SU871112A2 - Device for calibrating delay devices by means of time marks - Google Patents

Description

The invention relates to the field of electrical and radio measuring equipment, can be used in the measurement of time shifts and calibration of continuously adjustable delay devices. A device for calibrating a delay device using time stamps is known, which contains a master oscillator, a frequency divider, a reset pulse shaper, a selector, a calibrated delay device, an electronic indicator, a frequency multiplier, a shaper, a percussion generator, a block of summation and the delay element. Its disadvantage is low calibration accuracy. The purpose of the invention is to improve the accuracy of calibration — in a device for calibrating delay devices using time stamps containing a master oscillator, a frequency divider, a reset pulse generator, a selector, a calibrated delay device, an electron-beam indicator, a frequency multiplier, a driver, and a generator. shock excitation, summation unit, delay element, introduced two series-connected adjustable delay elements connected between the input of the delay being calibrated. and selector output. FIG. 1 is a block diagram of the device; 2 shows the formation of additional calibrated delay values. The device contains a master oscillator If frequency divider 2, shaper 3 reset pulses, selector 4, calibrated delay device 5, electron-beam indicator b, frequency multiplier 7, shaper 8, Shock generator 9 excitation, summation unit 10, delay element 11, first and second additional adjustable delay elements 12, 13. The device operates as follows. The output signal from the backlight generator 1 is fed to an adjustable frequency divider 2, forming two pulse sequences with the same repetition period, but with different time delays. However, a sequence of pulses is used to start a calibrated delay device 5, the other determines the operating time of the shock excitation generator 9, depending on the delay of the calibrated device and the sweep speed at which the measurement is performed. The selector 4 eliminates the instability of the operation of the divider 2 frequency, the generator 3 of the reset pulses brings the divider 2 frequencies to the initial state before the beginning of the next cycle, and the frequency multiplier 7 allows to obtain time stamps with a sufficiently small loop repetition. The voltage that changes according to the sivi law and arrives at the input of the shape of the body 8, is removed from its output in the form of a voltage that changes according to the law S-iv. The shock excitation generator 9 generates a voltage with a frequency equal to the signal frequency from the output of the driver, but according to the law CO, which is coordinated in phase with the delay element 11 in phase with the voltage sih at zero setting

Since SlM with 1 at zero position of the installation elements of the delay of the calibrated device 5, the delay from the summation unit 10 to the input of the electron-beam indicator 6 enters a constant voltage. At the same time, there is no variable component on the screen.

In the interval of the delay value of the calibrated delay device 5 greater than 0 and less than T (T is the period of the signal from the output of the generator 9 shock excitation), on the screen of the electron-beam indicator aa 6 there is a variable component of the delayed calibrated delay device equal to 2T, 3T and so on. The accuracy of the settable delay values lying between these calibrated delay values is determined by the linearity of the delay device being calibrated 5.

Obtaining time stamps with a time interval between each other and a nano- and picosecond duration is difficult because it has to operate with a signal of a multiplier of the order of units and tens of GHz. Usually, electronic marks are obtained, followed by a repetition period of 10; 5 and less frequently 1 NS. The resulting discreteness of calibrated delay values is insufficient in many cases.

FIG. 2 shows how to divide the time interval between the calibrated delay values that follow the period T.

By changing the delay value of the first additional adjustable delay element 12, there is no variable component on the screen of the electron beam indicator 6. Set the scales of the delayed device TBa delay 5 and the second dO

additionally adjustable delay element 13 to the zero position, the first additional adjustable delay element 12 may not have a digital scale. By changing the delay of the calibrated delay device 5, the absence of a variable component on the screen of the electron-beam indicator 6 is again achieved. Thus, the value T of the calibrated mark is obtained.

To obtain the value of Tp / 2 to. the scale of the second additional adjustable delay element 13 is set to the value of the delay T {T is chosen to be approximately equal). Then, using the calibrated delay device 5, by reducing the value of its delay, again the absence of the variable on the indicator screen is obtained. The scale of the calibrated delay device is recorded, the scale of the calibrated delay device 5 is set to O, and the scale of the second additional adjustable delay element 13 is T. By changing the delay value of the first additional adjustable delay element 12, the variable components on the screen of the electron-beam injector 6 Then on the scale of the second additional adjustable delay element 13 is set to the value of O. The absence of a variable component on this wound indicator dobivayuts via calibrated delay devices 5, increasing the size of its delay and reading it written-Tg- value calibrated scale mark That / 2 is obtained as the

TO

The values of the other additional Kshibirovannye delay values, ... and so on receive similarly.

The positive effect is to improve the calibration accuracy of the continuously adjustable delay devices. The use of two additional smoothly controlled delays of a delay with the minimum possible electrical length equal to half the period of the following electronic marks and a certain sequence of operations with the ethnic elements of the delay allows to obtain a series of calibrated values with any desired step.

This device allows using simple means to calibrate smoothly adjusting delay devices when the obtained delay values are less than 1 ns.

Claims (1)

 1. USSR author's certificate tf 771585, cl. G001 KL 35/00, 09.01.79. That / b  : III J, - Tf 7J year lg /