (en) * | 2020-09-16 | 2021-10-01 | 南亞科技股份有限公司 | Wafer inspection method and system |
Also Published As
Publication number | Publication date |
---|---|
CN100452328C (en) | 2009-01-14 |
US20080210970A1 (en) | 2008-09-04 |
AU2003263726A1 (en) | 2005-04-11 |
JP2007529099A (en) | 2007-10-18 |
WO2005029572A1 (en) | 2005-03-31 |
CN101373807A (en) | 2009-02-25 |
CN1839470A (en) | 2006-09-27 |
CN101373807B (en) | 2010-06-09 |
EP1668687A4 (en) | 2007-11-07 |
TWI241030B (en) | 2005-10-01 |
EP1668687A1 (en) | 2006-06-14 |
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