SU1458983A2 - Apparatus for measuring parameters of radiation output of x-ray radiator - Google Patents

Abstract

The invention relates to X-ray technology, and more specifically to measuring devices used for calibrating and adjusting X-ray equipment by measuring a pair of G1 Sr Tinos aO Aegem Novara I I S1 Ep meters of radiation output. The purpose of the invention is to provide the ability to control the aging of the radiator. To do this, enter a constant voltage source 16 into the device, a resistor 17 connected to it with two scales 18, 19 high voltages (U) and a scale of 20 effective energies (E.), besides between the first scale 18U and the scale 20 e corresponds to the dependence E j (i) for a new radiator, and the connection between the second scale 19 and the scale 20 Ej corresponds to dependence (U) for the depleted radiator; the resistor is equipped with three control outputs 21, 22, 23, the first 21 and the second 22 of which are connected through the amplifier 24 to one input of the dividing circuit 26, and ne The pry 21 and third 23 pins are connected through an amplifier 25 to another input of dividing circuit 26, the output of which includes an indicator 27 of equivalent thickness of filter 2 sludge. B (P el oo so 00 so

Description

The invention relates to x-ray technology, and in particular to measuring devices used for calibration and tuning of x-ray equipment by measuring the parameters of the radiation output.

The purpose of the invention is the ability to control the aging of the emitter.

Figure 1 shows a diagram of a device for measuring the parameters of the radiation output of an x-ray emitter; figure 2 - graphs explaining the operation of the device.

The device for measuring the parameters of the radiation output of the x-ray emitter contains two semiconductor detectors 1 and 2 with different spectral sensitivity, turned on towards each other, null-organ 3, a measuring variable resistor 4 with a scale of 5 effective energies, a scale of 6 high voltages, control pin 7 and engine 8 of the high voltage settings, amplifier 9, the first source of DC voltage 10 U, a correcting variable resistor 11 with a scale of 12 effective energies E _eff and a control terminal 13, circuit 1 4 divisions and a meter 15 for dose and / or dose rate, a second constant voltage source 16, a variable resistor 17 with the first 18 and second 19 voltage scales, a scale of 20 effective energies, the first 21, second 22 and third 23 control leads, two amplifiers 24 and 25, '· a division circuit 26 and an indicator 27 of equivalent filter thickness included at its output. In this case, the resistor 17 can be included in the circuit of the source 10, i.e. source 16 may be excluded from the circuit. In Fig. 2, curves 28, 29 and 30 show the dependences E _Si (U), respectively, ^ψ T. ^MMN for a new emitter, E (U) of the spent emitter E (U) and the emitter in some intermediate state E (U).

The device operates as follows.

X-ray radiation is incident on detectors 1 and 2 operating in the photovoltaic mode (short circuit mode), as a result of which electric currents flow in opposite directions along the circuit containing the zero-organ 3 and part of the measuring resistor 4. By moving the control output 7 achieve the conclusion of the zero-organ 3 in the zero position. Moreover, the position of the control terminal 7 carries information about the value of the effective radiation energy, which is read from the corresponding scale 5.

At the same time, the signal from the detector 2 through the amplifier 9 enters the division circuit 14, to the other input of which there is a signal from the correction resistor 11, the control terminal 13 of which is set on the effective energy scale 12 to the value E _E f determined on the scale 5 of the resistor 4. The scale 12 is calibrated taking into account the spectral characteristics of the detector 2, as a result, the output signal of the division circuit 14 used to measure the dose and / or dose rate by the meter 15 has a character independent of the spectral sensitivity of the detector 2.

In the described part, the operation of the device is completely identical to the prototype.

To determine the aging state of the emitter, the device operates as follows.

As can be seen from curves 28 and 29 (Fig. 2), the aging of the emitter leads to an increase in the effective radiation energy at the same high voltage settings. To determine the degree of sta- rhenium emitter or equivalent filter thickness _(a m e. Filter, for example of aluminum, which, when introduced into a new beam emitter provides the same dependence of _{E? F} (U), that the emitter and aged) may be by measuring otnosheniyaDE (U ) / / Г “U (U), where (Ю Г ((= = E1T (u) - E ^M D ^H (u); 4E ^M D ^KC (u) = EeG (u) - (U) (Fig .2). The value of ^{M DM} DE (U) is determined by the scales 5 and 6 of the measurement of the variable resistor 4. for this connection between the scale and the scale of 5 U 6 U set in accordance with the curve 28 'When measuring engine 8 is mounted on the pa e rs high voltage value U _chsg. adjoint E _eff value on the scale 5 is the value of E (U). Having described by

EF c value is E _e4 , ”on a scale of e it is possible to determine the value of DE ^M e £ Chi).

14589 * 83

Then, the following manipulations are performed with the control terminals 21, 22 and 23 of the resistor 17. The first terminal 21 is set to U _4CT according to the first high voltage scale 18, which is connected to the effective energy scale 20 with the same dependence 28. The second terminal 22 is also set to U _mouth on the second second scale 19 of high voltages, which is associated with the scale 20 of the limiting dependence 29 (figure 2), determined in advance for this type of emitters, i.e. now, on a scale of .20 15, it is possible to determine the value 4E ^ ₄ * ^C (U) by counting the difference between the positions of terminals 21 and 22. The third terminal 23, using the value of E ^and * 4 · (U) determined on the scale of resistor 4, a scale of 20 le 20 is set to the corresponding value of dE ^and D ^m (U) from the value of Ee <(, indicated by the position of terminal 21.

As a result, a voltage proportional to 25E 4 U (U) is supplied to the input of the amplifier 25, and a voltage proportional to 25E is supplied to the input of the amplifier 24

DE (U) о Dividing these values in the division circuit 26 allows you to get a signal output to the scale of indicator 30 27, graduated in values of the equivalent filter thickness.

Claims (1)

Claim A device for measuring the parameters of the radiation output of an x-ray emitter according to ed. No. 1300665, characterized in that, in order to ensure the possibility of controlling the aging of the emitter, a variable measuring resistor with an effective energy scale E _{e <} f is equipped with a high voltage U scale connected to it, and the connection between the scales corresponds to the characteristic E (U) of the new emitter, the device introduced an alternating resistor connected to an existing or additional constant voltage source with three scales and three control leads, two amplifiers, a second division circuit and an equivalent filter thickness indicator a, moreover, the resistor is equipped with two high voltage scales and one effective energy scale, the connection between the first high voltage scale and the effective energy scale corresponds to the characteristic E (.and; of a new emitter, the connection between the second high voltage scale and the effective • energy scale corresponds to the limiting characteristic E (U) the spent emitter, the first and second control terminals of the variable resistor are connected to the first amplifier, the first and third control terminals of the variable resistor are connected to the second amplifier, the outputs of the amplifiers are connected to the inputs of the division circuit, at the output of which an indicator of equivalent filter thickness is turned on.