SU578569A1 - Method of measuring temperature - Google Patents
Method of measuring temperatureInfo
- Publication number
- SU578569A1 SU578569A1 SU7602318305A SU2318305A SU578569A1 SU 578569 A1 SU578569 A1 SU 578569A1 SU 7602318305 A SU7602318305 A SU 7602318305A SU 2318305 A SU2318305 A SU 2318305A SU 578569 A1 SU578569 A1 SU 578569A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- measuring temperature
- temperature
- measuring
- photocurrent
- measurement
- Prior art date
Links
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
При удалении от точек «полного запирани фототока на величину даже долей наноампера точность измерени напр жени отсечки возрастает примерно в 5 раз. Измерение относительно больших токов частично запертого ФЭП исключает необходимость измер ть сигналы, сравнимые с шумами приемника , что увеличивает точность измерений и одновременно позвол ет предъ вл ть менее жесткие требовани к измерительной аппаратуре .With the distance from the complete locking point of the photocurrent by even the fractions of the nano ampere, the accuracy of measuring the cutoff voltage increases by about 5 times. Measurement of relatively large currents of a partially locked EEP eliminates the need to measure signals comparable to receiver noise, which increases the measurement accuracy and at the same time allows for less stringent requirements on the measuring equipment.
Измерение температуры по предлагаемому способу производитс следующим образом.Temperature measurement by the proposed method is performed as follows.
Уравн в предварительно световые потоки, подают на управл ющую сетку ФЭУ посто нное отрицательное смещение и, измер изменение фототока при разных температурах эталонного излучател , стро т градуировочную кривую зависимости фототока от температуры , с помощью которой затем определ ют температуру объекта.Equating to the pre-light fluxes, a constant negative bias is applied to the PMT control grid and, measuring the change in photocurrent at different temperatures of the reference emitter, a calibration curve of the photocurrent as a function of temperature is used, with which the temperature of the object is then determined.
4four
Claims (2)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU7602318305A SU578569A1 (en) | 1976-01-22 | 1976-01-22 | Method of measuring temperature |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU7602318305A SU578569A1 (en) | 1976-01-22 | 1976-01-22 | Method of measuring temperature |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU578569A1 true SU578569A1 (en) | 1977-10-30 |
Family
ID=20646907
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU7602318305A SU578569A1 (en) | 1976-01-22 | 1976-01-22 | Method of measuring temperature |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU578569A1 (en) |
-
1976
- 1976-01-22 SU SU7602318305A patent/SU578569A1/en active
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