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Application filed by Mitac Technology CorpfiledCriticalMitac Technology Corp
Priority to TW092117102ApriorityCriticalpatent/TW200500601A/en
Publication of TW200500601ApublicationCriticalpatent/TW200500601A/en
Techniques For Improving Reliability Of Storages
(AREA)
Abstract
There is provided a testing memory device for PCB. A memory device is arranged on a PCB, so that the data obtained after testing the PCB can be written into the memory device via a data programmer. Accordingly, the maintenance people is able to quickly and directly read data in the memory device subsequently, thereby understanding the history of the PCB.
TW092117102A2003-06-242003-06-24Testing memory device for PCB
TW200500601A
(en)