SU430313A2 - Рентгеновский микроанализатор - Google Patents

Рентгеновский микроанализатор

Info

Publication number
SU430313A2
SU430313A2 SU1328355A SU1328355A SU430313A2 SU 430313 A2 SU430313 A2 SU 430313A2 SU 1328355 A SU1328355 A SU 1328355A SU 1328355 A SU1328355 A SU 1328355A SU 430313 A2 SU430313 A2 SU 430313A2
Authority
SU
USSR - Soviet Union
Prior art keywords
micro analyzer
ray micro
ray
analyzer
micro
Prior art date
Application number
SU1328355A
Other languages
English (en)
Other versions
SU430313A1 (ru
Original Assignee
И. Б. Боровский
А. И. Козленков
В. Г. Богданов Институт металлургии А. А. Байкова
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by И. Б. Боровский, А. И. Козленков, В. Г. Богданов Институт металлургии А. А. Байкова filed Critical И. Б. Боровский
Priority to SU1328355A priority Critical patent/SU430313A2/ru
Priority to FR7020499A priority patent/FR2049906A5/fr
Priority to GB27936/70A priority patent/GB1273912A/en
Priority to US00274292A priority patent/US3775611A/en
Application granted granted Critical
Publication of SU430313A1 publication Critical patent/SU430313A1/ru
Publication of SU430313A2 publication Critical patent/SU430313A2/ru

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SU1328355A 1969-06-09 1969-06-09 Рентгеновский микроанализатор SU430313A2 (ru)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SU1328355A SU430313A2 (ru) 1969-06-09 1969-06-09 Рентгеновский микроанализатор
FR7020499A FR2049906A5 (ru) 1969-06-09 1970-06-04
GB27936/70A GB1273912A (en) 1969-06-09 1970-06-09 Spectral analysis of specimens containing light-weight elements
US00274292A US3775611A (en) 1969-06-09 1972-07-24 Apparatus for spectral analysis of specimens containing light-weight elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU1328355A SU430313A2 (ru) 1969-06-09 1969-06-09 Рентгеновский микроанализатор

Publications (2)

Publication Number Publication Date
SU430313A1 SU430313A1 (ru) 1974-05-30
SU430313A2 true SU430313A2 (ru) 1974-05-30

Family

ID=20445671

Family Applications (1)

Application Number Title Priority Date Filing Date
SU1328355A SU430313A2 (ru) 1969-06-09 1969-06-09 Рентгеновский микроанализатор

Country Status (4)

Country Link
US (1) US3775611A (ru)
FR (1) FR2049906A5 (ru)
GB (1) GB1273912A (ru)
SU (1) SU430313A2 (ru)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1049927A2 (en) * 1998-11-25 2000-11-08 PANalytical B.V. X-ray analysis apparatus including a parabolic x-ray mirror and a crystal monochromator
US7481544B2 (en) * 2004-03-05 2009-01-27 Optical Research Associates Grazing incidence relays
JP5235447B2 (ja) * 2008-02-22 2013-07-10 株式会社日立ハイテクサイエンス Ｘ線分析装置及びｘ線分析方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2653249A (en) * 1950-11-30 1953-09-22 Gen Electric System and apparatus for the formation of optical images
US2945953A (en) * 1957-03-19 1960-07-19 Parsons & Co Sir Howard G Grating spectrometers
US3160749A (en) * 1962-10-19 1964-12-08 Philips Corp Spectrometer with novel plural crystal arrangement
US3471694A (en) * 1965-03-01 1969-10-07 Philips Electronics & Pharm In Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam

Also Published As

Publication number Publication date
US3775611A (en) 1973-11-27
FR2049906A5 (ru) 1971-03-26
GB1273912A (en) 1972-05-10

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