SU586317A1 - Moving conductor insulation-thickness monitor - Google Patents

Description

one

The invention relates to a measurement technique, relates to devices for controlling the thickness of an insulator and a conductor, and can be used to control the thickness and concentricity of an insulator in a wire during its application.

Devices are known for determining the eccentricity of the insulation sheath of a cable product containing ferrosonde and systems, oi1, uniwain1, and no insulation 1.

In such devices, a flux probe can be 6i, iTi, lippulisi G as one or more inductive coils, and the system, which isolates the insulation, is now in the form of a hard 11aravla, for example, irnmic.

The disadvantage of these devices lies in the fact that since donos and isolation geometry are much larger than tolerances on the geometry of a conductor, even with concentric isolation and irregularity, its form is rationalized with an offset from the axis of the detector, which leads to additional control .

Closest to the invention is a device comprising an optical system, a ferrosonde probe on which the optical system is installed, and a mechanism for aligning the axis of the optical system with the axis of the monitored conductor 2.

However, in this device the co-commissioning of the fluxgate provides a relatively low control accuracy.

The purpose of the invention is to increase the accuracy of the control.

For this, in the proposed device for controlling the insulation thickness of a moving nconductor, a ferrosonde is made in the form of an U-shaped core, the central core of which has a transverse air gap for spreading a monitored conductor with insulation p iyi longitudinal iipopcvTb, iij) ii iom part of the optical axis: in the longitudinal grooves and cut the air gap.

In addition, in order to increase the sensitivity, the longitudinal slit is made at an angle to the plane passing through the longitudinal axes of symmetry of the kerpoe of the fluxgate.

P1a of FIG. 1 schematically shows the proposed device; in fig. 2 is a section along A —A in FIG. one.

The device contains a groping insulation of the optical system I, mounted on a fluxgate 2, and the mechanism for aligning the axis 3 of the optical system with the axis of the conductor 4 (the mechanism for combining is not shown).

The flux probe is made in the form of an U-shaped core, the central core 5 of which has an air gap 6 for accommodating

conductor 4 with insulation 7 and a longitudinal slot 8 in which part 9 of the optical axis of the system is located, the optical axis of the system intersecting the transverse gap.

The central core slot is located symmetrically to axis 9 at an angle a to the plane 10 passing through the longitudinal symmetry axes of the keri. On the extreme cores of the U-shaped core are located the inductors 11 and 12, included in the scheme of the mechanism that combines the axis of the optical system With the axis of the conductor.

The device works as follows.

: The conductor 4, which moves in the air gap 6 of the central core, passes an electric current, as a result of which the conductor is formed a magnetic field.

If the conductor is located symmetrically to the axis of the central core, then in the coils And and 12 are induced equal EMF, and the mechanism of combining is fixed. When the conductor is displaced relative to the center core axis, the EMF in the coils 11 and 12 is violated, which sets the optical system in motion to align its axis with the axis of the conductor.

With a high frequency of vibration of the conductor, the axis of the optical system is located along the axis of oscillatory movements of the conductor.

The presence of an irresis in the central core makes it possible to combine the planes of the magnetic and optical systems of the device.

Along with this, the presence of a slot in the W-shaped core creates an additional air gap, thereby increasing the magnetic resistance of the circuit, which includes both extreme cores, and the electromotive flux of the indicated circuit decreases sharply, and therefore the ratio of the EMF in the coils 11 and 12 when the wire is displaced relative to the center core axis.

An increase in the sensitivity of the device is also achieved by arranging the slot 8 at an angle to the plane 10 passing through the longitudinal axes of the cores.

This is because when the conductor is displaced, the ratio of the magnetic resistances of the circuits formed by the central and corresponding extreme cores of the core changes more dramatically.

All this allows to reduce the cross section of the magnetic circuit and reduce the moment of inertia of the moving systems of the device.

Formula is invented and

Claims (2)

1. A device for controlling the insulation thickness of a moving nconductor, containing an optical system, a ferrosonde probe on which the optical system is attached, and a mechanism combining the axis of the optical system with the axis of the monitored conductor, distinguished by the fact that, in order to increase the control accuracy, the ferrosonde is made in the form of an U-shaped core, the central core of which has a transverse air gap and a longitudinal slit, while the part of the optical axis of the system is located in the longitudinal slotted and crosses the air gap. 2. The device according to claim 1, characterized by In order to increase the sensitivity, the longitudinal slit is made at an angle to the plane passing through the longitudinal axes of symmetry of the core of the fluxgate. Information sources, taken into account in the examination 1. Instrument for measuring the eccentricity of express information. “Testing and measuring equipment, 18, VINITI, 1969 M p. 7-8. 2. Author's certificate M 441597 -kl. H 01B 13/00, 1971. rf tB-,