SU983814A1 - Device for ageing electronic devices - Google Patents

Description

(54) DEVICE FOR TRAINING

ELECTRICAL APPLIANCES

one

The invention relates to electronic technology and can be used to increase the electrical strength and durability of vacuum devices (SGP) both in the production process and during their operation in various radio engineering devices, in particular for training under the conditions of operation of powerful generator lights. , traveling wave tubes, kliotrons, vacuum capacitors, etc. in order to increase their reliability and service life.

A device is known for training an EVP by winds, containing a source of a 1-pole voltage and a storage capacitor connected to a trained C1 device.

During the development of a breakdown in a trained instrument, a capacitor current flows through it, which mainly determines the breakdown energy:.

The disadvantage of this device is the low efficiency of training, due to the unfavorable nature of energy distribution in the trained device during the development of the sample. This is due to the fact that the initial discharge current, defined by the voltage, to which the capacitor was pre-charged, and the arc resistance value, is too large, which can

10 damage the device.

In addition, the duration of the breakdown depends on the time constant of the discharge circuit, i.e. from the parameters of the arc, and, as a rule, exceeds the value required to eliminate protrusions on the surface of the electrodes initiated by the initiators of the sample. Due to excessive currents and the long duration of the discharge in the test section, the sample in the trained device can only be destroyed by the irregularities on the surface of the electrodes,

but to form new ones, which reduces the effectiveness of training. 39 A device is known in which it is. The capacitor is connected to an additional source, the voltage of which is chosen to be less than the breakdown voltage. Therefore, the initial discharge current proportional to the voltage across the storage capacitor is substantially less than C 2 J. However, the known device does not provide an optimal training mode, since the magnitude of the arc current is not maintained at the required level, but changes during the discharge of the capacitor. In addition, the duration of the breakdown is difficult to regulate and is almost too long. The aim of the invention is to increase the efficiency of training due to the optimization of the magnitude of the current and the duration of the arc discharge in the interelectrode spacer of the trainee EEC. This goal is achieved by introducing into the device containing a source of breakdown voltage, connected to the device being trained, an open length of a long line, one of its ends connected to a source of breakdown voltage, and a workable device, and the characteristic impedance of the open length of a long line is greater arc resistance. In parallel with the trained instrument, the successively connected resistor and the diode can be turned on in the direction opposite to the polarity of the source of breakdown voltage. An open segment of a long line can be made in the form of its equivalent of elements with focused parameters. At the end of the open length of the long line can be included kovdensator. In addition, the trained device can be connected to the input of the length of the line through a resistor, the resistance of which in total with the resistance of the arc does not exceed the characteristic impedance of the open segment of the long line. FIG. 1-3 presents the scheme of the proposed device. The circuits contain the source 1 of the breakdown voltage, the device being trained 2, the open section 3 of the long line, the stop 4, the resistors 5 and 6. The device works as follows. 4 Under the action of the breakdown voltage source 1, an open section 3 is charged with a long line until the voltage on an open section 3 of a long line reaches the breakdown voltage of the trained device 2. As the sample develops, the resistance value of the trained device 2 decreases sharply, and the voltage on the trained inter-electrode gap drops to a value not exceeding about 20–25 V (arc burning voltage). At the time of occurrence, the breakdown begins to discharge the open segment 2 of the long line of the black line The device being trained 2. An open segment 3 long line in the discharge process behaves in relation to the trained device 2 as a constant voltage generator with an EMF equal to the voltage up to which the open segment 3 long line was precharged and internal resistance equal to characteristic impedance. Therefore, a constant current of almost constant magnitude flows through the trainer & Simultaneously with the beginning of the discharge through the trained device 2, in the open segment 3 of the long line, a current wave running from the input to the open end of the discharge is of the same magnitude as the current through the trained device 2. In this case, the discharge voltage is subtracted from the voltage, to which it was pre-charged open from sharp 3 long lines. Upon reaching the open end of the discharge, the wave is fully reflected. Reflection occurs without changing the magnitude and sign of HanpsH and without measuring the magnitude, but with a change in the sign of the current relative to the direction of motion of the wave. As a result, a wave running from the open end to the beginning of an open segment of long line 3 arises. Since the wave resistance of the open-loop segment 3 of the long line is chosen greater than the arc resistance value in the interelectrode gap of the trained device 2, the discharge wave voltage exceeds half the voltage to which the open segment 3 of the long line was charged. Therefore, when the reflected discharge wave reaches the beginning of an open segment, 3 long lines on

A rentable device 2 produces a voltage, polarity, which is inverse to the arc voltage. As a result, the arc is extinguished.

To prevent repeated tripping of the device under test 2 by the voltage of the reflected wave parallel to the input of the open segment 3 of the long line, series-connected resistor 5 and diode 4 are connected, in the direction opposite to the polarity of the breakdown voltage source.

In the device shown in FIG. 2, immediately after arc quenching in the trained device 2 due to the reflected 5 wave, diode 4 is unlocked, which prevents the voltage of the negative polarity on the trained person from device 2. Resistor 5 serves to limit the current through the diode 4.20

Thus, in a device, the duration of a probe in a training device 2

It is completely determined by the doubled runtime of the discharge wave along the open segment 3 of the long line 25 and can be set during training completely independently of the other parameters of the circuit. In order to achieve a great deal of design convenience, open from the cutting lines 3 of the long line can be 30 filled in the form of its known equivalent of media elements. In order to shorten an open segment 3 long lines for a given duration of breakdown on its 35

open end can be switched on capacitor. By varying the capacitance of the KoNosenator, it is possible to conveniently regulate the duration of the discharge wave along the line and, consequently, the duration of 40 samples in the trained device 2.

The magnitude of the discharge current through the device being scanned 2 is conveniently controlled in the embodiment of the proposed device shown in FIG. 3. When connecting 45 the trained device 2 with the input of a single whip segment 3 long lines through a resistor 6, the resistance of which in total with the arc resistance does not exceed the characteristic impedance JQ of the open segment 3 long lines, the described principle of the device remains. However, by adjusting the resistance value of the resistor 6, it is possible to measure the magnitude of the discharge current during the breakdown jj of the trained device 2,

The device provides a higher efficiency of the training of EEP, thanks to the predominance of the processes of destruction of surface irregularities and protrusions, initiating breakdowns on the surfaces of electrodes, over the processes of formation of new irregularities arising from excessive release of power. Such training conditions in the device are realized by optimizing the current value and the duration of the sample. Since, in the device, in comparison with the known technical solutions of a similar purpose, the magnitude of the current during the discharge process remains almost unchanged, it is possible to ensure the optimal nature of the energy release in the trained instrument. It is important that the duration of the breakdown can be adjusted regardless of the magnitude of the aforementioned current. The specific implementation of breakdown voltage source 1 shown in FIG. 1, 12 and 3 are not critical to the operation of the device. In particular, it can be a source of both constant and pulsed voltage with a corresponding internal resistance.

In addition, the training voltage may be applied to the EEC through an adjustable bit. The source may also include a ballast resistor, a charging choke, and other elements that provide the desired character of the charging process for the length of the long line.

Claims (2)

Invention Formula  A device for training electrovacuum devices containing a source of breakdown voltage connected to a training device, characterized in that, in order to increase training efficiency by opting for the current magnitude and duration of the arc section in the interelectrode gap of the device being trained, the open section of the device is additionally inserted line, one of its ends connected to the source of breakdown voltage and the device being trained, moreover. the characteristic impedance of the open segment of the long line is greater than the arc resistance. 2. A device according to Claim 1, characterized in that, in parallel with the trained instrument, there are connected in series a resistor and a diode connected in the direction of the opposite polarity of the source of the breakdown voltage.