SU705391A1 - Device for selecting integrated circuits with identical parameters - Google Patents

Description

(54) DEVICE FOR SELECTING INTEGRAL SCHEMES

,:: DSSIDYONTIKRYMI PARAY; FRAME;

705391 To do this, in a known device for sampling integrated circuits with optical parameters, containing a horizontal sawtooth voltage generator and a vertical scanning sawtooth voltage generator, the first outputs of which are connected respectively to the first and second inputs of the deflection system of the kinescope, and the second outputs which are connected to the input Mii of the line and frame perturbation converters, respectively, the first outputs of which are connected respectively to the first and second inputs of the input signal generator, one of which is connected to the first input of the first of the monitored integrated circuits, the second and third inputs of which are connected to the second outputs of the corresponding line and frame perturbation converters., the illuminator, a comparison unit and a clock generator, the first and second outputs of the comparison unit are connected to the outputs of the first and second control circuits, respectively, the first, second and third inputs of which are combined respectively; the output of the comparison unit is connected to the first input of the form The backlight pulse ruler, the output of which is connected to the cathode of the kinescope, and the second input of the illumination pulse shaper is connected to the nepBijM output of the synchroimpulse generator, the second and third holes of which are connected respectively to the input-generators of the sawtooth voltage of horizontal and personnel 1; . : The drawing shows the structures on the electrical circuit of the device. The device contains a generator of sync pulses 1, a generator of sawtooth voltages of horizontal scanning 2, a generator of sawtooth voltages of personnel scanning 3, a pulse driver of the backlight 4, which contains a driver of damping pulses 5 and a beam former of the kB signal 7, a deflecting system of a kinescope 7, a kinescope 8, line perturbation converter 9, input signal generator 10, the first to the controlled integrated circuit 11 the second controlled integrated circuit 12, the personnel perturbation converter 13 and the comparison unit 14, U The device works as follows. The generator of sync pulses 1 starts the pulsed generator of the sweep voltage 2, the generator of the sawtooth voltage of frame scanning 3 and the driver of damping pulses 4, and closes the driver of the backfire of the horizontal and personnel sweeps. The signals from the horizontal sawtooth generator 2 are fed to the horizontal coil of the deflecting system of the kinescope 7. From the vertical scanning generator 3, signals are fed to the vertical coil of the deflection system of the kinescope 7, The horizontal sawtooth generator 2 controls the operation of the horizontal converter perturbations 9, which changes according to the continuous law during the time duration of the horizontal scanning signal, the parameters of the generator of the input signals 10 and the conditions of operation of the first and second components 11 and 12 compatible ICs, respectively. By changing the operating conditions of the integrated circuits 11 and 12, for example, a change in the bias voltage is meant. The sawtooth generator of the horizontal scanning frame 3 controls the operation of the perturbation converter 13, which continuously modifies the parameters of the input signal generator 10 and the operating condition of the first and second controlled integrated circuits 11 and 12 during the duration of the vertical scanning signal. 11. and 12 understand: for example, a change in the supply voltage, the magnitude of the input signals. The signals from the output of integrated circuits 11 and 12 are fed to a comparator unit 14, which provides for the separation of a difference signal between the first and second controlled integrated circuits 11 and 12, the differential signal is fed to the shaper signal 6, as a result of which a negative potential appears on its code , the value of which increases with increasing amplitude of the difference signal. Therefore, on the kinescope 8, the cathode of which is connected to the shaper of the luminous signal 6, the screen is illuminated in certain areas. The intensity of the luminescence depends on the magnitude of the negative potential at the output of the forma- rity-voltage signal 6. The sequence of operations for selecting integrated circuits with identical parameters for dynamic tests in the operating area of the integrated circuits is as follows. The line 9 and personnel 13 perturbation converters as well as the generator of input signals 10 specify the modes typical for the capacity of this type of intigral circuits. A preliminary controlled integrated circuit 11 is provided to the pre-one that satisfies the necessary requirements for the operability zone. The operator installs the first controlled circuit 11 in the appropriate block.

devices. With this, on the screen of the kinescope 8, the operating area of the integrated circuit 11 is observed, which can be quantified.

Then from the number of controlled

integrated circuits (from which it is necessary to select integrated circuits with identical parameters in the field of health, corresponding to the integrated circuit 11), the operator randomly selects the controlled integrated circuit 12 and inserts it into another block. It is exposed to the same factors as the first controlled circuit 11.:

The operator analyzes the resulting image on the screen of the kinescope 8. If both integrated circuits are completely identical, the screen is uniformly dark. If the parameters of the second integrated controlled 12 have a deviation from the first controlled integrated circuit 11 under dynamic conditions in the area of the operability zone, then a mismatch appears in the form of a luminescence, in size and luminescence intensity, judged by the degree of identity. Similarly, the selection of integrated circuits with identical parameters from the remaining integrated circuits, is performed.

If necessary, quantify the health of the controlled integrated circuit. 12, the latter is included in the first block instead of the first controlled integrated circuit 11.

The proposed device allows a significant increase in the performance and accuracy of selection of integrated circuits with identical parameters in the health zones.

Claims (2)

Invention Formula A device for selecting integrated circuits with identical parameters, containing a horizontal sawtooth voltage generator and a vertical scanning sawtooth voltage generator, the first outputs of which are connected respectively to the first and second inputs of the deflecting system of the kinescope, and the second outputs of which are connected to the inputs of the horizontal and personnel, respectively disturbance converters, the first outputs of which are connected respectively to the first and second inputs of the input signal generator, the output of which is connected to The first input of the first of the controlled integrated circuits, the second and third inputs of which are connected to the second outputs of the line and frame perturbation converters, respectively, the shaper of the illumination of the illumination; in order to reduce the monitoring time, A comparison unit and a clock generator are entered into it, the first and second inputs of the comparison unit being connected to the outputs of the first and second controlled integrated circuits, the first, second and third inputs of which are combined respectively. , the output of the comparator unit is connected to the first input of the light-emitting impulse shaper, the VEPSOD coTrc connection from the cathode of the kinescope, and the second input of the illumination shaper is connected to the first output of the sync pulse generator, the second and third outputs of which: o are connected respectively to the inputs of the saw-head generator and the corresponding output from the generator personnel raevetki. Sources of information taken into account in the examination 1, Author's Certificate of the USSR 436304, cl. G 01 R 31/28, 1972. 2. USSR author's certificate No. 555353, cl. G 01 R 31/28, 1975 (prototype).