TR201614871A2 - Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇ - Google Patents

Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇ Download PDF

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Publication number
TR201614871A2
TR201614871A2 TR2016/14871A TR201614871A TR201614871A2 TR 201614871 A2 TR201614871 A2 TR 201614871A2 TR 2016/14871 A TR2016/14871 A TR 2016/14871A TR 201614871 A TR201614871 A TR 201614871A TR 201614871 A2 TR201614871 A2 TR 201614871A2
Authority
TR
Turkey
Prior art keywords
leakage current
quality factor
harmonic
reading
driving method
Prior art date
Application number
TR2016/14871A
Other languages
English (en)
Inventor
Külah Haluk
Zorlu Özge
Kangül Mustafa
Aydin Eren
Gökçe Furkan
Original Assignee
Haluk Kuelah
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Haluk Kuelah filed Critical Haluk Kuelah
Priority to TR2016/14871A priority Critical patent/TR201614871A2/tr
Priority to PCT/TR2017/050494 priority patent/WO2019013719A2/en
Priority to EP17917264.8A priority patent/EP3529853B1/en
Priority to US16/338,696 priority patent/US10763817B2/en
Publication of TR201614871A2 publication Critical patent/TR201614871A2/tr

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H9/02393—Post-fabrication trimming of parameters, e.g. resonance frequency, Q factor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P7/00—Resonators of the waveguide type
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/0072—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks of microelectro-mechanical resonators or networks
    • H03H3/0075—Arrangements or methods specially adapted for testing microelecro-mechanical resonators or networks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H9/02433—Means for compensation or elimination of undesired effects
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
    • H03H9/2405—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive of microelectro-mechanical resonators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/46—Filters
    • H03H9/462—Microelectro-mechanical filters
    • H03H9/465—Microelectro-mechanical filters in combination with other electronic elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H9/02433—Means for compensation or elimination of undesired effects
    • H03H2009/02456—Parasitic elements or effects, e.g. parasitic capacitive coupling between input and output
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H2009/02488—Vibration modes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H9/02259—Driving or detection means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02—Details
    • H03H9/02244—Details of microelectro-mechanical resonators
    • H03H9/02393—Post-fabrication trimming of parameters, e.g. resonance frequency, Q factor
    • H03H9/02417—Post-fabrication trimming of parameters, e.g. resonance frequency, Q factor involving adjustment of the transducing gap
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
    • H03H9/2405—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive of microelectro-mechanical resonators
    • H03H9/2426—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive of microelectro-mechanical resonators in combination with other electronic elements

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Micromachines (AREA)

Abstract

Başvuru konusu buluş, elektrostatik sürülen değişken boşluklu rezonatörler için yüksek kalite faktörlü ve kaçak akım etkilerinden arındırılmış yeni bir karakterizasyon yöntemi ile ilgilidir.
TR2016/14871A 2016-10-20 2016-10-20 Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇ TR201614871A2 (tr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TR2016/14871A TR201614871A2 (tr) 2016-10-20 2016-10-20 Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇
PCT/TR2017/050494 WO2019013719A2 (en) 2016-10-20 2017-10-12 SECOND HARMONIC-BASED CHARACTERIZATION AND CONTROL METHOD, IMPROVING THE QUALITY FACTOR AND REDUCING THE CROSS-CURRENT CURRENT IN VARIABLE-INTERACTING ELECTROSTATIC MEMS RESONATORS
EP17917264.8A EP3529853B1 (en) 2016-10-20 2017-10-12 A characterization and driving method based on the second harmonic, which is enhancing the quality factor and reducing the feedthrough current in varying gap electrostatic mems resonators
US16/338,696 US10763817B2 (en) 2016-10-20 2017-10-12 Characterization and driving method based on the second harmonic, which is enhancing the quality factor and reducing the feedthrough current in varying gap electrostatic MEMS resonators

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TR2016/14871A TR201614871A2 (tr) 2016-10-20 2016-10-20 Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇

Publications (1)

Publication Number Publication Date
TR201614871A2 true TR201614871A2 (tr) 2019-01-21

Family

ID=65001740

Family Applications (1)

Application Number Title Priority Date Filing Date
TR2016/14871A TR201614871A2 (tr) 2016-10-20 2016-10-20 Elektrostati̇k mems rezonatörlerde kali̇te faktörünü yükselten ve kaçak akimini düşüren i̇ki̇nci̇ harmoni̇k okumaya dayali bi̇r karakteri̇zasyon/sürüş yöntemi̇

Country Status (4)

Country Link
US (1) US10763817B2 (tr)
EP (1) EP3529853B1 (tr)
TR (1) TR201614871A2 (tr)
WO (1) WO2019013719A2 (tr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115605765A (zh) * 2021-04-23 2023-01-13 深圳市韶音科技有限公司（Cn） 加速度传感装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6624726B2 (en) * 2001-08-31 2003-09-23 Motorola, Inc. High Q factor MEMS resonators
EP1777816A1 (en) 2005-10-18 2007-04-25 Seiko Epson Corporation MEMS resonator and method of enhancing an output signal current from a MEMS resonator
US8094841B2 (en) * 2007-01-17 2012-01-10 The Regents Of The University Of California Apparatus and method using capacitive detection with inherent self-calibration
WO2008146244A1 (en) 2007-06-01 2008-12-04 Nxp B.V. Mems resonators
US8493157B2 (en) * 2008-06-18 2013-07-23 Nxp B.V. MEMS resonator for filtering and mixing
US7982550B1 (en) * 2008-07-01 2011-07-19 Silicon Laboratories Highly accurate temperature stable clock based on differential frequency discrimination of oscillators
FI123529B (fi) * 2010-04-22 2013-06-28 Aalto Korkeakoulusaeaetioe Mikromekaaniseen oskillaattoriin perustuva lämpötilakompensoitu taajuusreferenssi
JP2012070193A (ja) 2010-09-22 2012-04-05 Nippon Dempa Kogyo Co Ltd 発振器
US8680931B1 (en) * 2012-03-30 2014-03-25 Integrated Device Technology Inc. Periodic signal generators having microelectromechanical resonators therein that support surface wave and bulk acoustic wave modes of operation with different temperature coefficients of frequency
US9791503B1 (en) * 2015-09-30 2017-10-17 Integrated Device Technology, Inc. Packaged oscillators with built-in self-test circuits that support resonator testing with reduced pin count

Also Published As

Publication number Publication date
US10763817B2 (en) 2020-09-01
WO2019013719A2 (en) 2019-01-17
WO2019013719A9 (en) 2019-04-04
EP3529853A2 (en) 2019-08-28
WO2019013719A3 (en) 2019-05-02
EP3529853B1 (en) 2021-12-15
US20190296711A1 (en) 2019-09-26
EP3529853A4 (en) 2020-05-27

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