SU382977A1 - RANGE OF FREQUENCY CHARACTERISTICS - Google Patents

Description

one

The invention can find irimea in measuring the frequency characteristics of various first objects with geographically dispersed points of reception and transmission, as well as quadrupoles with lumped parameters (filters, phase circuits, etc.).

Frequency characteristics are measured as a rule by nodachn to the input of the test object under test, generated in the transmitting clock by a frequency response meter (ICH) by a sweep frequency generator (GCH) and observing at the output of the panoramic image object of the studied characteristic on the screen of the electron beam indicator (ELI) iri.emnoy part of the IFHH. In this case, it is necessary to measure both the current values of the frequency at the characteristic points of the studied characteristics and the frequencies of the limits of the swing range. Known HFC. in which these measurements are carried out but calibrated frequency axis of the ELI scale or by means of an electronic frequency counter. However, the known PChs do not provide high accuracy and automation of measurements of the boundaries of the swing band and the current values of the frequency of the test signal at the receiving point for geographically separated input and output of the object (for example, communication lines). In addition, when using the test signal with additional frequency shift keying

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at a frequency many times over the frequency of the rolling frequency, in which parts of the signal of a swinging frequency alternate with sections of a constant frequency (the so-called

comparison), it is not possible at all to implement the deadlines without receiving a set reference frequency from the transfer point.

The aim of the invention is to develop

accuracy and automation of border boundaries

sweep bands and current frequency values

test sigial nri geographically

spaced transmission and reception points.

To do this, in the proposed IHC introduced

nanometer comparator, pulse shaping unit, the time and range of which coincides with the changes in the swing direction of the test signal, the mode switch

values of the frequency or automatic measurement of the boundaries of the sweep band, a pulse shaper, a source of adjustable constant voltage, the ESCh trigger input and the channel input of the ELI frequency tag are connected to the corresponding pulse generator outputs, the input of which is connected via a switch to the input of the voltage multiplier and c the output of the pulse shaping unit, the first input of the combiner is connected

An adjustable constant voltage source, and the second input and the input of the forming device H1 of the pulses are connected to the input of the horizontal sweep ELI.

The input of the imager is connected to the switch via a temporary selector, to the control input of which from the output of the measuring receiver there are implants of impulses with the frequency of the menialation. This provides an opportunity to measure the frequency characteristics at the use of a test signal with additional frequency signal.

FIG. 1 is a block diagram of the proposed IChH; in fig. 2 - time diagrams of voltages.

There is a generator / shaking frequency (") on the non-intrusive burner, from which the test signal is sent to the Exit of the object under study 2. On its side, the test signal from the object goes to the input of the receiver 3, which performs the necessary processing of the test signal and extracts from it information about the frequency response of the object under study. From the output of the receiver, the increments of which are proportional to the uneven frequency characteristics of the object are fed to the input of the vertical path of the electron-beam indicator (ELI) 4, the horizontal sweep of the ELI is performed by a voltage of a nil-shape, which is produced by the receiver, and the extreme points of this voltage correspond to maximum and maximum frequencies of the incoming test signal receiver. Thus, a nanoscale image of the frequency response of the object under study is created on the ELI screen. The sawtooth voltage is also fed to the input of the voltage comparator 5 and the pulse shaping unit 6. The node, by the action of a sawtooth pattern, the formation unit generates pulses in which their temporal position corresponds to the moments of bending of the horizontal sweep voltage of the ELI, i.e., to the moments of the maximum and maximum values of the test sig frequency.

In the mode of automatic measurement of the limits of the sweep frequency band of the test signal, the pulses from the output of the formation unit through the switch 7 are fed to the pulse shaper 6, generating impulses r fed to the electron counting meter (ESCh) 9. The input of the ESCH receives the amplified test signal from one of the receiver outputs. P1 pulses trigger an ESCh at the moments of the minimum and maximum frequency of the test signal. The ESCP measures the frequency for a short time interval, and the measurement result is kept on its board until the next scoring pulse arrives, so that during the forward course of the EL sweep, the frequency of the lower border of the sweep band is found and, during the reverse run of the sweep, the upper edge i.e., automatic measurement of the limits of the i-frequency band of the test signal is provided. In the mode of measuring the current values of the frequency, the input of the pulse generator via the switch 7 is connected to the output of the comparator 5, to the second input of which the voltage of the comparison (shown in Fig. 26 by the dash line) is supplied from the source 10 of the adjustable static voltage. Comparator 5 is triggered by the momentum of the evaporations fed to its inputs, thus forming impulses d at the output, the temporary operating power of which depends on the sawtooth signal UQ. The positive pulse front causes the imprinter of 8 impulses to be produced. The shaper, in this case, generates pulses g and e, which are added, respectively, to start the ESCH and the ELI input to form an image of the frequency of the label. By changing the size of the compressed mode, you can set the frequency marker to any part of the image of the frequency response under study. An iodine pulse with a frequency meter during a short time interval will measure the current frequency of the test signal, and the measurement result will be displayed on the ESCH board before the next kmn pulse, i.e., almost during the sweep period.

When using the test signal with an additional frequency maiupul ciel to provide an ESNC trigger in the wobble zones, frequency frequencies or comparison frequency zones between the non-switch 7 and the imaging unit 8, the time selector I is entered finally, which causes synchronization of the ESNF trigger and the formation of a frequency tag with the pulse frequency fronts gs taken from the corresponding output of the receiver 3. In the frequency response using the method of frequency maniulyatsii, receiving these signals is always guaranteed at the point of reception This is done by appropriate processing of the test signal, since the lacTOTbi control pulses are used in them to temporarily select signal sections of the sweeping frequency and the comparison frequency and to obtain information about the non-uniformity of the frequency characteristics under study.

The selector 11 can be executed, in particular, in the form of a trigger with separate inputs, one of which receives pulses from switch 7, for example, pulses e, and the second - pulses of manipulation frequency. By this effect, a pulse d is formed at the trigger output, which decouples the temporal position of the pulses r and e at the beginning of the sweeping frequency sections or the frequency sections of the comparison, depending on the polarity of the manipulation frequency pulses applied to the trigger. Duration of measurement time

The ESCH when using a frequency-manipulated signal must be shorter than the duration of the half of the period of the pulses of the manipulation frequency.

When fed from switch 7 to the selector pulses input d, automatic measurement of the current values of the test signal frequency is provided, and when b impulses are applied, automatic measurement of the edges of the swing band is provided.

Subject invention

Claims (2)

1. Frequency response meter, containing on the transmitter side a oscillating frequency generator, and on the receiver side an electron-beam indicator (ELI), an electron-counting frequency meter (ESCh) and a measuring receiver, the outputs of which are connected to the ESCH input and the ELI horizontal and vertical inputs, different by the fact that, in order to increase the accuracy and automate the measurements of the edges of the swing band and the current values of the frequency of the test signal at geographically separated transmission and reception points, mnarator voltage node for.mirovanich pulses whose temporal position coincides with the moments of change in the direction of swing of the frequency of the test signal, the current measurement mode switch values of the frequency or automatic measurement of the edges of the sweep band, pulse shaper, adjustable constant voltage source, with the start of the ESCh trigger) i rokha channel of the ELI frequency tag are connected to the corresponding outputs of the pulse shaper, whose input is connected through a switch to the voltage comparator input and to the output the knot forming unit, the first input of the comparator is connected to a source of adjustable constant voltage, and the second input and the input of the knot forming unit are connected to the input of the mountains isontal sweep ELI. 2. The device according to claim 1, characterized in that, in order to enable measurement of the frequency characteristics when using a test signal with additional frequency manipulation, the input of the generator of pulses is connected to the switch via a temporary selector, the control input of which is supplied from the measuring receiver impulses with frequency of manipulation. Leading eld1; icening side c ie; g Direct my move. Reverse Jii t d R I r