SU1318801A1 - Method of placing spectrum lines in microphotometer slit - Google Patents

Abstract

This invention relates to emission spectral analysis. The purpose of the invention is to improve the performance of the analysis by increasing the rate at which the lines are directed to the microphotometer slit (MF). The comparison spectrum is made in the form of a template with the reference lines characteristic for the studied part of the spectrum. An analytical line is projected onto the slit of the MF from the spectrum of the working standard sample (PCO). The template is installed in the plane of the MF screen so that its reference lines are aligned with the RSO lines. Replace the RSO spectrum with the specimen of the samples studied and combine its spectral lines with the reference lines of the template. In this case, the wavelength corresponding to the analytical line will be displayed on the slit of the MF. The use of a template installed directly at the MF slit increases the speed at which the analytical line is drawn to the MF slit. 4 il. i cl 00 00

Description

The invention is from the field of emission spectral analysis with photographic recording of spectra.

The aim of the invention is to increase P1 performance by speeding up the process of deduction of the analytical line to the microphotometer's slot, increasing accuracy and sensitivity (lowering the lower limit of determining the elements) of the emission spectral analysis.

The method of outputting spectral lines to the slit of the microphotometer is to first make a template, to create which it is necessary to project the studied spectral spectrum of the working standard sample or sample on the screen of the microphotometer, put it on the screen of the spectral definition of lanthanum

paper (template) and mark the position of the reference lines. The analytical spectral line of the element being determined should be in the center

(La) usually used analytic spectral line D 324.51 The location of the most characteristic spectral lines, nm: Fe 323.93;

template and marked, for example, arrows - 25 324,42; 324.60; 324.74; 324.82;,. Ti

whoa. After the template has been made, it is positioned in the slot in the plane of the microphotometer screen, and a photo plate with spectra of the samples under study is installed on the microphotometer subject table, then a portion of the working standard sample is drawn on the microphotometer screen and the template is aligned with the reference standard sample. The template thus installed should remain in the same position throughout the photometry of the line under investigation. Then, photometric measurement of the spectral lines of the studied samples is carried out by removing the part of the spectrum where the spectral line of the element being detected is located at the slit of the microphotometer. Moving the spectrum using a micro-screw microphotometer, combine the spectral lines of the extracted portion of the spectrum of the sample under investigation with the reference lines of the template. When these lines are combined on the slit of the microphotometer, the analytical spectral line of the element being determined will appear. The readings of the galvanometer microphotometer will be close to the maximum blackening of the spectral line. Then micro-movements are carried out and a maximum reading of the galvanometer is taken. If at the maximum counting reper323, 90; 324.20i 325, .19; Mp 324.38; 324.85; Zr 324.10; Ni 324.31; C 324.75; La 324.24 and etc. - Reper line 1 in the spectrum near the analytic

The 30th La 324.51 nm line, usually present in the spectra of samples and standard samples, is shown on pattern 2 (Fig. 1). Pattern 2 is located in the plane of the screen 3 at the slit 4 mic

35 photometers. Then, on the screen 3, the project is ru.tc a part of the spectrum of the working standard sample 5, in which the analytical line La 324.5 is clearly visible (this is usually done according to the maximum reading of the galvanometer), its output is on the slit 4 of the microphotometer. The case on screen 3 of the microphotometer is shown in FIG. 2, After that you need to carefully with

45 move the pattern 2, the most number of reference lines 1 of pattern 2 with the spectral lines of the spectrum of the standard sample 5, with the arrow marked on the pattern 2

The analytic line of the investigated La 324.51 test 50 appears on the slit 4 of the microphotometer (Fig. 3). The position of pattern 2 that is thus in such a way must be maintained in all

55 subsequent measurements of the blackening of the analytical La line at 324.51 nm in the spectra of the studied samples. By removing the spectrum of the working standard image by moving the table of the microphotometer

Since the template lines are not aligned with the spectral lines of the sample under study, a non-spectral line of the element under test is displayed on the slit of the microphotometer.

Fig, 1 schematically shows the position of the template relative to the slit of the microphotometer; in fig. 2 shows the spectrum of a working standard sample with an analytical line drawn to the slit of the microphotometer; FIG. 3 - reference lines of the template, aligned with the corresponding lines of the working standard sample (analytical line is located opposite the slit (as its continuation); Fig. 4 - reference lines of the template, combined with the corresponding line of the sample spectrum. Example, For emission

(La) A commonly used analytical spectral line is D 324.51 nm. Location of the most characteristic spectral lines, nm: Fe 323.93;

324.42; 324.60; 324.74; 324.82;,. Ti

323.90; 324.20i 325, .19; Mp 324.38; 324.85; Zr 324.10; Ni 324.31; C 324.75; La 324.24 and etc. of the reference lines 1 in the spectrum near the analytical line La 324.51 nm, usually present in the spectra of samples and standard samples, is shown on template 2 (Fig. 1). Template 2 is placed in the plane of the screen 3 at the slit 4 microphotometer. Then, on the screen 3, there is a design of the spectrum of the working standard sample 5, in which the analytical line La 324.51 nm is clearly visible (this is usually done by the maximum reading of the galvanometer), and it is output to the slit 4 of the microphotometer. on the screen 3 of the microphotometer is shown in FIG. 2, After that, it is necessary to carefully combine, moving the pattern 2, the greatest-. the number of reference lines 1 of pattern 2 with the spectral lines of the spectrum of the standard sample 5, with an arrow marked on the pattern 2

The analytical line of the investigated element La 324.51 is opposite the slit 4 of the microphotometer (Fig. 3). The position of pattern 2 selected in this way must be maintained in all

subsequent measurements of the blackening of the analytical La line at 324.51 nm in the spectra of the studied samples. By removing the working standard sample 5 by moving the table of the microphotometer, on screen 3, design the spectrum of sample 6 and combine the most characteristic spectral lines of sample 6 with the reference lines 1 of template 2 (FIG. 4). In this case, the analytical line La 324.51 nm (or the place where it should be) will be displayed on slot 4 of the microphotometer. The value of its blackening is boring by the maximum indication of a galvanometer. If, when a maximum is found, the spectral lines of the sample do not coincide with the reference lines 1 of pattern 2, then in slit 4 there is not the desired analytical line La 324.51 nm. It is then concluded that the La 324.51 nm line is not in the sample spectrum.

Claims (1)

Invention Formula A method for removing spectral lines on the slit of a microphotometer, consisting of mounting photographic plates with spectra on its subject table the studied samples and the subsequent orientation of the spectral lines of the comparison spectrum and the spectrum of the studied samples relative to the slit of the microphotometer according to the maximum indication of its galvanometer when removing not the slit of the analytical spectral line, characterized in that, in order to increase the spectral line velocity, for the studied spectrum, reference lines, design a portion of the spectrum of the working standard sample on the screen of the microphotometer and output iticheskuyu the slit line photometer, set pattern in the screen plane parallel to the working range of the sample and combine fiducial pattern lines with lines of the working sample is then replaced with the working range of the standard sample spectrum of samples and combine it with the spectral lines of the reference lines template. Phie.1 FIG. 2 Fig.Z Fi $.