SU888024A1 - Eddy-current flaw detection method - Google Patents
Eddy-current flaw detection method Download PDFInfo
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- SU888024A1 SU888024A1 SU802904865A SU2904865A SU888024A1 SU 888024 A1 SU888024 A1 SU 888024A1 SU 802904865 A SU802904865 A SU 802904865A SU 2904865 A SU2904865 A SU 2904865A SU 888024 A1 SU888024 A1 SU 888024A1
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Description
(54) СПОСОБ ВИХРЕТОКОВОЙ ДЕФЕКТОСКОПИИ(54) VORTEX-CURRENT DEFECT-COPY METHOD
1one
Изобретение относитс к н еразрушающему контролю и может быть использовано дл обнаружени несплошностей по толщине металлических изделий.The invention relates to non-destructive testing and can be used to detect discontinuities in the thickness of metal products.
Известны способы вихретоковой дефектоскопии , заключающиес в амплитудно-фазовой обработке сигнала датчика, сканирующего по контролируемой поверхности 1.Eddy current flaw detection methods are known, which consist in amplitude-phase processing of a sensor signal scanning a controlled surface 1.
Сдвиг по фазе на 90° опорного напр жени по отношению к сигналу помехи позвол ет подавить ее вли ние на результаты контрол .A 90 ° phase shift of the reference voltage relative to the interference signal suppresses its effect on the control results.
Недостатком известного способа вл етс сложность реализации при выделении полезного сигнала.The disadvantage of this method is the complexity of the implementation of the selection of the useful signal.
Наиболее близким по технической сущности к изобретению вл етс способ вихретоковой дефектоскопии, заключающийс в том, что в контролируемом изделии возбуждают вихревые токи, выдел ют составл ющую магнитного пол дефекта, мен ющую знак в процессе сканировани датчиком, и по сигналу с фазового детектора определ ют искомые параметры 2.The closest to the technical essence of the invention is a method of eddy current flaw detection, which implies that eddy currents are excited in a controlled product, the component of the magnetic field of the defect, the sign changing during the scanning process is extracted, and the desired options 2.
Недостатком известного способа вл етс низка точность контрол .The disadvantage of this method is low control accuracy.
Целью изобретени вл етс повыщение точности контрол .The aim of the invention is to increase the accuracy of the control.
Поставленна цель достигаетс тем, что по линии сканировани выбирают п нечетных равноотсто щих друг от друга точек контрол , определ ют сумму сигналов равного числа измерений до и после выбранной точки контрол , вычитают их и полученную величину относ т к выбранной точке , по полученной зависимости .дл всех выбранных точек по линии сканировани опреto дел ют наличие дефекта и по ее максимуму - координату дефекта, а рассто ние между крайними точками контрол определ ют из соотношени :The goal is achieved by choosing n odd equidistant points of control from each other along the scanning line, determining the sum of signals of an equal number of measurements before and after the selected control point, subtracting them and the resulting value is related to the selected point, according to the resulting dependence. all selected points determine the presence of a defect by the scanning line and, by its maximum, the coordinate of the defect, and the distance between the extreme points of the control is determined from the relation:
1515
где4 - рассто ние между точками контрол ;where 4 is the distance between control points;
OJ - кругова рабоча частота контрол ;OJ - circular operating frequency control;
2020
б - электропроводность материала контролируемого издели ;b - electrical conductivity of the material of the controlled product;
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU802904865A SU888024A1 (en) | 1980-04-02 | 1980-04-02 | Eddy-current flaw detection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU802904865A SU888024A1 (en) | 1980-04-02 | 1980-04-02 | Eddy-current flaw detection method |
Publications (1)
Publication Number | Publication Date |
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SU888024A1 true SU888024A1 (en) | 1981-12-07 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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SU802904865A SU888024A1 (en) | 1980-04-02 | 1980-04-02 | Eddy-current flaw detection method |
Country Status (1)
Country | Link |
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SU (1) | SU888024A1 (en) |
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1980
- 1980-04-02 SU SU802904865A patent/SU888024A1/en active
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