SU189091A1 - - Google Patents

Description

Devices for testing the reliability of contact relays are known, comprising a pulse generator, a time delay device, OR diode circuits controlling the operation of a sensing element common to all tested relays, the output of which is included in the signaling circuit.

In the proposed device, in order to increase the reliability of monitoring of the pulse generator output, the blocking relay is turned on, and the sensitive element consists of a sticking and non-closing relay.

To ensure the fixation of short-term sticking in series with the tested contacts through the additional diode circuit OR and the contact of the sensing element, the windings of additional relays are connected, the contacts of which shunt the failed test contact with sticking failures.

The drawing shows the electrical circuit of the proposed device.

The circuit is connected to a source of direct current with the help of a key K and contains a generator of GI pulses, designed to supply rectangular pulses of direct current to the winding of the blocking relay RB. Impulses can be obtained, for example, by means of a contact pair, mechanically closed and openable at a certain frequency depending on the response time of the tested 1IR, 2IR, ..., PIR relays.

The blocking relay RB is used to supply power to the windings of the tested 1IP, 2IR, ..., PIR relays through the RB1 – RB2 contact, and the RP delay relay and the SI pulse counter via the REZ – RB4 contact. In addition, through the contacts of the relay RB1-RB2, RBZ-RB4, RB2-

RB5, RB4-RB6 and through the contacts of the relay Р31-Р32, РЗЗ-Р34, Р35-Р36, Р37-Р38 to the power source at certain intervals connect the sensitive element that reacts to failures in

the work of the contacts of the tested relays and made in the form of a relay not closing the closing contacts of the PH, a relay of the disconnection of the disconnecting contacts of the RNb, a relay sticking to the closing contacts of the relay, and the relay closing,

p; and RZb break contacts. The relays RNa, RNb, RZa and RZb are intended for fixing the corresponding failures in the contacts of the tested relays and switching the relay of the pulse counter CI of the relay and the signaling circuit at fault.

For fixing the contact failures of the tested relays of the “sticking” type including short-term failures, the JPa, 2Pa, ..., PRA and 1Rb, 2Rb, ..., PRB relays are used.

GO or several make contacts of the tested relays are connected via the relay RZa-P3a2 of the relay RZa to the minus of the current source.

At the same time, the corresponding contact of 1Pa, 2Pa, ..., PRA relay is connected to the positive of the current source through the stuck test contact, which causes its operation. The relay that has tripped by its closing contact shunts the failed test contact, blocks the relay and its winding.

Relays 1Рб, 2Рб, ..., ПРб when one or several disconnection contacts of sticking relays stick, they are connected via contact P361-P362 of relay RZb to the minus of the current source. At the same time, the corresponding contact of 1Rb, 2Rb, ..., pRb is connected to the plus of the current source through the stuck test contact, which causes it to trip. The relay that has tripped by its closing contact shunts the failed test contact, blocks the relay and its winding. The device uses 6 diode circuits - OR through circuits on diodes ДД, Д-2, ... Дп and Д1, Д2, ..., Дn are formed circuits for actuation of the relay РНа and РНб, respectively, when contact type relays fail. "Non-closing, through the diode, D2, ..., D / D2, ..., Dp circuits, circuits are formed to trigger the RZa and RZb relays, respectively, when the contacts of the test relays of the sticking type fail. Via diagrams

P1b

dakh D /, D21, ..., Dp

D1

D., ..., circuits are formed to operate corresponding to the number and type of the failed test subject, a JPa, 2Pa, ..., PRA and 1Rb, 2Rb, ..., PRB relay when the contact type of the sticking relays fails. The alarm circuit consists of two 1L and 2L lamps, common to all tested relays, and L, L, L °, L, L, ..., L lamps connected in

circuit of each of the closing or opening contacts. The 1L light bulb illuminates when the non-closing of the closing or sticking of the opening contacts of the tested relays is false. The 2L light bulb illuminates when the closing or false non-closing of the opening contacts of the tested relays stick. In addition, either an L light bulb or a 2L light bulb may be lit depending on the state of the tested relays in the event of a failure of the tee. The L, ..., L1, L °, L1, ..., L1 lamps are designed to indicate the contact status of the tested relays. For this purpose, incandescent bulbs can be used in most cases. When switching the tested contacts of low power levels, it can be recommended to include light diodes with ballast resistance as light indicators. Bulbs L, L1, ... L-, L L1. -. L1 MOL4NO also connect to test contacts only in case of failure through the non-sticking and sticking relay contacts (on the lamp circuit, they are connected directly in parallel to the loads of test contacts Rнl,, ..., Kn1, Kn2, ..., Knp). A diode D was inserted in the circuit, designed to prevent the 1L lamp from lighting up when pulses are applied to the winding of the RB relay. At the same time, through the diode D and the contacts RZB2-RZbZ relay RZb and PHa1 - PHA2 relay PHA or through the diode D and contact P361 - P362 the relay RZb is connected to the positive power source of the relay RB through the circuit, bypassing the pulse generator and the resulting PHA relay or РЗб, corresponding to a false connection of the closing or sticking of the disconnecting contacts of the tested relays. A pulse counter is used to count the number of cycles of operation of the tested relays and to fix the numbers of the cycles in which there were failures of the switches.

Resistance P is connected to adjust the current in the windings of test relays having contacts 1, 2, ..., n (in general, switching contacts). For convenience of operation of the device, flush switches W, 2П, ... ПП in 4 positions and 2 directions are introduced into the circuit, which allow to include or exclude from the tests one or several test contacts of any of three types: make, break or changeover. The switches have 4 positions. In the position / closes contacts P - P5 and P6 - PN. In this case, the corresponding test coactant is excluded from the tests. In the // position, contacts P1 - P4 and P6 - P9 close. The position of the // switches corresponds to the inclusion in the test circuit of the closing test contact (elements with the index "and"). In the /// position, contacts P1 - PZ and P6 - P8 are closed. The position of /// non-switches corresponds to the inclusion in the scheme of testing the disconnecting test contact (elements with index “b”).

In position IV, contacts P1-P2 - P4 and P6 - P7 - P8 are closed. Position IV of the switch corresponds to the inclusion in the test circuit of a switching test contact (elements with indices a and b). In general, switching contacts are tested for which the following conditions are possible:

Claims (2)

1) the absence of failures; 2} the presence of failures (sticking of the opening contact, closing of the closing contact, non-closing of the opening contact, sticking of the closing contact and closing of all three contacts of the “tee” type. go through the contacts RZaZ - Р3а4 relay РЗп and contacts РН61 - РН62 relay РНб direct current pulses, produced by the generator of impulses GI. When the relay RB is triggered, pulses are applied to the windings of the tested relay and relay RZ. In this case, the tested relays and relay RZ, and the pulse counter counts the next pulse. After the RB and RZ relay has been activated, the PHA relay is connected to the positive source, and the RZ relay of the RZB relay is connected to the minus of the source via the P35 contacts. If there are no failures when the relay RB is triggered, the PH relay is shifted by the closing contacts, and the RZb relay circuit is broken by the opening contacts of the tested relays. Therefore, the relay PH and RZb do not work. With a de-energized relay RB release the test relays and relay RZ. At the same time, the RNb relay is connected to the plus of the source, and the RZa relay is connected to the minus of the source through the contacts P37 - P38 of the relay RZ. However, at this time, in the absence of failures, the RNb relays are plunted by the opening coitacts, and on the day of the relay, the relay is broken by the closing contacts of the tested relays. Therefore, relay RNb and RZa do not work. In all cases, the relay RZ provides a delay in switching the windings of the relay RNa, RNb, RZa and RZb in relation to the switching windings of the tested relays, which eliminates false positives of the sensitive element due to the timeliness of the tested contacts. On subsequent pulses, the operation of the circuit is repeated. U7, L, .. bulbs, L p L, L, ... L | will be periodically turned on and off, signaling the normal operation of the contacts. Failure of Tina “non-closing of the closing contact SLI“ sticking of the opening contact occurs when the relay RB is activated. At the same time through the corresponding diodes D Ppata "t ,, then PIPSPS L 2 -, D„ or L1. // 2 n triggers relay PHA or RZb. As a result, the SI counter circuit is cut off, the 1L light turns on, and it receives a constant supply to the RB relay. Failures of the type “breaking the opening contact or“ sticking the closing contact pasting when the relay RB is de-energized. At the same time, the relay RNb or RZa is triggered through the corresponding diode Dd, D1b ..., or D11 ", .... As a result, a 2L light is turned on through the RZaZ-P3a5 contacts of the RZa relay or contacts PH61-RNbZ, and the RB relay circuit is interrupted. “Tee” type failure may occur when the RB relay is on or when the RB relay is off. In the first case, the failure type "tee will be similar to the failure type" closing the opening contact. In the second case, the failure type "tee will be similar to the failure type" slam closure, his contact. Each of the 1L and 2L lamps signal three types of five outlets. The decoding of the actual type of failure and the corresponding failed contact is carried out according to the state of the lamps L, L, ..., L |. , L1, ..., Lf in L according to the table. During normal operation of the tested relays, when there are no failures, the lamps with indices a and b light up alternately. Determination of Contact Failure Type According to Stand Signal Lamps at Position IV of the Switch the output of which includes an alarm circuit, different from that, 10, in order to increase the reliability of control, and the output of the pulse generator is switched on, and the sensitive element is made of a sticking and Nezamika1sh. 2. The device according to claim 1, characterized by s, in order to ensure the fixation of short-term sticking, in series with the current contacts through an additional iodine circuit OR, and the contact of the sensitive element, windings of auxiliary relays are connected, the contacts of which shunted the failed test contact in flashing type . .. & Shch2 fm I -., fjgj - th