SU1698856A1 - Method of determining width of ferromagnetic resonance line in ferrite films at microwave frequencies - Google Patents

Abstract

The invention is intended to measure the width of a ferromagnetic resonance line in ferrite films (microwave. The purpose of the invention is to expand the functionality by measuring thick films of large diameter. Determining the width of the ferromagnetic resonance line is carried out by calculating the formula when registering the generation time of a microwave signal at a frequency equal to half the frequency of the input microwave magnetic field, 2 and l o

Description

The invention relates to radio measurements on microwave and can be used to measure the width of the ferromagnetic resonance line in ferrite films on microwave.

The aim of the invention is to expand the range of measured films.

FIG. 1 shows a functional diagram implementing the measurement method; in fig. 2 shows the dependence of the output power of the exciters at half the frequency on the power of the input signal.

The method is carried out as follows.

The input signal of a variable power level at a frequency of 6) is fed from the generator 1 to the exciter 2 of the ferrite film 3. A segment of the microstrip line (11Š1) can be used as the exciter. From the output of the exciter, the signal Pvb1) {is fed to the receiver 4, which selects

from it, the spectral component at the frequency (J / 2. The causative agent with a ferrite film is placed in an external magnetic field HO. When a signal is fed to a magnetic strip line in a ferrite film, a magnetostatic wave (MSB) is excited, for example, surface. If the level is input. power Pnv, exceeds threshold level

DA

Ppor, then a parametric excitation of spin waves occurs at a frequency of 0) / 2. Spin waves, in turn, excite ID and at its output a spectral component appears at the frequency (0/2. The appearance of this component at the output of the MLR corresponds to the achievement of the power of the bypass signal of the threshold level (FIG. 2). The threshold power level is proportional to the square of the width lynch frm.

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f

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AHR K | pnop Z6 / 2w,

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Pore

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J1698856

threshold power level; the impedance of the microstrip line; microstrip width;

instrumental constant.

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Claims (1)

Invention Formula The method for determining the width of the ferromagnetic resonance line in ferrite films on a microwave, including the effect of a constant magnetic field in the film plane and a pulsed microwave magnetic field, measuring the output power of the microwave signal from the film, changing the magnitude of the pulsed microwave field, characterized in that In order to expand the range of measured films, the output power of a pulsed microwave magnetic field is measured at a frequency equal to half the frequency of a pulsed microwave magnetic field, and the width of the ferromagnetic p line the resonance is determined by the formula A11 to 4Рпоо / Z0 / 2w, pore where Рр0р - threshold power level; ZQ is the characteristic impedance of the microstrip line; w is the microstrip line width; K is an instrumental constant. about Guw (sh / 2) 1