SU570847A1 - Device for measuring power of first harmonic of ultrahigh frequency vibration - Google Patents
Device for measuring power of first harmonic of ultrahigh frequency vibrationInfo
- Publication number
- SU570847A1 SU570847A1 SU7402064065A SU2064065A SU570847A1 SU 570847 A1 SU570847 A1 SU 570847A1 SU 7402064065 A SU7402064065 A SU 7402064065A SU 2064065 A SU2064065 A SU 2064065A SU 570847 A1 SU570847 A1 SU 570847A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- harmonic
- frequency vibration
- ultrahigh frequency
- measuring power
- power
- Prior art date
Links
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- Testing Of Individual Semiconductor Devices (AREA)
Description
кремни , то при воздействии электрического сигнала, содержащего первую и вторую гармонические составл ющие Е и ES, на нем возникает в режиме холостого хода посто нна ЭДС и , величина которой св зана с амплитудами гармоник U - Pi-E, где PI и Р2 - мощности первой и второй гармоник . Вазимна фаза гармоник устанавливаетс так, чтобы ЭДС U была .максимальной.silicon, when exposed to an electrical signal containing the first and second harmonic components E and ES, a constant EMF arises at idle mode and the value of which is related to the amplitudes of the harmonics U is Pi-E, where PI and P2 are the powers first and second harmonics. The harmonic phase of the harmonics is set so that the emf U is maximal.
На другой полупроводниковый датчик 4 поступает чистый сигнал первой гармоники (втора гармоника фильтруетс ферритовой пластиной 2). На выходе полупроводникового датчика 4 возникает ЭДС U Е PI, котора фиксируетс индикатором мощности первой гармоники 7. Обработанные в схеме отнощений 5 сигналы с обоих полупроводниковых датчиков 3 и 4 содержат информацию о величине второй гармоники t/вых U/U EZ. Измерительный прибор 6, измер ющий мощность второй гармоники, обладает квадратичной амплитудной характеристикой , и его показани пропорциональны мощности второй гармоники.The other semiconductor sensor 4 receives a clean signal of the first harmonic (the second harmonic is filtered by the ferrite plate 2). At the output of the semiconductor sensor 4, an emf U U PI occurs, which is fixed by the first harmonic power indicator 7. The signals from both semiconductor sensors 3 and 4 processed in the ratio circuit 5 contain information about the second harmonic value t / out U / U EZ. Measuring instrument 6 measuring the power of the second harmonic has a quadratic amplitude characteristic, and its readings are proportional to the power of the second harmonic.
Таким образом, одновременно измер етс мощность первой и второй гармоник.Thus, the power of the first and second harmonics is measured simultaneously.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU7402064065A SU570847A1 (en) | 1974-09-24 | 1974-09-24 | Device for measuring power of first harmonic of ultrahigh frequency vibration |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU7402064065A SU570847A1 (en) | 1974-09-24 | 1974-09-24 | Device for measuring power of first harmonic of ultrahigh frequency vibration |
Publications (1)
Publication Number | Publication Date |
---|---|
SU570847A1 true SU570847A1 (en) | 1977-08-30 |
Family
ID=20597317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU7402064065A SU570847A1 (en) | 1974-09-24 | 1974-09-24 | Device for measuring power of first harmonic of ultrahigh frequency vibration |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU570847A1 (en) |
-
1974
- 1974-09-24 SU SU7402064065A patent/SU570847A1/en active
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