SU494707A1 - Method for measuring nonlinearity coefficient of semiconductor conductivity - Google Patents
Method for measuring nonlinearity coefficient of semiconductor conductivityInfo
- Publication number
- SU494707A1 SU494707A1 SU1911206A SU1911206A SU494707A1 SU 494707 A1 SU494707 A1 SU 494707A1 SU 1911206 A SU1911206 A SU 1911206A SU 1911206 A SU1911206 A SU 1911206A SU 494707 A1 SU494707 A1 SU 494707A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- nonlinearity coefficient
- semiconductor conductivity
- measuring
- measuring nonlinearity
- power
- Prior art date
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
1one
Изобретение относитс к изыерителной технике и ыожет быть использовано дл исследовани изменени электропроводности в высокочастотном (ВЧ) поле как полупроводников, так и других материалов .The invention relates to iron technology and can be used to study changes in electrical conductivity in the high frequency (HF) field of both semiconductors and other materials.
Известные способы измерени коэффициента нелинейности ВЧ-поле неудобны тем, что необходимо измер ть характеристики распростран ющегос в тракте ВЧ-сигнала.The known methods for measuring the nonlinearity coefficient of the RF field are inconvenient because it is necessary to measure the characteristics of the RF signal propagating in the path.
Известен способ, при котором измерение Вдфф основано на. эффекте смешивани гармоник, и поэтому нет необходимости измер ть характеристики распростран ющегос в тракте ВЧ-сигнала. Предполагаетс , что не зависит от частоты, а это дл каждого материала справедливо только в определенном инIтервале частот ВЧ-пол ,There is a method in which the Vdff measurement is based on. harmonic mixing effect, and therefore it is not necessary to measure the characteristics of the RF signal propagating in the path. It is assumed that the frequency does not depend on the frequency, and this for each material is valid only in a certain frequency range of the RF field,
Известен способ измерени Вдфф по изменению посто нного тока, текущего через образец, в амплитудно-модулированном ВУ-поле, дл осуществлени которого необходимо, во-первых, измерить изменение посто нного тока, текущего через образец, при поступлении в тракт ВЧ-сигнала и, вто вторых, определить долю мощности РПОГЛ поглощенную образцом . Дл определени PJJQJ, следует измерить мощность, поступающую на образец , мощность, отраженную от образца, и мощность, проход щую в тракт за образцом . Поглощенна мощность определ етс как разность измеренных величин, поэтому погрешность определени увеличиваетс . С другой стороны, аппаратура , предназначенна дл измерени импульсной мощности ВЧ-пол ,малоста|бильна , ее точность во многих случа хThere is a known method for measuring Vdff by changing the direct current flowing through the sample in an amplitude-modulated WU-field, to accomplish which it is necessary, first, to measure the change in direct current flowing through the sample when an RF signal enters the path and second, to determine the fraction of the power of the RPGL absorbed by the sample. To determine the PJJQJ, one should measure the power delivered to the sample, the power reflected from the sample, and the power passing to the path behind the sample. Absorbed power is defined as the difference between the measured values, so the error in determination is increased. On the other hand, the equipment designed to measure the RF power of a pulsed power is low-cost, its accuracy in many cases
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU1911206A SU494707A1 (en) | 1973-04-27 | 1973-04-27 | Method for measuring nonlinearity coefficient of semiconductor conductivity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU1911206A SU494707A1 (en) | 1973-04-27 | 1973-04-27 | Method for measuring nonlinearity coefficient of semiconductor conductivity |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU494707A1 true SU494707A1 (en) | 1975-12-05 |
Family
ID=20550540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU1911206A SU494707A1 (en) | 1973-04-27 | 1973-04-27 | Method for measuring nonlinearity coefficient of semiconductor conductivity |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU494707A1 (en) |
-
1973
- 1973-04-27 SU SU1911206A patent/SU494707A1/en active
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