SU1278693A1 - Method of measuring the dissipation ability of radiator - Google Patents

Abstract

The invention relates to analytical chemistry and can be used in the X-ray spectral analysis of materials of complex chemical composition in laboratories, production, and in natural conditions. The aim of the invention is to expand the capabilities of X-ray analysis methods by using chipless equipment. Secondary X-ray intensities are measured; or gamma radiation from the emitter at the same angle of scattering and constant width of the receiving slit in front of the detector using an external standard with three blenders with different diameters of circular holes in the center alternately mounted on the radiation source window. After that, the scattering (L ability of the radiator using the relative intensity ratio measured in place of the lines of coherently and incoherently scattered radiation by calculation is determined. 1 ill. 1C 00 O) from 00

Description

The invention relates to analytical chemistry and can be used in the analysis of materials of complex chemical composition of powders, solutions, alloys in analytical laboratories, as well as to determine the density of media, the ratio of liquid and solid in the pulp of the beneficiation industry, the degree of water content and porosity of the walls. exploration and production wells in mining, ore texture in natural conditions, etc. using the means of nuclear-physical monitoring as composition sensors, The aim of the invention is to expand the capabilities of X-ray analysis methods by using chipless equipment. The proposed method for determining the scattering ability of the emitter can be implemented by analyzing powdery, liquid, and solid materials using an X-ray crystal diffraction spectrometer or X-ray radiometric analysis. Experimental verification of the method of determining d G / dS product with those using artificial preparations and pp-rich ores and industrial products from their processing plant. The preparations include elements with Z 8-82, Artificial preparations consisting of the initial components of SiO ,, Pe ,, 0з, ZnO, Se, ZrO: PbO, are simulated by the scattering ability of fluorspar routs, industrial products of their processing. The scattering ability of artificial drugs varies for PdKct, i, o radiation within (0.4-7.6) 10, and (0.6-1, I) -U. HsMepeiffle background intensities in place of lines coherently and incoherently scattered by the sample of the primary characteristic radiation were performed on a two-channel short-wave FRS-7 spectrometer. ; 3.5 BVH 8 (Pd), body .2 PT, beryllium output window 3 PT thick. 0.05 cm, sample-emitter 4, output collimator 5, effectively scattering volume 6 of the emitter, hood 7 of lead with a thickness of 0.5-1.0 mm or more. The PT axis is perpendicular to the surface of the sample emitter (the average angle of incidence of the primary beam on the sample is 90 °), the angle of selection of the secondary radiation, which ensures the registration of radiation quanta scattered through the angle. High voltage source: power supply provides voltage generation up to 70 kV at a current of 50 WA. Secondary radiation is decomposed into a spectrum of a 0.012 cm thick quartz crystal with the reflecting plane lOTO. Radiation is recorded with a scintillation counter (its resolution is equal to 60% of CuK.Q radiation.). The energy selection of pulses is performed by a single-channel amplitude pulse analyzer (AAI) in differential mode. The resolution of the instrument is characterized by the instrumental width of the fluorescent KO. - lines at half maximum height of about 0.0002 nm. The hood is installed directly on the exit window of the PT. The choice of the diameters D, / of the holes of the blend is not related to the size of the sample emitter, since the size of the latter is determined by the design features of the instrument, first of all, PT. The maximum possible size of the opening of the hood is determined by the size of the exit window PT (in the present case , 0 CMJ, and the minimum - by the permissible error of measuring the signal, kg-, H1, and tp and N f J, as well as the difficulty of making blends with small hole diameters. At 5 cm, the error of the experiment was caused by the inaccuracy of the manufacturer and the installation of the blend. It needs 10–15 rel.%, The quality of workers chooses the values of Dj, which in the first interval of the i J: (D, -) monotonic dependence for samples of different chemical composition, in the range from 0.5 to 3.0 cm. Analyzed The powder-like sample is poured into a spectrometric cuvette, irradiated with a flux of primary X-ray PT, and background intensities are measured in place of lines of co-efficient and incoherently scattered primary characteristic radiation of PdK with three alternate blends. D, 1.0 cm, 0 2.0 cm, Dg 3.0 cm. A similar operation was carried out with an external standard.

The scattering power of the radiator is determined as follows.

First, relative background intensities are calculated, measured in place of the lines of coherently and incoherently scattered primary characteristic radiation.

(v-ffSH- С (°,

kg

N iiS-l

N :: I (D,)

I--

then for each blend is a ratio

., r; (D, -), -), and the values of d G / dfi and for a specific wavelength Ap and scattering angle 0 are determined by calculation.

Claims (1)

Invention Formulation Method. the emitter’s ability, including the irradiation of the sample being analyzed with primary x-ray or gamma radiation, the quanta energy of the characteristic component of which does not coincide with the excitation energies of the fluorescent radiation of any of the main elements of the sample and the characteristic lines of these elements, and the absorption edges of the latter do not fall within the wavelength interval between the lines of coherently and non-coherently scattered samples of lervical characteristic radiation, and the measurement of the relative interatisivities of the background in the area of these lines using the standard of comparison, m due to the fact that, in order to expand the capabilities of X-ray analysis methods through the use of crystal-free equipment, the measurements are carried out with three but install 1 mi on the output window of the x-ray or gamma-ray source with blends of different diameters and determine the scattering ability of the emitter using measured values of the relative intensities of the background.