SU475529A1 - Ultrasonic method for measuring the thickness of materials - Google Patents
Ultrasonic method for measuring the thickness of materialsInfo
- Publication number
- SU475529A1 SU475529A1 SU1042753A SU1042753A SU475529A1 SU 475529 A1 SU475529 A1 SU 475529A1 SU 1042753 A SU1042753 A SU 1042753A SU 1042753 A SU1042753 A SU 1042753A SU 475529 A1 SU475529 A1 SU 475529A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- thickness
- materials
- measuring
- ultrasonic method
- frequency
- Prior art date
Links
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Description
1one
Изобретение относитс к измерению толщины материалов ультразвуком при одностороннем к ним доступе. Данный способ может быть применен в нромышленности но переработке пластмасс, в черной и цветной металлургии , а также в других област х народного хоз йства.The invention relates to the measurement of the thickness of materials by ultrasound with one-way access to them. This method can be applied in the industry of plastics processing, in ferrous and nonferrous metallurgy, as well as in other areas of the national economy.
Известны ультразвуковые способы измерени толщины материалов, основанные на отражении колебаний от двух поверхностей исследуемого объекта.Ultrasonic methods for measuring the thickness of materials are known, based on the reflection of vibrations from two surfaces of the object under study.
Описываемый способ позвол ет повысить разрещаю.щую способность и точность измерений . Отличаетс он тем, что ультразвуковые колебани линейно модулируют но частоте, выдел ют синусоидальную огибающую электрических колебаний прин тых отраженных сигналов и измер ют ее частоту, но которой суд т о толщиие контролируемого материала.The described method allows to increase the resolution and accuracy of measurements. It differs in that the ultrasonic oscillations linearly modulate the frequency, isolate the sinusoidal envelope of the electrical oscillations of the received reflected signals, and measure its frequency, but which is judged on the thickness of the material being monitored.
Сущность описывае.мого способа заключаетс в том, что измер емый объект облучают ультразвуковыми колебани ми, линейно промодулированными но частоте. Эти колебани отралчаютс от наружной и внутренней поверхностей объекта и воздействуют на прнемное устройство. Линейна модул ци по частоте и совместное воздействие отраженных колебаний на приемник приводит к образованию синусоидальной по форме огибающей электрическнх колебаний, частота которых находитс в обратной пронорцноналыюй зависимости от то.ицпны контролируемого материала .The essence of the described method is that the object to be measured is irradiated with ultrasonic vibrations linearly modulated at a frequency. These vibrations are distant from the outer and inner surfaces of the object and act on the extension device. Linear frequency modulation and the combined effect of reflected oscillations on the receiver leads to the formation of a sinusoidal envelope of electrical oscillations, whose frequency is in inverse pronounced dependence on the intensity of the material being monitored.
И р е д м е т изобретени And the invention
льтразвуковой способ измереии толщпны материалов, нанример пластмасс, основанный на отражении колебаний от двух поверхностей контролируемого объекта, отличающ и 11 с тем, что, с нелью увеличени разрещаюн1ей способиости и точности измерени , выдел ют синусоидальную огибающую электрических колебаний нрин тых отраженных сигналов и измер ют ее частоту, но которой суд т о толщнне контролируемого объекта.An ultrasonic method for measuring thick materials, such as plastics, based on the reflection of oscillations from two surfaces of the object being monitored, is distinguished by the fact that, with the aim of increasing the resolution and measuring accuracy, the sinusoidal envelope of the electrical oscillations of the reflected signals is measured and measured frequency, but which is judged on the thickness of the controlled object.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU1042753A SU475529A1 (en) | 1965-12-11 | 1965-12-11 | Ultrasonic method for measuring the thickness of materials |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SU1042753A SU475529A1 (en) | 1965-12-11 | 1965-12-11 | Ultrasonic method for measuring the thickness of materials |
Publications (1)
Publication Number | Publication Date |
---|---|
SU475529A1 true SU475529A1 (en) | 1975-06-30 |
Family
ID=20438902
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SU1042753A SU475529A1 (en) | 1965-12-11 | 1965-12-11 | Ultrasonic method for measuring the thickness of materials |
Country Status (1)
Country | Link |
---|---|
SU (1) | SU475529A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112344888A (en) * | 2020-10-23 | 2021-02-09 | 华南理工大学 | Ultrasonic thickness measuring method based on LFM signal cross-correlation phase characteristics |
-
1965
- 1965-12-11 SU SU1042753A patent/SU475529A1/en active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112344888A (en) * | 2020-10-23 | 2021-02-09 | 华南理工大学 | Ultrasonic thickness measuring method based on LFM signal cross-correlation phase characteristics |
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