TW200421194A - Position detection method and device - Google Patents

Position detection method and device Download PDF

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TW200421194A
TW200421194A TW92108764A TW92108764A TW200421194A TW 200421194 A TW200421194 A TW 200421194A TW 92108764 A TW92108764 A TW 92108764A TW 92108764 A TW92108764 A TW 92108764A TW 200421194 A TW200421194 A TW 200421194A
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Taiwan
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column
common
signal
row
scope
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TW92108764A
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Chinese (zh)
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TWI225220B (en
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Shyuh-Der Lin
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Holylite Microelectronics Corp
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Abstract

The present invention disclosed a position detection device and method for use in a plane surface to determine the position of a capacitive coupling device. Two arrays of row and column conductive wires form two layers on a substrate, said two layers are isolated by an insulated layer; between each two row wires there is a common row wire; between each two column wires there is a common column wire. Said common row and common column wires are connected to a common row terminal and common column terminal respectively. AC signal is applied to two adjacent wires sequentially to determine point P is between row k and row k+1, then AC signal is applied to row k only. Then applied to row k+1 only. To determine point P is near row k or row k+1. Finally, apply AC signal to common rows and then to all rows to determine point P is closed to row wire or common wire. Then repeats the above process for the columns. By combining the above processes the position in a two-dimensional space is determined. This method increases the accuracy of detection with less conductive row wires and column wires.

Description

200421194 五、發明說明(1) 1 ·發明所屬之技術領域 本發明係有關於 用者所選位置之偵測 此座標之資訊。特別 置,能在二維之平面 來偵測位置。 一種裝置及方法,用於在一平面上使 :以提供該位置之座標而顯示對應於 :’本發明有關於一種位置偵測裝 上以較少之導線及更精確的㈣結果 2.先前技術 有許多現存技術提供一置於一平面上之 (Stylus)之位置之偵測。其中一種技術為—一 表面之下或例如在電腦監視器之顯示器之 垂直線網以提供如第1圖中之偵測筆所選之位之十及 ;二=:二:據Υ需之解析度而定之 而形成第0列到第Ν列。另一層導線1〇2以相同或不同之網 距形成第0行到第Μ行。每一導線被連接到導線選擇多工器 之驅動電路。交流信號被依序加於第〇列、第i列到第Ν ^ 列。有兩種裝置利用此型式之技術係敘述於美國專利申請 案弟5/149,91 9及4/65 6, 332號案,頒予格蘭尼亞斯 (Green i as)等人。此種裝置以依序加驅動信號於一群導 線中之一導線以決定其位置’將需要甚小之網距及更多的 導線以增進精遂、度’並且需要更多驅動電路以驅動此等導 線。此種裝置所需連接之導線數目甚多,其複雜度很不受 200421194 五、發明說明(2) 歡迎。雖然其中之一已利用分組導線之技術,其精密度仍 然有限。當交流信號被加到第k列,其他列置於零電位 (即接地電位)。此父流信號於是為一電容耗合元件例如 一偵測筆所偵測。於信號被偵測之時,偵測元件所在之列 之位置被決定。於列位置決定後,然後將交流信號加於行 並利用同一裝置以偵測此信號,行之位置亦能決定。 另一種技術示於第2圖,一層導體材料2 〇 〇具有電阻係 數,且3或4個分開之接觸點2 0 1與該層導體材料互連。當 信號施加於每一接觸點,所選之位置為偵測筆接收之信號 由微處理器計算後而決定。兩種利用此技術之裝置在美國 專利申請案第5/877, 458及5/68 6, 70 5頒給大衛康萊 (David J. Conroy)及馬克佛勞爾斯(Mark Flowers) 之專利中描述。此種裝置以量測唯一之位置指示信號並與 储存於記憶中之位置資訊比較而決定該點之位置。此種裝 ^僅需4到5條導線(其中之一給偵測筆)。但每一系統在 二座上需要十分均勻之電阻性薄膜2 0 0,此薄膜需要甚精 儿積技術才得以大量生產。沉積之後,亦需為每一系 轉位置資訊或參數;並需要一個十分精確之類比數位 奐器(A/D)以保證所量測之信號是精確地轉換為位置 因此=求一改進之方法及系統,以較少之導線及更精 之位置資訊作位置偵測。且亦需求不用昂貴及很精確之200421194 V. Description of the invention (1) 1 · Technical field to which the invention belongs The invention relates to the detection of the coordinates of the position selected by the user. Special settings, can detect the position on a two-dimensional plane. A device and method for displaying on a plane: to provide coordinates of the position corresponding to: 'The present invention relates to a position detection device with fewer wires and more accurate results. 2. Prior art There are many existing technologies that provide detection of the position of a stylus on a plane. One of the technologies is-a vertical line of net under the surface or, for example, in a monitor of a computer monitor, to provide ten and ten bits as selected by the detection pen in Figure 1; two =: two: according to the required analysis Depending on the degree, columns 0 to N are formed. Another layer of wires 102 forms the 0th to Mth lines with the same or different pitches. Each wire is connected to the drive circuit of the wire selection multiplexer. The AC signals are sequentially added to column 0, column i to column N ^. Two types of devices using this type of technology are described in U.S. Patent Application Nos. 5 / 149,91 9 and 4/65 6,332, awarded to Green i as et al. This device sequentially applies a drive signal to one of a group of wires to determine its position. 'It will require a very small pitch and more wires to improve precision and accuracy.' It also requires more drive circuits to drive these. wire. The number of wires to be connected to this device is very large, and its complexity is not well welcomed in 2004. V. Invention Description (2). Although one of them has used the technique of grouping wires, its precision is still limited. When the AC signal is applied to column k, the other columns are set to zero potential (ie, ground potential). The parent current signal is then detected by a capacitive consumable element such as a detection pen. When the signal is detected, the position of the detection element is determined. After the column position is determined, the AC signal is added to the row and the same device is used to detect this signal. The position of the row can also be determined. Another technique is shown in Figure 2. A layer of conductive material 2000 has a resistance coefficient, and 3 or 4 separate contact points 201 are interconnected with the layer of conductive material. When a signal is applied to each contact point, the selected position is determined by the microprocessor's calculation of the signal received by the pen. Two devices using this technology were issued to David J. Conroy and Mark Flowers in U.S. Patent Application Nos. 5/877, 458 and 5/68 6, 70 5 Description. This device determines the position of the point by measuring the unique position indication signal and comparing it with the position information stored in the memory. This installation requires only 4 to 5 wires (one of which is for the detection pen). However, each system requires a very uniform resistive film 200 on the two blocks. This film requires very sophisticated product technology to be mass-produced. After deposition, it is also necessary to transfer position information or parameters for each series; and a very accurate analog digital converter (A / D) is required to ensure that the measured signal is accurately converted to position. And system, with less wires and more precise position information for position detection. And also need not be expensive and very accurate

•第7頁 200421194 五、發明說明(3) 方法去生產此裝置。 3.發明内容 因此本發明之目的為提供一種改進之位置偵測方法及 裝置以在一平面上決定一選定之位置。 本發明之次一目的為提供一種位置偵測方法及裝置, 使用較少之導線以感測位置。 本發明之再一目的為提供一種位置偵測方法及裝置以 增進位置資訊之精確度。 本發明之另一目的為提供一種位置偵測方法及裝置, 此裝置係為可靠且能廉價生產者。 本發明教示一種裝置之構造以較少之導線來感測位置 而又增進位置資訊之精確度。 本發明之第一觀點教示一種位置偵測裝置,用於在一 平面上偵測一電容耦合元件之位置,至少包含:一列導線 及行導線陣列為一絕緣層所隔離,該列導線具有一間距 c,在列導線之間有一共同列導線距該列導線之距離為 c/2 ;該行導線具有一間距d,在行導線之間有一共同行導• Page 7 200421194 V. Description of the invention (3) Method to produce this device. 3. SUMMARY OF THE INVENTION The object of the present invention is to provide an improved position detection method and device for determining a selected position on a plane. A second object of the present invention is to provide a position detection method and device, which use fewer wires to sense a position. Another object of the present invention is to provide a position detection method and device to improve the accuracy of position information. Another object of the present invention is to provide a position detection method and device, which is a reliable and inexpensive producer. The present invention teaches the construction of a device that uses fewer wires to sense a position while improving the accuracy of position information. A first aspect of the present invention teaches a position detection device for detecting the position of a capacitive coupling element on a plane, including at least: a row of wires and a row of wire arrays are separated by an insulating layer, the row of wires has a pitch c, there is a common column conductor between the column conductors at a distance of c / 2; the row conductor has a distance d, and a common row conductor between the row conductors

第8頁 200421194 五、發明說明(4) 線距該行導線之距離為d/2 ;該共同列導線係連接到一共 同列接頭;該共同行導線係連接到一共同行接頭,一線選 擇解碼器及驅動器依序供應交流信號給該列導線及行導 線,並共同列及共同行導線;供應特定電壓水準給不供應 父流彳§號之共同導線;並供應特定之直流電壓給不供應交 流信號之列或行導線;一振盪器產生所需之頻率及振幅之 交流信號電壓並供應該信號電壓給一微處理器;該微處理 器經由一匯流排供應依序之信號給該線選擇解碼器及驅動 器;一電容麵合元件在一平面上之一點感測此偵測信號並 經由一隔離線傳送該偵測之信號給一類比到數位(A/D) 轉換器;該A/D轉換器轉換該偵測信號之振幅為一數位信 ϊ虎並與該微處理器通作。 本發明之另一實施例教示一種在一平面上偵測位置之 方法’具有列及行導線及共同導線在每二列及每二行之 間,此等導線可選擇性地連接到一線選擇解碼器及驅動 器,一信號振盪器,一微處理器,一電容耦合元件置於p 點以檢拾該偵測信號,至少包含下列步驟:(a )加交流信 號於一頁上之共同列,然後加於另一頁上之共同列,以一 電容耦合元件測量該信號v ( 2)及v ( 1) ; (b)比較v ( 2 )及v ( 1)之大小以決定要偵測之頁次;Cc)同時加交流 信號於第k列及第k + 1列,其中k = 1至N,所有其他列導線於 特定直流電壓及共同列導線於一特定電壓水準之電位,以 一電容耦合元件測量該信號為v k ;( d )決定v良最大值,若 200421194 五、發明說明(5) ^------ v k為最大值,此位晉孫太给 >於咕你 罝係在第k列與第k+Ι列之間;(e)僅加 ^^第㈣’所有其他列特定直流電壓及共同列於-势^電壓水準之電位’測量信號為vk,然後加交流信號於 第k + Ι列,所有其他列特定直流電壓及共同列於一特定電 壓水準之電位’測量信號為V k + 1 ;比較V k及v k + 1,若V k大 於vk + 1,P點係靠近第k列,若Vk小於Vk+1,P點位係靠近 第k + 1列,(f )加父流彳g號於共同列,所有其他列於一特定 直流電壓,測量信號為v 1 ;加交流信號於所有列,而共同 列則於一特定直流電壓,測量信號為v 2 ;比較v 2及v 1,若 v2/vl大於1,P點係靠近第㈣;若v2/vl小於1,P點係靠 近共同列;(g)對行空間重複步驟(a)到(〇。最後重複以 上步驟以偵測行之位置。 本發明之再一觀點教示一種方法,其中第k列及共同 列之間之空間被分為N等分,由儲存實驗測得相應於在導 線上之不同介質常數材料及不同材料厚度之每一空間 v2/vl比值,經比較偵測所得之v2/vl比值與儲存之值而決 定其位置。 本發明之以上及其他目的及優點參考以下之參照圖示 及最佳實施例之說明而更易完全瞭解。 4.實施方式Page 8 200421194 V. Description of the invention (4) The distance between the line and the line of the line is d / 2; the common line of the line is connected to a common line joint; the common line of the line is connected to a common line joint, and one line is selected for decoding The driver and driver sequentially supply AC signals to the column and row conductors, and jointly row and common row conductors; supply a specific voltage level to the common conductors that do not supply the parent current 彳 §; and supply a specific DC voltage to the non-supplied AC Signal column or row conductors; an oscillator generates an AC signal voltage of the required frequency and amplitude and supplies the signal voltage to a microprocessor; the microprocessor supplies sequential signals to the line via a bus to select and decode And a driver; a capacitive surface-sensing element senses the detection signal at a point on a plane and transmits the detection signal to an analog-to-digital (A / D) converter via an isolation line; the A / D conversion The converter converts the amplitude of the detection signal into a digital signal processor and works with the microprocessor. Another embodiment of the present invention teaches a method for detecting a position on a plane 'has column and row wires and common wires between every two columns and every two rows, and these wires can be selectively connected to a line selection decoding And a driver, a signal oscillator, a microprocessor, and a capacitive coupling element placed at point p to pick up the detection signal, at least include the following steps: (a) adding AC signals to a common column on a page, and then Add a common column on another page, measure the signals v (2) and v (1) with a capacitive coupling element; (b) compare the sizes of v (2) and v (1) to determine the page to be detected Cc) Simultaneously apply AC signals to columns k and k + 1, where k = 1 to N, all other conductors are at a specific DC voltage and the common conductors are at a specific voltage level, coupled by a capacitor The component measures this signal as vk; (d) determines the good maximum value of v. If 200421194 V. Description of the Invention (5) ^ ------ vk is the maximum value, which is given by Jin Suntai > Between column k and column k + 1; (e) Add only ^^ th column 'all other specific DC voltages and common At-potential ^ voltage level potential 'measurement signal is vk, and then AC signals are added to column k + Ι, all other columns specific DC voltage and potential listed at a specific voltage level' measurement signal is V k + 1; Compare V k and vk + 1. If V k is greater than vk + 1, point P is closer to the k-th column. If Vk is less than Vk + 1, point P is closer to the k + 1 column. (F) plus the parent stream 彳 g. No. is in the common column, all other columns are in a specific DC voltage, the measurement signal is v 1; AC signals are added in all columns, and the common column is in a specific DC voltage, the measurement signal is v 2; comparing v 2 and v 1, If v2 / vl is greater than 1, point P is closer to ㈣; if v2 / vl is less than 1, point P is closer to the common column; (g) Repeat steps (a) to (0) for the row space. Finally repeat the above steps to detect The position of the row. Another aspect of the present invention teaches a method in which the space between the k-th column and the common column is divided into N-divisions, which are measured by storage experiments corresponding to different dielectric constant materials and different materials on the wire The v2 / vl ratio of each space of the thickness is determined by comparing the v2 / vl ratio obtained from the detection and the stored value. The above and other objects and advantages of the present invention can be more fully understood by referring to the following reference drawings and the description of the preferred embodiment.

第10頁 200421194 五、發明說明(6) 第3圖為根據本發明之一實施例之導線板及偵測筆之 剖面圖,第4圖為依據本發明之〆實施例之列導線及共用 列導線之佈置圖。請參照第3圖,供位置偵測之導體板300 係以網版印刷、沉積法或電鐘法將行導線之導體層製造在 基板3 0 1上’此導體層例如是錫或銅’然後對/儿積之導體 層藉由蝕刻法以形成由第〇行到第Μ行之行導線3 11及共同 行導線。於形成絕緣層3 0 2後,另〆導體層用同樣的方法 形成在絕緣層3 〇 2上面以形成由第0列到第Ν列之列導線3 0 6 及/、同列導線(common row,CR) 308。最後一層絕緣層 形成在列及共同列導線上。 一點P由一電容辆合元件1 〇 3偵測其位置,此元件以隔 離線1 0 4連接至一放大器(示於第11圖)。在此實施例 中’列導線及行導線之層次可以互換。例如,列導線可在 底層而行導線在頂層。此導線可連接至一線選擇解碼器 (wire selected decoder)及一驅動器(如第11圖所示 )以依序供應交流信號給每一導線以供電容耦合元件1 〇 3 偵測。Page 10 200421194 V. Description of the invention (6) Figure 3 is a cross-sectional view of a lead plate and a detection pen according to an embodiment of the present invention, and Figure 4 is a line of conductors and a common line according to a first embodiment of the present invention Arrangement of wires. Please refer to FIG. 3, the conductor plate 300 for position detection is manufactured by screen printing, deposition method or electric clock method, and the conductor layer of the line conductor is made on the substrate 3 0 1 'this conductor layer is, for example, tin or copper' The conductive layer of the pair / child product is etched to form a row of wires 31 and a common row of wires from the 0th row to the Mth row. After the insulating layer 3 0 2 is formed, another conductor layer is formed on the insulating layer 3 0 2 by the same method to form a column conductor 3 0 6 and / or a common row conductor from the 0th column to the Nth column. CR) 308. The last insulating layer is formed on the column and common column wires. The position of a point P is detected by a capacitive coupling element 103, which is connected to an amplifier via a line 104 (shown in FIG. 11). In this embodiment, the levels of the column conductors and the row conductors are interchangeable. For example, column wires can be on the bottom and row wires on the top. This wire can be connected to a wire selected decoder and a driver (as shown in Figure 11) to sequentially supply an AC signal to each wire for detection by the capacitive coupling element 103.

第4圖顯示列導線第K-1列至第K +3列30 6及共同列導線 3 08之佈置圖,共同列導線加入於每一對列導線間之中 點’因之列導線之數目可減為一半而仍能維持同樣的位置 摘測精確度。Figure 4 shows the layout of columns K-1 to K + 3, 30 6 and common column 3 08. The common column is added to the middle point between each pair of columns. Can be reduced to half while still maintaining the same position picking accuracy.

第11頁 200421194 五、發明說明(7) 及共^ 圖之顯導不線依上據之Ί明之一實施例’加交流信號給列 示,而零電位人序°第5圖中,交流信號以表 祸口兀件之尖端指向p點,妙 、 ^ ^ 第1列而保持所右1#丨二灸门夺加乂 /反仏號於苐〇列及 雷交-人-7有其列導線及共同列導線為零電位,以 H二=件,例如一俄測筆測量交流信號為VI,再加交 列及第2列,測量其信號為v2, · · ·再=Page 11 200421194 V. Explanation of the invention (7) and the total display of the figure is not according to one of the examples of the above data. 'Add an AC signal to the list, and the zero-potential sequence. ° In Figure 5, the AC signal With the tip of the table pointing to the p point, Miao, ^ ^ the first column and keep the right 1 # 丨 The two moxibustion gates add the 乂 / 仏 仏 number in 苐 〇 and Leijiao-Ren-7 are listed. The lead and the common column lead are at zero potential, and H = 2. For example, a Russian stylus measures the AC signal as VI, then adds the cross column and the second column, and measures the signal as v2, · · · =

HrAvk為最大’則電㈣合元件之位置在第κ列及第 =3:其次,、參Λ"5")圖及第5(〇圖,Π ’’’、罪近第k列還疋罪近第k+1列,加交流信號於第匕 」,而,持其他列及共同列為零電位,如第5 ( B)圖所 不測里其信號為vk,在加交流信號於第k+ 1列而保持JL 他列及共同列為零電位,如第5 ( c)圖所示,測量其信號 為vk + Ι比較vk及vk+1之大小,若#大於vk+1,p點係靠 近第k歹j ’反之’ p點罪近弟让+1列。由此一實施例,精確 度已經加倍,因為吾人可決定m係靠近第k列還是靠近第 k + Ι列’亦即,在第κ列與第k + Ι列之間有兩個區域。 然後假設P點靠近第k列,即可繼續決定p點係靠近共 同列導線還是靠近第k列。加交流信號於共同列並保持所 有列導線為零電位,測量其信號為v 1,如第5 ( D)圖所 示’然後加交流信號於所有列導線並保持共同列導線於零 電位,測量其信號為v 2,如第5 ( E)圖所示。若v 2 / v 1 > 卜P點係靠近第K列,反之,若v2/vl < 1,P點係靠近共HrAvk is the largest 'then the position of the electric coupling element is in the κ column and the third = 3: Secondly, refer to the Λ " 5 ") map and 5 (〇, 〇' '', the crime is still near the k-th column. Near the k + 1th column, add the AC signal to the dagger ", while holding the other columns and the common column to zero potential, as shown in Figure 5 (B), the signal is vk, and when the AC signal is added to the k + 1 Column and keep JL and other columns at zero potential. As shown in Figure 5 (c), measure its signal as vk + Ι compare vk and vk + 1. If # is greater than vk + 1, p point is close to The k 歹 j 'conversely' point p is +1. The accuracy has been doubled since this example, because we can decide whether m is close to the k-th column or k + Ι ', that is, in There are two regions between columns κ and k + Ι. Then, assuming that point P is close to column k, you can continue to decide whether point p is close to the common column wire or column k. Add an AC signal to the common column and keep it All column wires are at zero potential, and the signal is measured as v 1, as shown in Figure 5 (D). Then add an AC signal to all column wires and keep the common column wires at zero potential, and measure their signals. Is v 2, as described in Section 5 (E) shown in FIG. If v 2 / v 1 >. Bu line near the point P K-th column, whereas, if v2 / vl < 1, P near the point-based co

200421194 五、發明說明(8) 其精 可決 同列導線。由此一實施例,以共同列插入各列之間 碟度可以增加4倍。亦即,在第K列及第k+ 1列之間 定4個不同之位置。200421194 V. Description of the invention (8) Its precision can be determined in the same line. According to this embodiment, a common row can be inserted between the rows to increase the disc size by 4 times. That is, 4 different positions are determined between the K-th column and the k + 1-th column.

第6圖係依據本發明之一實施例之位置偵測方法之流 ,圖。第6A圖顯示決定列空間位置之流程。量測開始於&電 谷輕合元件指在P點上,於步驟6 〇 1,使k = 〇,於步驟6 〇 2, 父流、號加於第k列及第k + 1列,其他列及共同列於零電 位’由電容耦合元件測得信號為vk。於步驟6 〇 3,判斷是 否k = N-1,若否,使k = k + l並回到步驟602,直到k = N-1為 止,然後,於步驟6 0 4找出v k之最大值,並來到步驟6 〇 5, 現在知道P點在第k列及第k + 1列之間。於步驟6 0 6,加信號 於第k列,其他列及共同列為零電位,測量vk,再於步驟』FIG. 6 is a flowchart of a position detection method according to an embodiment of the present invention. Figure 6A shows the process of determining the spatial position of a column. The measurement starts at & Electric Valley light-closing element refers to point P, at step 6 〇1, so that k = 〇, and at step 6 〇2, the parent stream and the number are added to column k and k + 1, The other columns and common columns are at zero potential. The signal measured by the capacitive coupling element is vk. At step 6 〇3, determine whether k = N-1. If not, make k = k + l and return to step 602 until k = N-1. Then, find the maximum value of vk at step 6 0 4 And go to step 6 05, now know that the point P is between the k-th column and the k + 1 column. At step 6 06, add the signal to the k-th column, the other columns and the common column are at zero potential, measure vk, and then step ”

6 〇 7 ’加交流信號於第k +1列,其他列及共同列保持於零電 位’測量vk+Ι,於步驟608,判斷是否vk + Ι大於vk,若 是,P點係靠近第k+ 1列。為測定P點係靠近共同列還是第 k + 1列,進入步驟6 1 0,加交流信號於共同列,保持全部列 導線於零電位,測量信號v;l,於步驟611,加交流信號1於* 所有列導線而保持共同列為零電位,測量信號為v2,U於+ = ^12比較V2及vl,判定是否v2/vl大於丨,若是,係= ,第’ m係、靠近共同列。現在回到 h 6 0 8,若v k + 1小於v k,程庠氺本t止时a、r " 列。為決定P點係靠近共同列=土、 ,P點係靠近第K 6 1 6,加交流信號於共同列、疋*近第k列’來到步驟 保持所有列導線於零電位,6 〇7 'Add the AC signal to the k + 1th column, and the other columns and common columns remain at zero potential.' Measure vk + 1, in step 608, determine whether vk + I is greater than vk. If so, point P is close to k + 1 Column. In order to determine whether the point P is close to the common column or the k + 1th column, proceed to step 6 1 0, add AC signals to the common column, keep all the wires at zero potential, and measure the signal v; l, at step 611, add the AC signal 1 In * all columns of conductors keep the common column at zero potential, the measurement signal is v2, U compares V2 and vl at + = ^ 12, and determines whether v2 / vl is greater than 丨, if yes, series = m, near the common column . Now return to h 6 0 8. If v k + 1 is less than v k, Cheng Yiben will stop at time a, r ". In order to determine that the point P is close to the common column = soil, and the point P is close to the K 6 1 6, add an AC signal to the common column, 疋 * near the k column ’to the step to keep all the conductors at zero potential,

200421194 五、發明說明(9) 測量v 1 ;又於步驟6 1 7,加交流信號於所有列導線,保持 共同列於零電位,測量信號為v 2,然後決定v 2 / V1是否大 於1,若是,P點係靠近第k列;若否,P點係靠近共同列。 測量於是進入A接點。 此法可進一步在共同列與列之間分為3、4、5、6、 7 · · ·等分。 第7圖顯示在共同列與列之間之空間被分為4等分之 例,若比值v2/vl係依據不同介質常數之材料及不同厚度 之材料而相應於兩導線間之空間1、空間2、空間3、空間 4,而事先決定,如表1所示,將此種比值儲存於控制器中 作比較之用,然後 表一 v2/vl a 1 a2 a3 a4 空間 1 2 3 4 測$之v 2 / v 1比值可與儲存之值比較以決定位置在那一空 間内。例如若v 2 / v 1〜a 2,則p點位於空間2内,等等。 弟田’、在二條導線間決定精確位置之流程圖。 述第6圖,私序到達步驟6 0 9或6 1 5,P點已決定靠近第κ 列,然後來到步驟801,加交流信號於共同列並保持所有200421194 V. Description of the invention (9) Measure v 1; and then in step 6 1 7, add the AC signal to all the columns and keep them at the common potential at zero. The measurement signal is v 2 and then decide whether v 2 / V1 is greater than 1. If yes, point P is near the k-th column; if not, point P is near the common column. The measurement then enters the A contact. This method can be further divided into 3, 4, 5, 6, 7 ··· equal divisions between common columns and columns. Figure 7 shows an example where the space between the common column and the column is divided into four equal parts. If the ratio v2 / vl is based on different dielectric constant materials and different thickness materials, it corresponds to the space between the two wires. 2. Space 3, Space 4, but decided in advance, as shown in Table 1, store this ratio in the controller for comparison, and then Table 1 v2 / vl a 1 a2 a3 a4 Space 1 2 3 4 Test $ The ratio of v 2 / v 1 can be compared with the stored value to determine the position in that space. For example, if v 2 / v 1 ~ a 2, the p point is located in space 2 and so on. Detian ’, a flowchart for determining the precise position between two wires. Referring to Figure 6, the private sequence arrives at step 6 0 9 or 6 1 5. Point P has decided to be close to the κ column, then proceed to step 801, add the AC signal to the common column and keep all

第14頁 200421194 五、發明說明(10) 列導線於零電位,測量信號為V 1 ;再於步驟8 0 3,加交流 信號於所有列導線,保持共同列為零電位,測量信號為 v 2 ’然後利用儲存於步驟8 0 5之v2/vl比值於步驟807,若 v2/v卜a2,則P點係位於空間2,如此類推,最後程序結 束0 於決定了 P點在列陣列之位置後,相同之程序可用以 決定P點在行陣列之位置。參考第6 B圖,偵測開始於a接 點,利用在列空間之相同程序以決定電容耦合元件在行空 間之位置。 ^ 結合在列陣列及行陣列所偵測之位置,電容麵合元件 在平面上之位置即可決定。 於本發明之一實施例,該 交流信號者可不一定為零電位 未加交流信號者可於任何特定 (零電位)、DC、AC等電壓亦 信號者可不一定為零電位,而 共同列、共同行、導線未加 ,該共同列、共同行、導線 之電壓水準,例如,接地一 可。該行及列導線未加交流 為任何特定之直流電壓。 第9圖係本發明之一實施例之列 仃、 共同列及共斤 y Η 〆、PJ夕 仃之佈置平面圖。列陣列3 〇 8及行陣列3丨丨安排為一 陣列為水平而行陣列為垂直。圖中並顯示共列g 同行 3 1 3。 J d 1 ^ ^Page 14 200421194 V. Description of the invention (10) Column leads are at zero potential, and the measurement signal is V 1; then in step 803, add AC signals to all column leads, and keep the common columns at zero potential, and the measurement signal is v 2 'Then use the v2 / vl ratio stored in step 805 in step 807. If v2 / v is a2, then the P point is located in space 2, and so on. Finally, the end of the program 0 determines the position of the P point in the column array. Later, the same procedure can be used to determine the position of point P in the row array. Referring to FIG. 6B, the detection starts at the a contact, and the same procedure in the column space is used to determine the position of the capacitive coupling element in the row space. ^ Combined with the positions detected by the column array and the row array, the position of the capacitor surface-on-element on the plane can be determined. In one embodiment of the present invention, the AC signal may not necessarily be at zero potential, and the AC signal may not be at any specific (zero potential), DC, AC, etc. The signal may not be at zero potential. Rows and wires are not added. The voltage level of the common column, common row, and wire is, for example, grounded. The row and column conductors are not supplied with AC to any specific DC voltage. FIG. 9 is a plan view showing the arrangement of columns 仃, common columns, and total weights y Η 〆 and PJ evening 之一 in one embodiment of the present invention. The column array 308 and the row array 3 are arranged as an array horizontally and the row array vertical. The figure also shows a total of g peers 3 1 3. J d 1 ^ ^

第15頁Page 15

200421194 五、發明說明(11) 第1 0圖顯示依據本發明之一實施例之位置偵測系統 8 0 0之方塊圖。網矩陣包括不同頁之網矩陣,於此實施 例,有第1頁812及第2頁814,每頁有其列陣列(R0到RM), 行陣列(C0到CN)及共同列(CR1及CR2),共同行(CC1及 CC2)〇很顯然增加一頁僅需增加二條導線(CR2及CC2) 〇 此等線被連接到位置偵測系統8 1 0以依序加交流信號並由 電容耦合元件感測偵測信號以決定該電容耦合元件之位 置0 為了決定電容耦合元件在那一頁,一交流信號被依序 加在共同R2 ( CR2)及共同R1 ( CR1),然後測量相應之信 號v ( 2)及v ( 1),經比較接收信號之大小,該電容耦合 元件之所在頁次可以決定。於本發明之另一實施例,頁次 亦可由依序加交流信號於共同Cl ( CC1)及共同C2 ( CC2) 而決定。 第11圖依據本發明之一實施例之位置偵測及信號驅動 系統之結構圖。導線板30 0以5列(R〇、in、R2、R3及R4) 及5行(CO、Π、C2、C3及C4)表示,該列及行導線連接 至一線選擇解碼器及驅動器9 0 2,該驅動器依序供應交流 信號給該列導線及行導線,並供應共同列及共同行導線。 一振盪器9 0 4產生所需之頻率及振幅之交流信號電壓並經 由導線9 0 5將信號電壓供應到一微處理器9 0 7,該微處理器200421194 V. Description of the invention (11) Figure 10 shows a block diagram of a position detection system 800 according to an embodiment of the present invention. The network matrix includes a network matrix of different pages. In this embodiment, there are a first page 812 and a second page 814. Each page has its column array (R0 to RM), row array (C0 to CN), and common columns (CR1 and CR2), common line (CC1 and CC2). Obviously, only two wires (CR2 and CC2) are needed to add one page. These lines are connected to the position detection system 8 1 0 to sequentially add AC signals and are coupled by capacitors. The element senses the detection signal to determine the position of the capacitive coupling element. 0 To determine which page of the capacitive coupling element, an AC signal is sequentially added to common R2 (CR2) and common R1 (CR1), and then the corresponding signals are measured. v (2) and v (1), after comparing the size of the received signal, the page number of the capacitive coupling element can be determined. In another embodiment of the present invention, the page number may also be determined by sequentially adding an AC signal to the common Cl (CC1) and the common C2 (CC2). FIG. 11 is a structural diagram of a position detection and signal driving system according to an embodiment of the present invention. The wire plate 300 is represented by 5 columns (R0, in, R2, R3, and R4) and 5 rows (CO, Π, C2, C3, and C4). The column and row wires are connected to the first-line selection decoder and driver 9 0 2. The driver sequentially supplies AC signals to the column and row conductors, and supplies common column and row conductors. An oscillator 9 0 4 generates an AC signal voltage of the required frequency and amplitude and supplies the signal voltage via a wire 9 0 5 to a microprocessor 9 0 7 which

第16頁· 200421194 五、發明說明(12) 經由匯流排9 0 3供應此依序之信號給該線選擇解碼器及驅 動器9 0 2 ; —電容耦合元件例如一偵測筆1 0 3於p點感測該 信號並將信號經由一隔離線1 0 4傳送給放大器9 0 8,該放大 器9 0 8之輸出被送至一振幅偵測器9 1 〇,該振幅偵測器9 1 0 將信號經由導線9 11送給一類比至數位轉換器9 1 2,該類比 至數位轉換器9 1 2與該微處理器通信,該偵測之信號為該 微處理器9 0 6所分析,其結果即為位置資料輸出9 0 7。 雖然本發明以特定之實施例已予揭露,熟知此技藝之 人士將瞭解可對此特定實施例之形式及細節稍作改變,在 不脫離本發明之精神及理念所作之修飾及變更皆為本發明 之範圍,本發明以上所敘述之實施例僅作例示之目的,而 不是用以限定所附之申請專利範圍。Page 16 · 200421194 V. Description of the invention (12) Supply this sequential signal to the line selection decoder and driver 9 0 2 via the bus 9 0 3;-Capacitive coupling element such as a detection pen 1 0 3 at p The point senses the signal and transmits the signal to an amplifier 9 0 8 via an isolation line 104. The output of the amplifier 9 0 8 is sent to an amplitude detector 9 1 0, which will The signal is sent to an analog-to-digital converter 9 1 2 via the wire 9 11. The analog-to-digital converter 9 1 2 communicates with the microprocessor. The detected signal is analyzed by the microprocessor 906. The result is a position data output of 9 0 7. Although the present invention has been disclosed with specific embodiments, those skilled in the art will understand that the form and details of this specific embodiment may be slightly changed, and modifications and changes made without departing from the spirit and concept of the present invention are all The scope of the invention, the above-mentioned embodiments of the present invention are for illustrative purposes only, and are not intended to limit the scope of the attached patent application.

------ 第17頁 ----1 200421194 --- _ 圖式簡單說明 5.圖式簡單說明 第1圖(先前技藝)係二層之行及列導線之佈置圖及在p點之 偵測筆。 ” 第2圖(先前技藝)係有四接觸點之導體材料2 〇 〇及在P點之 偵測筆。 第3圖為根據本發明之一實施例之導線板及偵測筆之剔面 圖。 第4圖為依據本發明之一實施例之列導線及共用列導線之 佈置圖。 第5圖(A)(B)(C)(D)(E)顯示依據本發明之一實施例加交、流 "is遽給列及共同列之導線上之次序。 第6A圖係依據本發明之一實施例之列空間位置偵測方法之 流程圖。 第6 B圖係依據本發明之一實施例之行空間位置偵測方法之 流程圖。 第7圖顯示依據本發明之一實施例在丘同列與第k列之間決 定更精確之位置。 第8圖係在二條導線間決定精確位置之流程圖。 第9圖係本發明之一實施例之列、行、共同列及共同行之 佈置平面圖。 第1 0圖顯示依據本發明之一實施例之二或多頁之位置1貞測 系統8 0 0之方塊圖。 第11圖依據本發明之一實施例之位置偵測及信號驅動系統------ Page 17 ---- 1 200421194 --- _ Brief description of the diagram 5. Brief description of the diagram The first diagram (previous technique) is the layout of the row and column conductors on the second floor and the p Point of detection pen. "Figure 2 (previous technique) is a conductor material 2000 with four contact points and a detection pen at point P. Figure 3 is a cross-sectional view of a lead plate and detection pen according to an embodiment of the present invention Fig. 4 is a layout diagram of a column conductor and a common column conductor according to an embodiment of the present invention. Fig. 5 (A) (B) (C) (D) (E) shows an embodiment of the present invention. The order on the conductors of the intersection, flow, and common and common columns. FIG. 6A is a flowchart of a method for detecting spatial position of a column according to an embodiment of the present invention. FIG. 6B is one of the methods according to the present invention. The flowchart of the row space position detection method of the embodiment. Fig. 7 shows that a more precise position is determined between the same row and the k-th column according to an embodiment of the present invention. Fig. 8 determines the precise position between two wires. FIG. 9 is a plan view showing the arrangement of rows, rows, common columns, and common rows according to an embodiment of the present invention. FIG. 10 shows a position measurement of two or more pages according to an embodiment of the present invention. Block diagram of system 800. Fig. 11 Position detection and signal driving system according to an embodiment of the present invention All

第18頁 200421194 904 906 908 910 912 914 系統 圖式簡單說明 之結構圖。 符號說明: 1 0 1列導線 1 0 3電容耦合元件 2 0 0導體材料 2 0 2導線 3 0 1基板 3 0 4絕緣層 3 0 8共同列導線 3 1 2共同列 601-620 步驟 8 0 0位置偵測系統 8 0 2導線 8 1 0 位置偵測系統 808 導線 814 第2頁 9 0 3匯流排 9 0 5導線 9 0 7位置資料輸出 9 0 9導線 9 11導線 9 1 3導線 11 0 0位置偵測及信號驅動 1 0 2 行導線 1 0 4 隔離線 201 接觸點 3 0 0 導線板 3 0 2絕緣層 3 0 6 列導線 311 行導線 3 1 3 共同行 6 0 Γ - 6 2 0 ’ 步驟 801,803, 805, 807 步驟 8 0 4導線 8 0 6導線 812第1頁 9 0 2 線選擇解碼器及驅動器 振盪器 微處理器 放大器 振幅偵測器 類比至數位轉換器 導線 ❿Page 18 200421194 904 906 908 910 912 914 System Structure diagram for simple illustration. Explanation of symbols: 1 0 1 column of wires 1 0 3 capacitive coupling element 2 0 0 conductor material 2 0 2 wires 3 0 1 substrate 3 0 4 insulation layer 3 0 8 common column wires 3 1 2 common column 601-620 step 8 0 0 Position detection system 8 0 2 lead 8 1 0 Position detection system 808 lead 814 Page 2 9 0 3 bus 9 0 5 lead 9 0 7 Position data output 9 0 9 lead 9 11 lead 9 1 3 lead 11 0 0 Position detection and signal drive 1 0 2 rows of wires 1 0 4 isolated wires 201 contact points 3 0 0 wire plates 3 0 2 insulation 3 0 6 columns of wires 311 rows of wires 3 1 3 common rows 6 0 Γ-6 2 0 ' Steps 801, 803, 805, 807 Step 8 0 4 wires 8 0 6 wires 812 page 1 9 0 2 wire selection decoder and driver oscillator microprocessor amplifier amplitude detector analog to digital converter wires ❿

第19頁Page 19

Claims (1)

200421194 六、申請專利範圍 1. 一種位置偵測裝置,用於在一平面上偵測一電容耦 合元件之位置,至少包含: 一列導線及行導線陣列兩者間為一絕緣層所隔離,該 列導線具有一間距c,在列導線之間有一共同列導線距該 列導線之距離為c/2 ; 該行導線具有一間距d,在行導線之間有一共同行導 線距該行導線之距離為d/2 ; 該共同列導線係連接到一共同列接頭; 該共同行導線係連接到一共同行接頭; 一線選擇解碼器及驅動器依序供應交流信號給該列導 線及行導線,並共同列及共同行導線;供應特定電壓水準 給不供應交流信號之共同導線;並供應特定之直流電壓給 不供應交流信號之列或行導線; 一振盪器產生所需之頻率及振幅之交流信號電壓並供 應該信號電壓給一微處理器; 該微處理器經由一匯流排供應依序之信號給該線選擇 解碼器及驅動器; 一電容耦合元件在一平面上之一點感測此偵測信號並 經由一隔離線傳送該偵測之信號給一類比到數位(A/D) 轉換器; 該A/D轉換器轉換該偵測信號之振幅為一數位信號並 與該微處理器通信。 2. 如申請專利範圍第1項之位置偵測裝置,其中該位200421194 6. Scope of patent application 1. A position detection device for detecting the position of a capacitive coupling element on a plane, including at least: a column of conductors and a row of conductor arrays are separated by an insulating layer, the column The conductors have a distance c, and a common column conductor between the column conductors has a distance of c / 2 from the column conductors; the row conductor has a distance d, and a common row conductor between the row conductors has a distance from the row conductors of d / 2; the common line conductor is connected to a common line connector; the common line conductor is connected to a common line connector; a line selection decoder and driver sequentially supply AC signals to the column and line conductors, and And common line conductors; supply specific voltage levels to common conductors that do not supply AC signals; and supply specific DC voltages to column or row conductors that do not supply AC signals; an oscillator generates the AC signal voltage of the required frequency and amplitude and Supply the signal voltage to a microprocessor; the microprocessor supplies sequential signals to the line selection decoder and driver via a bus; A capacitive coupling element senses the detection signal at a point on a plane and transmits the detection signal to an analog-to-digital (A / D) converter via an isolation line; the A / D converter converts the detection The amplitude of the signal is a digital signal and communicates with the microprocessor. 2. If the position detection device of the scope of patent application No.1, where 第20頁 200421194 六、申請專利範圍 置偵測裝置係 3. 如申請 置债測裝置係 4. 如申請 線為金屬。 5. 如申請 線為透明金屬 6. 如申請 線係以網版印 7. 如申請 線係以沉積法 8. 如申請 線係以電鍍法 9. 如申請 線係形成在塑 僅由列及共同列構成者。 專利範圍第1項之位置偵測裝置,其中該位 僅由行及共同行構成者。 專利範圍第1項之位置偵測裝置,其中該導 專利範圍第1項之位置偵測裝置,其中該導 氧化物。 ⑩ 專利範圍第1項之位置偵測裝置,其中該導 刷形成。 專利範圍第1項之位置偵測裝置,其中該導 形成0 專利範圍第1項之位置偵測裝置,其中該導 形成。 專利範圍第1項之位置偵測裝置,其中該導 膠基板上。 1 0 .如申請專利範圍第1項之位置偵測裝置,其中該導 200421194 六、申請專利範圍 線係形成在玻璃基板上。 11.如申請專利範圍第1項之位置偵測裝置,其中該導 線係形成在撓性基板上。 1 2 ·如申請專利範圍第1項之位置偵測裝置,其中該特 定電壓水準及該特定直流電壓為接地電位。 1 3.如申請專利範圍第1項之位置偵測裝置,其中該特 定電壓水準為直流電壓。 1 4.如申請專利範圍第1項之位置偵測裝置,其中該特 定電壓水準為交流電壓。 1 5 · —種在一平面上偵測位置之方法,具有列及行導 線及共同導線在每二列及每二行之間,此等導線可選擇性 地連接到一線選擇解碼器及驅動器,一信號振盪器,一微 處理器,一電容耦合元件置於P點以檢拾該偵測信號,至 少包含下列步驟: (a) 加交流信號於一頁上之共同列,然後加於另一 頁,以一電容耦合元件測量該信號v ( 2)及v ( 1); (b) 比較v ( 2)及v ( 1)之大小以決定要偵測之頁 次; (c) 同時加交流信號於第k列及第k+Ι列,其中k = 0至Page 20 200421194 VI. Scope of patent application. Detecting device system 3. If applying for debt measurement device 4. If applying for line is metal. 5. If the application line is transparent metal 6. If the application line is screen printed 7. If the application line is deposition method 8. If the application line is plating method 9. If the application line is formed in plastic only by the column and common Column Constructor. The position detection device of the first scope of the patent, in which the bit is only composed of lines and common lines. The position detection device of the first scope of the patent, wherein the position detection device of the first scope of the patent, wherein the oxide is introduced.位置 The position detection device of the first scope of the patent, wherein the guide brush is formed. The position detection device of the first scope of the patent, the guide forms 0 The position detection device of the first scope of the patent, the guide forms. The position detection device of the first scope of the patent, wherein the adhesive substrate is on the substrate. 10. The position detection device according to item 1 of the scope of patent application, wherein the guide 200421194 6. The scope of patent application The line is formed on a glass substrate. 11. The position detection device according to item 1 of the patent application scope, wherein the wire is formed on a flexible substrate. 1 2 · The position detection device according to item 1 of the scope of patent application, wherein the specific voltage level and the specific DC voltage are ground potentials. 1 3. The position detection device according to item 1 of the patent application scope, wherein the specific voltage level is a DC voltage. 1 4. The position detection device according to item 1 of the patent application scope, wherein the specific voltage level is an AC voltage. 1 5 · —A method for detecting position on a plane, with column and row wires and common wires between every two columns and every two rows, these wires can be selectively connected to a line selection decoder and driver, A signal oscillator, a microprocessor, and a capacitive coupling element are placed at point P to pick up the detection signal. At least the following steps are included: (a) adding an AC signal to a common column on a page, and then adding it to another Page, measure the signals v (2) and v (1) with a capacitive coupling element; (b) compare the sizes of v (2) and v (1) to determine the number of pages to be detected; (c) add AC at the same time Signals are in columns k and k + 1, where k = 0 to 第22頁 200421194 六、申請專利範圍 N- 1,所有其他列導線及共同列導線於一特定電壓水準之 電位,以一電容耦合元件測量該信號為vk ; (d)決定vk之最大值,若vk為最大值,此位置係在第k 列與第k + 1列之間; (e )僅加交流信號第k列,所有其他列於特定直流電 壓,共同列於一特定電壓水準之電位,測量信號為vk,然 後加交流信號於第k + 1列,所有其他列於特定直流電壓, 共同列於一特定電壓水準之電位,測量信號為vk+ 1 ;比較 v k及v k + 1,若v k大於v k + 1,P點係靠近第k列,若v k小於 v k + 1,P點位係靠近第k + 1列; V (f )加交流信號於共同列,所有其他列於一於特定直 流電壓,測量信號為v 1 ;加交流信號於所有列,而共同列 則於於特定直流電壓,測量信號為v 2 ;比較v 2及v 1,若 ▽ 2/¥1大於1,?點係靠近第1^列;若¥2/¥1小於1,?點係靠 近共同列; (g )對行空間重複步驟(a )到(f )。 1 6.如申請專利範圍第1 5項之方法,其中該特定電壓 水準及該特定直流電壓係接地電位。 _ 1 7.如申請專利範圍第1 5項之方法,其中該特定電壓 水準為直流電壓。 18.如申請專利範圍第15項之方法,其中該特定電壓Page 22 200421194 VI. Patent application scope N-1. The potential of all other columns and common columns at a specific voltage level. The signal is measured by a capacitive coupling element as vk; (d) Determine the maximum value of vk, if vk is the maximum value, this position is between the k-th column and the k + 1 column; (e) only the k-th column of the AC signal is added, all other columns are listed at a specific DC voltage, and are collectively listed at a specific voltage level, The measurement signal is vk, then the AC signal is added to column k + 1, all others are listed at a specific DC voltage, and are listed at a specific voltage level together. The measurement signal is vk + 1; compare vk and vk + 1, if vk is greater than vk + 1, point P is near the k-th column, if vk is less than vk + 1, point P is near the k + 1 column; V (f) plus the AC signal in the common column, all other columns are at a specific DC voltage , The measurement signal is v 1; add the AC signal to all columns, and the common column is at a specific DC voltage, and the measurement signal is v 2; compare v 2 and v 1, if ▽ 2 / ¥ 1 is greater than 1,? The point is near column 1 ^; if ¥ 2 / ¥ 1 is less than 1,? Points are near common columns; (g) Repeat steps (a) to (f) for row space. 16. The method according to item 15 of the scope of patent application, wherein the specific voltage level and the specific DC voltage are ground potentials. _ 1 7. The method according to item 15 of the scope of patent application, wherein the specific voltage level is a DC voltage. 18. The method of claim 15 in which the specific voltage is applied 第23頁 200421194 六、申請專利範圍 水準為交流電壓。 1 9 ·如申請專利範圍第1 5項之方法,其中第k列及共同 列之間之空間被分為N等分,由儲存實驗測得相應於在導 線上之不同介質常數材料及不同厚度材料之每一空間η之 ¥2/¥1比值,經比較偵測所得之¥2/¥1比值與儲存之值而決 定其位置。Page 23 200421194 6. Scope of patent application The level is AC voltage. 19 · According to the method of item 15 in the scope of patent application, the space between the k-th column and the common column is divided into N equal parts, and different dielectric constant materials and different thicknesses on the wire are measured by storage experiments. The ¥ 2 / ¥ 1 ratio of each space η of the material is determined by comparing the ¥ 2 / ¥ 1 ratio and the stored value to determine its position. 第·24頁P.24
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