TW200427995A - Test system of electronic apparatus - Google Patents

Abstract

The present invention is related to a kind of test system of electronic apparatus. The system includes a main control terminal (such as a computer) and a test platform capable of moving laterally and vertically, in which the main control terminal is connected to the test platform. The test platform can perform each kind of tests onto the electronic apparatus based on the command of the main control terminal; and each kind of testers (such as the voice generator, hand-writing pen for test, infrared emitter/receiver, and so on) can be mounted on the test platform such that the main control terminal can control the testers on the test platform when the electronic apparatus to be tested is connected with the main control terminal to perform the test and make tem close to the tested electronic apparatus so as to simulate each item of practically used actions on the tested electronic apparatus. The, the tested electronic apparatus performs the processing based on the simulated actions of the tester, and transmits the processed information to the main control terminal. Thus, the main control terminal is capable of judging whether the electronic apparatus can work normally or not according to the simulated action of the tester and the processed signal of the tested electronic apparatus so as to output the test results.

Description

200427995

The technical field to which the invention belongs: The present invention is a test system for an electronic device, especially when a sub-device is connected to the system when it enters the test, and the system], the test state on the electric test platform * can be accessed The electronic device to be tested can make the rigid device to be tested to simulate the actual use of the test, and send the signal of ^ = to the system, and the system can determine the accurate test results. 、、、 ° Previous technology: According to the manufacturer of general electronic products (such as digital personal assistant (pDA) $ phone ·· etc.), Xiao will assemble Ding Gui = on this electronic product. Testing to record whether the electronic product is faulty. IV, to avoid errors when the electronic product is used in the future. Traditionally, the testing of this electronic product is performed online. Manually, the functions and actions of the electronic product are performed manually (for example, whether the button can be positive = turn in, whether the stylus can be used to touch it). Control the screen to draw lines, touch the screen g = normal display, whether the microphone can work normally, whether the speaker can be two = = · · ·, etc.) and then use these actions to work normally, determine = whether the electronic product is malfunctioning , And then judge the electronic product factory to sell. However, the speed of manual and manual testing is quite slow. In mass production, the test method meets the requirements of fast and low cost, and the manual and manual testing allows human error actions and human error judgments. , Low accuracy ', so in order to meet the requirements of fast and low cost, and

Page 5 200427995 V. Description of the invention (2) Increasing the accuracy of testing. There was a method to replace the manual operation with a fixture ^, ..., the fixture is not easy to adjust. When the electronic product is changed design Redoing the fixtures will increase the production cost and take a long time. If it is possible to develop and design an electronic device test system that can integrate various test items with low cost and high accuracy, it will be welcome to manufacturers. To 'is also an urgent target for the relevant industry. Summary of the Invention: Method, with testing, and electronic products based on electricity: Failure to study carefully ΐ ΐ Improved: ί ΐ: System, 统 can be superfluous% to eliminate the previous technology # Brand new test system where the test bench is on the second installation bench As a computer, it: The end of the instructions, will, and prepare for the test, set the brake test, so the lack of 'more' The inventor has the foregoing conventional electronic products test speed is slow, human error action, human error judgment When the design is changed, it is necessary to redo the disadvantages such as fixtures, product manufacturing experience and technology accumulation. In view of the solution to the problem, the test system of an electronic device of the present invention is designed after continuous research, experiment and development. Test items, low cost and high accuracy, to achieve many missing purposes. According to the foregoing object, the present invention provides a system. The system is provided with a main control terminal and a test bench. The system is provided with a mounting device capable of horizontally moving left and right and up and down to install various test instruments, and the main control terminal may be The test bench is connected. The test bench can be moved close to the electronic device to be tested according to the test equipment on the main control. In this way, the test bench of the system can cooperate with various electronic devices that do not require testing fixtures, avoiding the fixture. Caused 200427995

The signal of the operating status of the electronic device under test during the test. According to this, the main control terminal can always work according to the standard value set in advance and output the test result. Sent to the main control of the system ;, and will be determined at the Η | Ϊ _ ^ t 剌 end based on the test of the operating status of the electronic device to determine whether the electronic device under test is affected; another object of the present invention is the test On the platform: 1. An installation table for installing test equipment, so that the Anshang $; or a plurality of sub-devices, • -simultaneous testing; electricity; = test-the purpose of the test time of the test. If the J electronic device reaches the saving test / tenth, the release is% ~ day, the main control can always be connected to the network server, and the main control terminal can = t network line and-sent to the network temple service Device, so that other data ends that are connected to the network can obtain the test and online test results from the network server. The data of,,, and the results are achieved. The review committee can set the characteristics and functions of the hometown r 苁 gan f 丄 ^ of the present invention and make further recognition of the shape, structure, and assembly diagrams, and explain in detail. As follows: 9. Understand the implementation of the implementation order: The present invention is a test of an electronic device, a main control terminal, and a 4th y. System. The main package of the system includes the following: Among them, the test A # ancient dagger can move right and can move up and down Α ^ mouth 6 and there can be horizontal 2 movement, h, various installations can be installed on the stage installation platform $ 200427995 V. Description of the invention (4) test equipment, and the The main control terminal can be a computer, which is connected to the test bench. The test bench can control the movement of the installation table according to the instructions of the main control terminal, so that the test equipment can be moved close to the electronic device to be tested for various tests. In this way, the test bench of the system can cooperate with the test of various electronic devices, so there is no need for a test fixture to avoid the lack caused by the fixture. Furthermore, when the electronic device under test is tested, The systems are connected ' The operation status signal during the test is transmitted to the main control terminal of the Li Tong. Therefore, the main control terminal can compare the signal of the operation status of the electronic device under test with its preset value to determine whether the electronic device under test is Can work normally and output test results. In a preferred embodiment of the present invention, please refer to FIG. 1. The main control end of the system 1 is a computer host 11, which is connected to an AC power source 1, 2, a screen 1 3, and a keyboard. 1 4 and a mouse 15 are connected, and the AC power supply 12 can supply power, so that the host computer 1 1 executes processing data or programs and transfers the processed or completed processing data to the screen 丨 3 for screen display 'At the same time, the keyboard 丨 4, the mouse 丨 5 can transmit the entered command or value' to the computer host 1 1 to make the computer host; [丨 process these instructions or values. Please refer to FIG. 1 and FIG. 2, a test stand 16 of the system 1 is provided with a mounting stand 17 which can be moved horizontally left and right and can be moved up and down, and a test instrument 18 is installed on the test stand 17. 6 and connected to the computer host 丨 丨 'so that it can follow the instructions transmitted by the computer host 丨 丨, the test equipment 丨 8-bit f to close to the electronic device under test 丨 9, the test can be performed at the position. 16 is connected to a parent power source 丨 丨 〇, so that the AC power source 丨 丨 〇

200427995 V. Description of the invention (5) ί = the electric power required for the second test device 18 to operate, and the electronic device 2 to be tested is connected to the main computer 11 so that when the test is performed, the device to be tested = a sub-device 1 / The operating status signal during the test can be transmitted to the host computer 1 ^, i the electronic device 19 to be tested and connected to an AC power supply 111, so that "Hei ** power supply 1 1 1 supplies the electronic device under test" Power required for device 19 to operate. Based on the composition of the above components, please refer to Figures 1 and 2 again. When the electronic device 19 is tested, the host computer n will control it; on the test bench, 4 appliances 18 are tested, which is close to the electronic device 19 to be tested. Perform the test of “put on” and control the test device 丨 8 to perform a test on the electronic device 19 to be tested, and to test the actual use actions, so that the electronic device 19 to be tested is equal to the device 18 The signal is processed, and the processed signal is transmitted to the computer host 11. In this way, the computer host 11 can process the electronic device under test 9 and compare it with the value set in advance to determine the test. Whether the electronic device 19 can work normally, and then obtain the test result, and then send the signal of the test result to the screen 3 for day and day display. ^ In this embodiment, please refer to FIG. 1 again. The electronic device under test 19 is connected to the computer host through the data transmission cable (such as serial connection 槔 (RS-2 32 ), Universal serial bus (USB) connection 珲) 2 connection, and an electrical connection with the host computer 丨 丨, so that the electronic device under test 19 can transfer the action and processing signals during the test to the machine 11. . In this embodiment, please refer to FIG. 2 and FIG. 2. The test device 18 may be a stylus, and the electronic device to be tested 19 is a digital personal assistant.

200427995 V. Description of Invention (6) (PDA) 'The computer host 1 1 can control the test station 16's installation station 1 to be displaced' until the stylus touches the touch screen of the digital personal assistant (T〇uch Panel 1) position, and control the installation platform 丨 7 displacement, so that the stylus on the touch screen diurnal, so that the digital personal assistant to perform the input of the line drawing action ', and send the signal of this input to the computer The host 丨 丨 makes the computer main body 11 compare with the value set in advance according to this signal to determine whether the touch screen of the digital personal assistant can normally perform the line drawing input action. In this embodiment, please refer to FIG. 1 and FIG. 2 again. The test device 18 may be a pressure lever, and the electronic device under test 9 is a digital personal assistant (PDA), and the computer host 丨丨 can control the test stand 丨 6 mounting stand 丨 7 displacement 'to the position of the touch lever corresponding to the buttons of the digital personal assistant, and # control the installation stage 17 to move the touch lever to press the digital The keys of the personal assistant 'cause the digital personal assistant to perform the input action of each key, and send the signal of this input action to the computer host 11, so that the computer host 11 compares this signal with its preset value according to the signal , And judge whether the keys of the digital personal assistant can work normally.

In this embodiment, please refer to Figs. I and 3, the test instrument 18 may be a sound generator 3 1 (as shown in Fig. 3), and the electronic device under test 19 is a digital personal assistant. (PDA), the host computer 11 can control the displacement of the mounting table 17 of the test stand 16 to the position of the sounder 31 corresponding to the microphone 3 2 of the digital personal assistant, and control the sounder 31 to generate a sound To make the digital personal assistant perform the input action of the sound signal, and send the signal of this input action to the host computer of the computer.

Page 10 200427995 V. Explanation of the invention (7)! Tiger: Compare the digital microphone 32 with its pre-set value to determine whether the digital microphone 32 can work normally. 1 7 shift to 誃 ::: month: the host 1 1 and the position of the light sensor 3 3 of the personal assistant, "" Erjie 3 1 cover the number and the work will cause the change to enter the sensor 3 3 The amount of light, so that the digital personal assistant Bo μ especially sensed! Track the control of its backlight, and send the signal of this control action to the computer host u: Based on this signal, the computer host 11 and its events- & The value of the disaster side-, /, τ, especially sigh, compared with whether the digital sensor 33 of the digital personal assistant can work normally. "In this embodiment, please refer to Figures 1 and 4, ：; And 18 can be an infrared transmitter / receiver 4 1 (such as: 箆 4 m%, / test electronic device 19 is a digital personal assistant (PDa) °, $ 脑 @ 机 ^ # 收 器 4 1 corresponds to Position of the infrared signal transmitting / receiving unit 42 of the digital personal assistant and control the infrared transmitting / receiving 41 Transmit infrared signal to the infrared signal transmitter / receiver 42, or the infrared transmitter / receiver 41 receives the infrared signal transmitter / receiver 42 == external line signal 'causes the digital personal assistant to perform infrared transmission Or receive the action 'and send the signal of this action to the computer host, so that the computer host 11 compares this signal with its preset value to determine the infrared signal transmitter / receiver of the digital personal assistant. 4 2. Whether it can work normally. 疋 In this embodiment, please refer to Figure 1 again. The host computer 11 can be connected to a network server 11 2 through an Ethernet cable. Month & Host 1 1 can send data of test results to the network server cry 1 1 2

200427995 V. Description of the invention (8) Allow other terminals connected to the network server 1 12 to obtain the data of the test result from the network server 11 2 to achieve the effect of sharing the test results. In another preferred embodiment of the present invention, please refer to FIG. 1 and FIG. 5, the test bench 16 may be provided with one or a plurality of mounting benches 17 for mounting the test instruments 18, so that the mounting benches 16 A group or array of test instruments 18 can be installed on 17 respectively. According to actual needs, one electronic device under test 19 can be tested at a time, or several electronic devices under test 19 can be tested at the same time, saving test time. Effect. In this embodiment, please refer to FIG. 1 again. The waiting-to-be-tested electronic device 19 is connected to the AC power supply 111, so that the AC power supply 111 supplies power to the waiting-to-be-tested electronic device 19 for use. The above description is only the best embodiment of the present invention, but the structural features of the present invention are not limited to this. Any changes or modifications that can be easily considered by those skilled in the art in the field of the invention can be covered The scope of patents in this case is as follows.

Page 12 200427995 Brief description of the drawings Illustration of the drawings: Figure 1 is a block diagram of the present invention. FIG. 2 is one of the schematic diagrams of the test bench and the electronic device under test of the present invention. Figure 3 is the second schematic diagram of the test bench and the electronic device under test of the present invention. Figure 4 is a schematic diagram of the infrared transmitter / receiver and the electronic device under test according to the present invention. FIG. 5 is the third schematic diagram of the test bench and the electronic device under test of the present invention. Symbols of the main parts: System ... 1 Computer host ... 11 AC power supply ... 12 Screen ......... .. 13 Keyboard ... 14 Mouse ... 15 Test Stand ... 16 Mounting Stand ... ..... 17 Test equipment ... 1 8 Electronic device under test ... 1 9 AC power ... 1 1 0 AC power ......... 111 Sounder ... 31 Microphone ... ........ 32 Light sensor ... 3 3 Infrared transmitter / receiver · _41 Infrared signal transmitter / receiver ... 42 Network server ... 11 2

Page 13

Claims (1)

200427995 VI. The scope of patent application is flat and various kinds of test moves, so that the position of the electronic device, the electronic device of the processing 2 system, the key host, 3 systems when an AC power can be processed, the system will be tested with the power On 'this. A kind of main control test bench is moved and set up. On the tester, the device is sent to the signal according to the test, and whether it is set. If the power source, the power supply or the completion disk, the slip order the power. Set up, test system for electronic device of brain host instrument position test bench, including. Terminal, which is connected with the electronic device to be tested;, which is connected with the main control terminal. 7 ^ The safety can be moved up and down ", the installation platform can be installed: so that it can be moved close to the electronics to be measured according to the instructions of the main control terminal, τ to simulate the actual use of various actions 4% ★% gur, 隹 > sores test '俾 This test 忒 υ bliss 2 仃 processing' at the same time and the processing of the main control terminal, so that the main control terminal can be compared with its preset value "electronic device can Normal work [and output the test results to judge the test of the electronic device under test, item described in the above: 1 :! Brain master • 'The computer host is connected with the force to enable the computer host to perform processing data = data processed by the parent Send it to the screen, enter 1 $ Knowledge type: and the mouse can display the inputted instructions or numbers, and process them with the brain host. These instructions = the number of the judgment of the computer eye patent area 2 No. 2 There is a test that can be broken horizontally on the test bench. The test bench is equipped with a two-pi test, which can be moved up and down, so that it can be connected to the computer: the test bench is moved closer to the test electronics. The device, several transmitted instructions, is connected to an AC power supply, and the location where the test is performed. The AC power supply provides the 200427995. Scope of patent application * The test bench and test equipment are required to operate. 4. The test system for an electronic device according to item 3 of the scope of the patent application, wherein the electronic device under test is connected to an AC power source, so that the AC power source supplies power required for the electronic device under test to operate. 5. The test system for an electronic device as described in item 4 of the scope of patent application, wherein the test device may be a stylus. 6. The test system for an electronic device as described in item 4 of the scope of patent application, wherein the test device may be a sound generator. 7. The test system for an electronic device as described in item 4 of the scope of patent application, wherein the test device can be an infrared transmitter / receiver. 8. The test system for an electronic device as described in item 4 of the scope of patent application, wherein the host computer can be connected to a network server via an Ethernet cable, and the host computer can transmit the data of the test results to The network server enables other terminals connected to the network server to obtain data of the test results from the network server. 9. The test system for an electronic device as described in item 4 of the scope of the patent application, wherein the test bench may be provided with one or more mounting benches for testing equipment, so that a set of The test equipment of the array can be tested one electronic device under test at a time, or several electronic devices under test at the same time according to actual needs. 10. The test system for an electronic device as described in item 1 of the scope of the patent application, wherein the electronic device under test is connected to a port of the computer host through a data transmission line, and an electrical connection is established with the computer host to make the test The test electronic device can transmit the signal of the operating condition during the test to the computer Page 15 200427995 VI. Scope of patent application Host. 11. The test system for an electronic device as described in item 10 of the scope of patent application, wherein the port can be a serial port (RS-232). 12. The test system for an electronic device as described in item 10 of the scope of patent application, wherein the port can be a universal serial bus (USB) port. Page 16