SU562756A2 - Дифференциальный рефрактометр - Google Patents

Дифференциальный рефрактометр

Info

Publication number
SU562756A2
SU562756A2 SU2138189A SU2138189A SU562756A2 SU 562756 A2 SU562756 A2 SU 562756A2 SU 2138189 A SU2138189 A SU 2138189A SU 2138189 A SU2138189 A SU 2138189A SU 562756 A2 SU562756 A2 SU 562756A2
Authority
SU
USSR - Soviet Union
Prior art keywords
differential refractometer
refractometer
differential
Prior art date
Application number
SU2138189A
Other languages
English (en)
Inventor
Юрий Александрович Степин
Галина Николаевна Мичурина
Original Assignee
Предприятие П/Я Р-6681
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Предприятие П/Я Р-6681 filed Critical Предприятие П/Я Р-6681
Priority to SU2138189A priority Critical patent/SU562756A2/ru
Application granted granted Critical
Publication of SU562756A2 publication Critical patent/SU562756A2/ru

Links

SU2138189A 1975-05-28 1975-05-28 Дифференциальный рефрактометр SU562756A2 (ru)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU2138189A SU562756A2 (ru) 1975-05-28 1975-05-28 Дифференциальный рефрактометр

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU2138189A SU562756A2 (ru) 1975-05-28 1975-05-28 Дифференциальный рефрактометр

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
SU292104 Addition

Publications (1)

Publication Number Publication Date
SU562756A2 true SU562756A2 (ru) 1977-06-25

Family

ID=20620690

Family Applications (1)

Application Number Title Priority Date Filing Date
SU2138189A SU562756A2 (ru) 1975-05-28 1975-05-28 Дифференциальный рефрактометр

Country Status (1)

Country Link
SU (1) SU562756A2 (ru)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0457843A1 (en) * 1989-02-09 1991-11-27 Interactive Video Systems Inc METHOD AND APPARATUS FOR MEASURING THE ALIGNMENT OF THE LAYER OVERLAY ON A SEMICONDUCTOR WAFER.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0457843A1 (en) * 1989-02-09 1991-11-27 Interactive Video Systems Inc METHOD AND APPARATUS FOR MEASURING THE ALIGNMENT OF THE LAYER OVERLAY ON A SEMICONDUCTOR WAFER.

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