TW200500896A - Scan insertion with bypass logic in an IC design - Google Patents
Scan insertion with bypass logic in an IC designInfo
- Publication number
- TW200500896A TW200500896A TW093113021A TW93113021A TW200500896A TW 200500896 A TW200500896 A TW 200500896A TW 093113021 A TW093113021 A TW 093113021A TW 93113021 A TW93113021 A TW 93113021A TW 200500896 A TW200500896 A TW 200500896A
- Authority
- TW
- Taiwan
- Prior art keywords
- hdl
- bypass
- scan
- instruction
- port
- Prior art date
Links
Abstract
A computer implemented process of inserting enhanced scan bypass in relation to a bypassed block in an integrated circuit design comprising: receiving an HDL description of the circuit design; wherein the HDL description includes a port specification HDL instruction that specifies port properties of a bypassed block; wherein the HDL description includes an enhanced bypass HDL instruction that specifies how many scan cells to provide per port of the bypassed block in a scan bypass circuit that bypasses the bypassed block; wherein the bypass HDL instruction includes a user-selectable option of at least zero or one or two scan cells per port; in response to the specification HDL instruction and the enhanced bypass HDL instruction, automatically generating a netlist portion that includes scan a bypass circuit that bypasses the bypassed block and that includes the specified number of scan cells per port.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/435,329 US6973631B2 (en) | 2002-07-18 | 2003-05-09 | Scan insertion with bypass login in an IC design |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200500896A true TW200500896A (en) | 2005-01-01 |
Family
ID=57797976
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093113021A TW200500896A (en) | 2003-05-09 | 2004-05-07 | Scan insertion with bypass logic in an IC design |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200500896A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI466124B (en) * | 2011-05-27 | 2014-12-21 | Realtek Semiconductor Corp | Testing system |
-
2004
- 2004-05-07 TW TW093113021A patent/TW200500896A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI466124B (en) * | 2011-05-27 | 2014-12-21 | Realtek Semiconductor Corp | Testing system |
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