SU86371A1 - Method for detecting ultramicroscopic cracks on smooth dielectric surfaces - Google Patents
Method for detecting ultramicroscopic cracks on smooth dielectric surfacesInfo
- Publication number
- SU86371A1 SU86371A1 SU408327A SU408327A SU86371A1 SU 86371 A1 SU86371 A1 SU 86371A1 SU 408327 A SU408327 A SU 408327A SU 408327 A SU408327 A SU 408327A SU 86371 A1 SU86371 A1 SU 86371A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- cracks
- detecting
- ultramicroscopic
- dielectric surfaces
- smooth dielectric
- Prior art date
Links
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- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
Вы илоние ультра.микроскоппчсскпх трещин па гладких поворхтгост х дпэлектрпкоп после пх пзготовлепп имеет весьма сущестиенное зпачение ввиду того, что с течеппелг времени необнаруженные трещины увеличиваютс п диэлектрик стапоштс непригодным, так как io мере роста трещин резко ухуд1наетс его качество (уменьшаетс механическа прочность, ухудп1аетс термическа стойкость и ;1лектрическ1ге характеристики диэлектриков).You have ultra.microscopic crack cracks on smooth turntables after the sweep of the cracks has a very substantial reason because of the fact that the undetected cracks increase over time and the sweep becomes unsuitable, because the sweep of the cracks has dramatically increased and the sweep of the cracks has increased, and the sweep of the cracks has increased, and since the cracks have dramatically deteriorated, the sweep of the cracks has increased, and the sweep of the cracks has increased. resistance and; electrical characteristics of dielectrics).
Известные в технике способы обна 5ужепи трепгин на поверхности дигулектри1х0г обладают малой чуистнпте.чьностыо п не дают 1голЬичНтельных результатов при исследовани1г диэлектрнков, поверхность -;оторых покрыта микрЬскоиическими трещиналпг.The methods known in the technique of detecting trepgs on the surface of dielectric have a small amount of information that do not give a single results when studying dielectrics, the surface is covered with microscopic cracks.
Отличительна особенность предложенпого способа обнаружени ультрамикросконпческнх трещин заключаетс в том, что чем меиыие п1ирииа трещин, телг более четко опп вы вл ютс .A distinctive feature of the method of detecting ultramicroscopic cracks is that the mea- sured cracks of cracks, talg more clearly, are revealed.
Сиособ оснонаи па ис1гользоваиии олектрического ггол , котормм облучаетс диллектрпк; нрп этом на 1юверхиост1г ди;1лектри1ча 7юзнтп ают электрические зар ды. Наличие мельчайпптх трещпп на иовермюсти ,диэлгктрика вызывает но15ынгенпе }1анр жеиностн электрического нол 1 зпие трещпп.The method is based on the use of the electric gland, which is irradiated by the electric package; This is the case of a super-iostate; 1 sets of electrical charges. The presence of the smallest crackles on the European religion, the dielectric causes a new sensation} 1rr of the design of the electric zero.
Если облучением диэлект1) п.лектрическилг полем па его иоворхност, i:a iecTrr тонкиГг слои по Ю1пка (окись бари , титана, магпи , циркоип , цинка и 7ф.), то после облучепп частицы порошка 11ерерас11редел ютс;г, наиболее густо поронюк 1)асиределитс трегцин, указыва те.м самым пх расиоложеиие и кон(1)игураки1 Таким образом, но скоплои ;) норонпха в различ1п.1х местах ноперхности д11:)лектр1Пха, отчетливо 1 диолгу пе1юоруженным . суд т о 1 ел 1чние и иаправленип .If the dielectric is irradiated electrically by the field of its ion orvortality, i: a iecTrr thin layers along the surface (barium oxide, titanium, muppi, zircoip, zinc, and 7f.), then after irradiation the powder particles are 11extracted; g, most densely poronyuk 1 ) asyreredits tregtsin, indicating those m the most n rasolozheiei and con (1) iguraki1 Thus, but scattered;) noronphus in various places on the surface d11:) electr1Pha, clearly 1 diolgu unarmed. Judges about 1 ate 1 points and a guide.
13замен порошка лгожет бдмть с усиехолг иримеггено электроизол циог ; ое асло. . трансформаторное. Наело облучетигп itoiii pxiiocTrr дпэле(;трика э. ектр |чес1чилг ио.лем масло располагаетс пад треп (11игми и И1де отчетливо 1 пдиых «гребие;.13 Replacement of powder lays bdmt with usiёholg irimegeno elektroizol tsiog; th aslo. . transformer Naeli irradiating itoiii pxiiocTrr dpéle (; trica e. Ches1chilg yo llem oil is located on the trepus (11gmi and I1de distinctly 1 nd diy rowing ;.
Л2 86371- 2 -Необходима напр женность элекгрического пол лежит в пределах 6-8 KB/CM. Дл созданп пол может быть нрименен посто нный и переменный ток, как промышленной, так н новышенной частоты.L2 86371- 2 -Equired electric field strength is in the range of 6-8 KB / CM. To create a floor can be applied constant and alternating current, as industrial, so high frequency.
Предмет изобретени Subject invention
Способ обнаружени улътрамнкросконнческпх трещнн на гладких поверхност х днэлектрпков, о т л ц ч а ю щ н и с тем, что на поверхность днолектрпка нанЪс т металлический норошок (окись барп , титана п др.) нли слой электроизол ционного масла (трансформаторного н др.), поело чего изделие помещают в неравномерное электрнчес1 -ое ноле с напр женностью в дпапазоне 5-8 кв/см.The method of detecting ultraconnected cracks on smooth surfaces of diaphragms, is about the fact that a metal powder (an oxide barp, titanium, etc.) or a layer of electrically insulating oil (transformer and other ), after which the product is placed in an uneven electrical field with a voltage in the range of 5-8 kV / cm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU408327A SU86371A1 (en) | 1949-12-07 | 1949-12-07 | Method for detecting ultramicroscopic cracks on smooth dielectric surfaces |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU408327A SU86371A1 (en) | 1949-12-07 | 1949-12-07 | Method for detecting ultramicroscopic cracks on smooth dielectric surfaces |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU86371A1 true SU86371A1 (en) | 1950-11-30 |
Family
ID=48258380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU408327A SU86371A1 (en) | 1949-12-07 | 1949-12-07 | Method for detecting ultramicroscopic cracks on smooth dielectric surfaces |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU86371A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5439715A (en) * | 1988-07-22 | 1995-08-08 | Canon Kabushiki Kaisha | Process and apparatus for microwave plasma chemical vapor deposition |
-
1949
- 1949-12-07 SU SU408327A patent/SU86371A1/en active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5439715A (en) * | 1988-07-22 | 1995-08-08 | Canon Kabushiki Kaisha | Process and apparatus for microwave plasma chemical vapor deposition |
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