SU788050A1 - Method of testing internal heat resistance of power semiconductor rectifier - Google Patents
Method of testing internal heat resistance of power semiconductor rectifier Download PDFInfo
- Publication number
- SU788050A1 SU788050A1 SU772511285A SU2511285A SU788050A1 SU 788050 A1 SU788050 A1 SU 788050A1 SU 772511285 A SU772511285 A SU 772511285A SU 2511285 A SU2511285 A SU 2511285A SU 788050 A1 SU788050 A1 SU 788050A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- power semiconductor
- heat resistance
- internal heat
- semiconductor rectifier
- testing internal
- Prior art date
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- Power Conversion In General (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
Сущность предлагаемого способа контрол внутреннего теплового сопротивлени силового полупроводникового вентил состоит в том, что при любых нагрузках в области допустимых в эксплуатации значений теплового сопротивлени температура гибкого силового вывода ниже температуры корпуса, а начина с некоторого критического значени теплового сопротивлени она становитс И остаетс выше температуры корпуса. Измер разность температур корпуса и гибког силового вывода в момент измеио;::1Я ее знака, фиксируют заданную допустимую величину теплового сопротивлени Способ может быть реализован с помощью стационарных автоматических устройств или с применением переносных диагностических установок.The essence of the proposed method of controlling the internal thermal resistance of a power semiconductor valve is that at any load in the region of allowable values of thermal resistance in operation, the temperature of the flexible power output is lower than the case temperature, and starting from some critical value of thermal resistance, it becomes AND remains above the case temperature. Measuring the temperature difference between the housing and the flexible power output at the time of measurement; :: 1 I of its sign, fix the specified allowable value of thermal resistance. The method can be implemented using stationary automatic devices or using portable diagnostic equipment.
Использование предлагаемого способа дозвол ет организовать посто нный или периодический контроль теплового состо ни вентилей эксплуатируемых преобразователей и обеспечить своевременную замену вентилей при ухудшении из внутреннего теплоотвода что способствует повышению надежности преобразователей и снижению трудозатрат на контроль состо ни вентилей.Using the proposed method allows one to organize permanent or periodic monitoring of the thermal state of the valves of the operated converters and to ensure timely replacement of the valves when the internal heat sink deteriorates, which contributes to increasing the reliability of the converters and reducing the labor costs for monitoring the state of the valves.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU772511285A SU788050A1 (en) | 1977-07-21 | 1977-07-21 | Method of testing internal heat resistance of power semiconductor rectifier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU772511285A SU788050A1 (en) | 1977-07-21 | 1977-07-21 | Method of testing internal heat resistance of power semiconductor rectifier |
Publications (1)
Publication Number | Publication Date |
---|---|
SU788050A1 true SU788050A1 (en) | 1980-12-15 |
Family
ID=20719496
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU772511285A SU788050A1 (en) | 1977-07-21 | 1977-07-21 | Method of testing internal heat resistance of power semiconductor rectifier |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU788050A1 (en) |
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1977
- 1977-07-21 SU SU772511285A patent/SU788050A1/en active
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