SU493028A1 - Electronic test relay - Google Patents

Description

(54) ELECTRONIC TRIAL RELAY

In addition, various dividing voltages along the level relative to the input are involved in the trial.

The shoulder, consisting of transistors 3, 4, is designed for testing circuits with a positive potential relative to the power source connected to the emitters of these transistors. In series, a stabilizing resistor G is connected.

11. In the base circuit of transistor 4 on-.

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The resistor 12, which functions as an analogous resistor 8, resistors 13 and 14, connected between the minus power supply and the bases of transistors 3 and 4, performs two main functions: at 15 moment voltage dividers with different potentials relative to the input and provide reliable operation of transistors 3 and 4. In addition, diodes 15 and 16 are included in the conducting direction between the bases and emitters to ensure reliable operation of these transistors 20. Thus, when current flows through diodes 15 and 10 at the bases of transistors 3 and 4, there is always a negative voltage relative to the emitter voltage. The voltage drop of the base voltage is determined by the voltage drop across the diodes 1Г, 10 and is usually O, 5-O, 7, which ensures reliable locking of the transistors 3, 90 4 in the initial state.

Between the bases of the transistors of both shoulders, a diode divider is connected on diodes 17 and 18, the midpoint of which is the input of the test relay. Such an inclusion of del-M bodies provides a logical connection between both arms, and also allows the formation of various voltage dividers in terms of level relative to the input both in the working and non-working state.

The collectors of transistors 1-4 are the outputs of an electronic pin relay and can be used individually (four outputs) or by combination. these are in different kambinash1 x (24 combination). In the inclusion in the shoulder of another third transistor with two stabilizers MMI. the number of combinations increases accordingly.

The device works as follows. In the initial state, the transistors 1-4 are both closed, and at the output (point 19) there is a voltage depending on the ratio of the divider arms, formed by resistors 8 and 9 and 12, 14.

When connecting to the resistance input, a test circuit, the other end of which is connected to the minus of the power source, the voltage at the input (point 19) is redistributed, because the ratio between

and shoulders divider. Depending on the magnitude of the resistance of the opaque circuit, the opening of the transistor 1 or of both transistors 1.2 of a shoulder occurs. By selecting the appropriate type of Zener 5 or by sequentially turning on several Zener diodes, various thresholds of the transistor can be obtained.

When the other end of the resistance of the test circuit is connected to ground or to the power supply pole, the input voltage is also redistributed and the corresponding transistors 3 and 4 of the other terminal are operating. By selecting the type of stabilitron 6 or their number one can get various thresholds of operation of transistors 3 and 4, i.e. Determine the different resistance values of the test nebi, as well as its potential.

The use of bias voltage in the emitter circuits of the transistors of both arms also allows the circuit to be changed.

The presence at the input of the circuit of a continuously acting voltage created by the divider ensures high speed when testing the tested circuit. Practically, the speed is determined by the switching time of the transistor and the Zener diode. Building a test relay in the form of two arms on transistors of different conductivity allows, without additional operations, to proceed to testing circuits with negative and positive potentials. The use of a diode divider, including the one between the shoulders, provides, with a smaller number of elements (as compared to the prototype), a clear difference in the large number of states of the test circuit. In addition, in the proposed test relay, it is possible to test a large number of circuit conditions by including additional telescopes in the appropriate shoulders.

PRE THERE OF THE INVENTION

An electronic test relay containing the main transistors of different conductivity, to the bases of which the zener diodes are connected in the direction opposite to that of their conductivity, characterized in that, in order to increase speed and enhancement of functionality, two additional transistors of different conductivity, emitters of which are connected to emitters of the respective main transistors, and the bases through the resistors and diodes are connected to the input busbar.

the bases of the main and additional transistors of the same conductivity are connected via diodes to emitters of ethin transistors and through resistors with a minus power source, and the bases of the main and auxiliary ones). .

Transistors of a different conductivity than the resistors are connected to emitters of these transistors and a positive power source, and the collectors of all transistors are the outputs of an electronic test relay.

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