SU1305688A1 - Device for checking digital units - Google Patents

Abstract

The invention relates to instrumentation technology and can be used to test digital blocks. The purpose of the invention is to expand the field of application by allowing the control of the contact of the digital unit in a two-contact connection node. The device contains a clock generator, pulse shapers, a key block, a mode setting unit, a reference block, three comparison blocks, and a load block. The device in the first operation mode checks the presence of contact between the inputs / outputs of the monitored digital unit and the contacts of the two-contact node. In the second mode, the diagnostics of the operation of the digital unit is checked. 4 il. (Since the OS ate about: a and

Description

The invention relates to a measuring and control technique and can be used for testing digital blocks.

The purpose of the invention is to expand the field of application by allowing the control of the contact of the digital unit in a two-contact connection node.

FIG. Figure 1 shows the setup of the device W at the control input of the device unit 16 using the example of one input and output of the digital block under control; in Fig. 2, the contact circuit of the contact node — the contact of the monitored digital block — the contact of the contact node — J5 handle per pair of two contacts; in fig. 3 shows an example of the execution of a task setting mode; in fig. 4 - key block.

The device contains a controlled

25

block 1, two-terminal node 2 of sub-switch-20 when checking contact of the contact, block 3 of loads, reference block 4, block 5 of keys, blocks 6 and 7 of pulse conditioners, discharge blocks 8 and 9 of comparison, block 10 of triggers, block 11 of task operating mode, pseudo-random code generator 12, pseudo-overlapping pulse generator 13, trigger block 14, switches 15 and 16, display block 17, connection node contact groups 18-20, controlled-input terminal 21, clock generator 22, load block resistors 23 , bit unit 24 as compared nor, output contact 25 of the controlled block, trigger 26.

In the contact checking mode, the bipolar signals are set at the outputs of block 11, that block 5 of keys, block 6 of drivers, blocks 14 and 15 are brought to a non-working state, and blocks 7, 10 and 16 are put to working. In this case, the tested block 1, the contact node 2 and the reference block 4 do not receive the supply voltage through the block 5 of the keys. Block 6 of the formers is set to a non-conducting state and does not pass the output signals of the pseudo-random code generator 12 to the inputs of the reference block 4, contact node 2 and the monitored block 1. The block 14 causes the 1st contact of the contact node to disappear by a signal at the unit installation. - the contact of the tested block is the 2nd Contact of the contact node, it is checked in this mode and the contact of the contact node circuit is a contact of the tested block (Fig. 2), then bipolar pulses are sent to each contact of the contact node 20 opposite polarity. If in contact node 2 there are no contacts 21 and 25 of the tested node 1 between contacts 18 and 19 and the corresponding contacts am 20 of node 2, then contacts 18 and 19 and the corresponding each

35 of them, contact 20 will always have different pulses, one of the comparison bits of the comparison block 9 is set to state 1, and the corresponding 1st trigger of block 10 upon arrival

40, the gate pulse input from the generator 22 is set to state 1, and the corresponding element of block 16 is set to state O and includes the corresponding

The 45th element of the display unit 17. If contacts 21 and 25 of the block under test are located in the two-contact assembly 2 and there is a need for galvanic connection between pairs 18-20 and 19-20 of the contacts, then contacts 18 and 19 and the contacts 20 corresponding to them due to the required ratio of output resistance of the block elements 7 and resistors 23 blocks

50

The 45th element of the display unit 17. If contacts 21 and 25 of the block under test are located in the two-contact assembly 2 and there is a need for galvanic connection between pairs 18-20 and 19-20 of the contacts, then contacts 18 and 19 and the contacts 20 corresponding to them due to the required ratio of output resistance of the block elements 7 and resistors 23 blocks

In the state 1, the corresponding output of the block 15 is in the connection 55 3 loads will be the same potential 1, the corresponding indicator aly, and all the discharge bits of the block 17 of the display unit are not functioning, the block 7 is set to the current state and all the triggers of the block 10 are in the state O, all the electrical and bistable pulses from the generator outputs 13 of the pseudo-overlapping pulses are fed to the input and output contacts of the monitored block 1 and the contacts of the contact node 2. The installation input of the block 10 receives a signal l resolution, does not interfere with trigger signal from the information and strobe inputs,

An enabling signal was added that does not interfere with the operation of block 16 from the signals at the information inputs.

Bipolar pulses of the same polarity come from the outputs of block 7 and block 3 of the nacontact assembly 2. These contacts correspond to the input and output of the controlled unit 1. Since

when checking contact

If the 1st contact of the contact node — the contact of the tested block — 2nd contact of the contact node — is working, then the contact of the contact node is checked in this mode, the contact of the tested block (Fig. 2), then at each contact contact node 20 receives bipolar pulses of opposite polarity. If in contact node 2 there are no contacts 21 and 25 of the tested node 1 between contacts 18 and 19 and the corresponding contacts am 20 of node 2, then contacts 18 and 19 and the corresponding each of

The contact 20 will always have different-polarity pulses, one of the comparison bits of the comparison block 9 is set to state 1, and the corresponding 1st trigger of block 10 when the strobe pulse from the generator 22 is set to state 1, and the corresponding element of the block 16 is set to the state O and includes the corresponding element of the block 17 of the display. If there are contacts 21 and 25 of the tested block in the two-contact node 2 and there is a need for galvanic connection between the pairs 18-20 and 19-20 of the contacts, then contacts 18 and 19 and the corresponding contacts 20 due to the required ratio of the output resistance of the block elements 7 and resistors 23 blocks

3 loads will be the same potential, and all bits of the discharge unit

3 loads will be the same potential, and all bits of the discharge unit

9 comparisons and all triggers of unit 10 are in the state O, all elements of the unit 16 are in state 1, and the corresponding indicators of the display unit 17 are in the off state, which determines the state of reliable contact of the contacts in the two-contact unit 2 and the ability to switch to the functional control mode of the tested block 1.

In the function control mode, the outputs of block 11 are set to be inverse to the signals of the contact check mode. In this case, the key block 5 supplies the power supply voltage to the power contacts of the reference block 4, the checked block 1, changing state by means of ensuring that the elements of the block 6 are brought to a conducting state, enables the operation of block 14 and block 15. Sequences of logical words From the group of outputs of the generator 12, a pseudo-random code begins to flow through the block of drivers to the same inputs of the reference 4 and the checked 1 blocks, the outputs of which excite the corresponding output logic signals. The signals to the identical output The blocks 1 and 4 are compared by the comparison block 8 and, at their inequality, the corresponding triggers of the block 14, the logic elements of the block 15 and the display elements of the display block 17, which in this case signal malfunctions of the tested block on the corresponding outputs, excite.

During the test, an open / short circuit of the input / output circuit may be perceived by the unit being tested and / or the monitoring device as a logic signal. In this case

verification of the actually faulty unit 40 of the first bit of the comparison unit, vyk can give a positive result. In addition, due to the lack of reliable contact in the input circuits in the tested block, relaxation phenomena may occur, which in the modes of 45 fast-flowing tests can give unstable results that worsen the reliability of the test. With guaranteed contacting of all contacts of the tested block, these phenomena 50 are excluded.

Thus, before starting the function of a monitored block to be checked, the monitored input of the block to be checked in month-55 is controlled by the equal input of the key block and from the intse detachable connections to the control unit. This operation makes it possible to detect the absence of electrical connection in detachable connections, localize them, and then produce reliable functional control of the digital unit.

(invention formula

A control unit of digital blocks containing a pseudo-overlapping pulse generator, a key block, an operation mode setting block, a reference block, two trigger blocks, two discharge comparison blocks, two switches, characterized in that, in order to expand the region of 0

contact control digital unit in a two-pin connection node, the device contains a third bit comparison unit, a load unit, a pseudo-random code generator, two pulse shaper units and a display unit, the first output of the pseudo-non-overlapping pulses connected to the C-inputs of the triggers of the first block Inverse S-inputs of which are connected to the first output of the operation mode setting block, to the control input of the first switch and to the enable inputs of the first driver pulse drivers The first group of outputs of which is the group of outputs of the device for connection to the first group of m contacts (m is the number of inputs of the monitored digital block) of the two-contact connection node, to the first group of outputs of the load block, to the first group of outputs of the second block of pulse drivers and to the first group of information inputs

0

five

moves Equal to all bits of which are connected to the D inputs tn of the first block triggers, the output group of which is connected to the first group of information inputs of the first switch, the output group of which is connected to the first group of information inputs of the display unit, the second group of information inputs of which is connected to the output group of the second the switch, the control input of which is connected to the second output of the job setting unit, with the enable input of the second pulse shaper unit, with the inverse S-inputs of the second flip-flops The block of inputs whose group of outputs is connected to the group of information inputs of the second switch, the C inputs of the flip-flops of the second block are connected to the outputs of the pseudo-random code generator, the output group of which is connected to the group of information inputs of the second block of drivers of pulses, the second group of outputs is connected to the group of inputs of the reference block The group of outputs of which is connected to the group of inputs of the second bit comparison unit, the outputs of which equally all bits are connected with the D-BXOs of the corresponding trigger The second block, the second group of inputs of the second bit comparison block is connected to the second group of outputs of the first block of pulse shapers, with the second group of outputs of the load block, to the first group of inputs of the third and 5 negative supply of the digital block under control, respectively, of the group of inputs and outputs connected to the corresponding 2p and 2d contacts (, ..., t, d 1, ..., p) of the first and second groups of the two-contact connection node, the first and second inputs of the operation mode setting unit are connected to the single and zero buses potentials of the device of the corresponding comparison block and is the group of outputs of the device for connecting to the first group of n contacts (n is the number of outputs of the monitored digital block) of the two-contact connection node, the third and fourth groups of the outputs of the first block are -5 worlds impulses are a group comparison unit connected

pami outputs of the device for connecting to the second groups m and p contacts of the two-contact connection node, respectively, connected to the third and fourth groups of outputs of the load block, respectively, and connected to the second groups of inputs of the first and third discharge comparison blocks, respectively, the second and third outputs of the pseudo-overlapping pulse generator are connected with information inputs iK (, ..., m), jx

(j 1, ..., n) and k-x (;.,., 2tn), 1-x (, ..., 2n) pulse shapers of the second group, respectively, the input of the load block is connected to the bus

unit potential and is connected to the first information input of the key block, the second information input of which is connected to the zero potential bus of the device, the first and second outputs of the key block are connected to the positive and negative power inputs of the reference block and are the outputs of the device for connecting to the positive inputs

and negative power of the monitored digital block, respectively, whose input and output groups are connected to the corresponding 2p and 2d contacts (, ..., t, d 1, ..., p) of the first and second groups of the two-contact connection node, the first and second inputs of the block the operation mode settings are connected to the unit and zero potentials buses of the device, respectively; the outputs Equivalent to the third bit comparison unit are connected

with the D inputs of the p flip-flops of the first block, the mode setting block contains a dual switch, the first pair of fixed contacts of which is connected to the first and second inputs of the mode setting block and connected to the second pair of contacts of the dual switch, respectively, the contacts of the moving pair of which are connected to the first and the second outputs of the mode setting block, respectively.

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Compiled by A. Sirotska Editor T. Gerber Tehred L. Kravchuk

Order 1453/47 Circulation 673 Subscription

VNIIPI USSR State Committee

for inventions and discoveries 113035, Moscow, Zh-35, Raushsk nab., 4/5

Production and printing company,. Uzhgorod, st. Project, 4

 KOfifnaxn contact moe node

08im of the contacting Clock

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Proofreader L. Patay

Claims (1)

Claim A digital block control device comprising a pseudo-overlapping pulse generator, a key block, an operating mode setting block, a reference block, two trigger blocks, two bit comparison blocks, two switches, characterized in that, in order to expand the scope of application due to the possibility of contact control digital block in a two-pin connection node, the device contains a third bit comparison block, a load block, a pseudo-random code generator, two pulse shaper blocks and an indicator block and, the first output of the pseudo-overlapping pulse generator is connected to the C-inputs of the triggers of the first block, the inverse S-inputs of which are connected to the first output of the operation mode setting block, with the control input of the first switch and with the resolution inputs of the pulse shapers of the first block, the first group of outputs of which is the group of outputs of the device for connecting to the first group of m contacts (w is the number of inputs of the controlled digital unit) of the two-contact connection node, to the first group of outputs of the load block, to the first group of outputs of the second block of pulse shapers and the first group of information inputs of the first discharge comparison block, the outputs of which are equally connected to the D-inputs of m triggers of the first block, the group of outputs of which is connected to the first group of information inputs of the first switch, the group of outputs of which is connected with the first group of information inputs of the display unit, the second group of information inputs of which is connected to the group of outputs of the second switch, the control input of which is connected to with the output of the operation mode setting unit, with the enable input of the second block of pulse shapers, with the control input of the key block and with inverse S-inputs of the triggers of the second block, the group of outputs of which is connected to the group of information inputs of the second switch, C-inputs of the trigger 1305688 'ditch of the second block is connected to the outputs of the pseudo-random code generator, the group of outputs of which is connected to the group of information inputs of the second block of pulse shapers, $ the second group of outputs of which is connected to the group of inputs of the reference block, the group of outputs of which is connected to the group of inputs of the second discharge comparison unit, outputs As well as all bits of which are connected to the D-inputs of the corresponding triggers of the second block, the second group of inputs of the second bit comparison block is connected to the second group of outputs in the first block of pulse shapers, with the second group of outputs of the load block, with the first group of inputs of the third bit comparison block and is the group of outputs of the device for connecting to the first group of η contacts (n is the number of outputs of the controlled digital block) of the two-contact connection node, the third and fourth groups the outputs of the first block of pulse shapers are groups of outputs of the device for connecting to the second groups m and η of contacts of the two-contact connection node, respectively, connected to the third the fourth groups of outputs of the load block, respectively, and are connected to the second groups of inputs of the first and third bit comparison blocks, respectively, the second and third outputs of the pseudo-overlapping pulse generator are connected to the information inputs i-κ (1 == 1, ..., 111), jx (j = 1, ..., n) and kx (k = m + 1; ..., 2m), 1-x (l = n + 1, ..., 2n) of the second group of pulse shapers, respectively, the input of the load block connected to the unit potential bus of the device and connected to the first information input of the key block, the second information input of which is connected the bus of the device’s zero potential, and the first and second outputs of the key block are connected to the inputs of the positive and negative power supply of the reference block and are the outputs of the device for connecting to the inputs of the positive and negative power of the controlled digital block, respectively, the groups of inputs and outputs of which are connected to the corresponding 2p and 2d contacts (p = 1, ..., m, d = 1, ..., η) of the first and second groups of the two-contact connection node, the first and second inputs of the operating mode setting unit are connected to the unit and zero buses of the device potentials, respectively, the outputs of the same third bit comparison block are connected to the D-inputs η of the triggers of the first block, and the mode setting block contains a dual switch, the first pair of fixed contacts of which are connected to the first and second inputs of the mode setting unit and connected to the second pair of contacts of the dual switch accordingly, the contacts of the movable pair of which are connected to the first and second outputs of the mode setting unit, respectively. FI.G.1 7 ~ t ~ u pin contact node A fault from the contacts of the tested Block — d2 ~ th contact of the contact node FIG. 2 To control unit 11 Fi. 4-