SU647625A1 - Flip-flop dynamic parameter measuring arrangement - Google Patents

Description

(54) DEVICE FOR MEASURING DYNAMIC PARAMETERS OF TRIGGERS

Shaper 1 generates two pulses that are shifted relative to each other (Figs. 2 a, 6), and the first switch 2 distributes them between the corresponding inputs of trigger 3 for which you need to check the speed. The first impulse (Fig. 2a) switches the trigger 3, and the second impulse (Fig. 26) sets it to the initial state (Fig. 2, c, d). The threshold device 5 determines the voltage level over which the time is counted down. The impulse from the output of the device S (fig. 2 d) through the inverter 6 (or signal repeater 11) and the third switch 7 (fig, 2 e) to the .naefM post trigger circuit assembled on elements 8.9 and element eo-. Derzhki 10. Low potential from the output of the switch 7 yyyyrtyrubtye menTdsij YO-NE 8. To the inputs of the element YO-NOT

5 two high potentials are received (fig, 2g, i) and include egd.

; ; , ......

At the output of the element Y-HE 9 YO is a low potential (Fig. 2 h), which is fed to the second block VHBD Y-HE 8 and it holds it

6 the current state & current of the Vrømby p) asprostrayay: the potential of the JB delay element 10 (figure 2),

Nezavisy1 about from the signal on & s5s6de three. TieGo switch 7. Then low -. the tency is suppressed at the output of the element

I.:, ..-, - .-. -,.,. . , V -..-., .. ,, .... .., ™, -., ..,: a delay of 1 O turns off element 9 and its delay control allows the high potential to spread (Fig. 2 and h) When high output reaches the output of delay element 10, the release circuit returns to its original state. The same displacement (Fig. 2 and) starts the shaper 1 (Fig. 2 a) and the whole cycle repeats again. In the circuit, oscillations occur with a repetition period T, DEPENDING 5PCTM on the switching delay time of all elements of the device. If we exclude the test trigger 3 and switch the outputs of switches 2, and 4 accordingly, oscillations occur in the circuit with a period TQ depending on the delay time of all the elements of the device, with the exception of the test trigger.

Measuring with a frequency meter 12, the oscillation frequency in the first and second

In this case, it is easy to determine the trigger delay for the trigger being tested.

t- rV-f-fl about where fg and the oscillation frequency of the circuit.

The duration of the fronts is determined similarly, only the test trigger 3 is not excluded from the measuring circuit, and the oscillation frequencies of the circuit are measured at two threshold values of device 5, corresponding to the levels of edge counting.

Since the trigger scheme indicated is only low potential, to be able to measure

neither the negative delay C (Fig. 2g) and the positive t ° (Fig. 2c) of the fronts of the signals at the outputs of the trigger 3, an additional switch 7, H1tertor 6 and the signal repeater 11 are introduced into the device. When measuring the delay

negative front t at the output of the trigger 3 signal to the input element

AND-NE 8 comes through the repeater 11, and when measuring a positive front t ° cushion through an inverter 6. Applied in the device, the release circuit ensures independence of time and delay from the duration of the Immersion and high stability of the device and, therefore, high accuracy of measurements. The use of other well-known pulse delay circuits, such as a standby multivibrator, a blocking generator, fiction, etc., ensures stabili- ty. The cords are roughly worse, which significantly increases the measurement error.

F o rmu l invention

A device for measuring the dynamic parameters of triggers, containing a series-connected pulse shaper, a first switch, a test trigger and a second switch, as well as a frequency meter, the input of which is connected to the input of the pulse shaper, that, in order to improve measurement accuracy and simplify the measuring device, it is equipped with a third switch connected in series, two NAND elements, a delay element, the output of which is connected to.

to the impulse driver's input, and to the second input i Toporo saeMeHta NAND, as well as an inverter and repeater of signals, the outputs of which are connected to the inputs of the third switch and the inputs to the output of the threshold device, the second input of the first AND-NES element associated with the output second

element NAND, and the output of the threshold device - with the output of the second switch.

Sources of information taken into account in the examination

1. Technical conditions О, ЗО8.019 ТУ on the К1ТК551 microcircuit.