TW200500601A - Testing memory device for PCB - Google Patents

Testing memory device for PCB

Info

Publication number
TW200500601A
TW200500601A TW092117102A TW92117102A TW200500601A TW 200500601 A TW200500601 A TW 200500601A TW 092117102 A TW092117102 A TW 092117102A TW 92117102 A TW92117102 A TW 92117102A TW 200500601 A TW200500601 A TW 200500601A
Authority
TW
Taiwan
Prior art keywords
pcb
memory device
testing memory
testing
data
Prior art date
Application number
TW092117102A
Other languages
Chinese (zh)
Inventor
Wen-Hung Peng
Original Assignee
Mitac Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitac Technology Corp filed Critical Mitac Technology Corp
Priority to TW092117102A priority Critical patent/TW200500601A/en
Publication of TW200500601A publication Critical patent/TW200500601A/en

Links

Abstract

There is provided a testing memory device for PCB. A memory device is arranged on a PCB, so that the data obtained after testing the PCB can be written into the memory device via a data programmer. Accordingly, the maintenance people is able to quickly and directly read data in the memory device subsequently, thereby understanding the history of the PCB.
TW092117102A 2003-06-24 2003-06-24 Testing memory device for PCB TW200500601A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW092117102A TW200500601A (en) 2003-06-24 2003-06-24 Testing memory device for PCB

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW092117102A TW200500601A (en) 2003-06-24 2003-06-24 Testing memory device for PCB

Publications (1)

Publication Number Publication Date
TW200500601A true TW200500601A (en) 2005-01-01

Family

ID=57797959

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092117102A TW200500601A (en) 2003-06-24 2003-06-24 Testing memory device for PCB

Country Status (1)

Country Link
TW (1) TW200500601A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105717256A (en) * 2016-02-02 2016-06-29 浪潮(北京)电子信息产业有限公司 Method and device for detecting state of via holes in wave-soldering zone

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105717256A (en) * 2016-02-02 2016-06-29 浪潮(北京)电子信息产业有限公司 Method and device for detecting state of via holes in wave-soldering zone
CN105717256B (en) * 2016-02-02 2019-07-26 浪潮(北京)电子信息产业有限公司 A kind of method and device of the state for the via hole detecting wave-soldering region

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