SU1231381A1 - Device for measuring width of defects - Google Patents

Description

1231381

This invention relates to a measurement technique.

The purpose of the invention is to expand the use of the device by making it possible to measure the depth of defects and to increase the measurement accuracy.

1 shows a device for. defect width measurements, general view; in Fig. 2 is a section A-A in Fig. T; on fig.Z - view along arrow B in figure 2; figure 4 is a view along arrow B in figure 2.

The device contains a base t, a hollow rack 2, rigidly mounted on the base 1, spring-loaded. spring 3 shaft 4, located inside the hollow rack 2 can be moved along it, housing 5, connected to the rack 2 rotatably moving relative to it, flange 6 rigidly connected to housing 5, sleeve 7 with groove 8, installed in case 5 the possibility of rotation and fixation of the stopper 9 and the shaft 4 can be rotated, the measuring elements and the reference node, made in the back mounted on the shaft 4 with the possibility of rotation of the transparent plane-parallel plate 10 with a scale 11 in the form of a spiral of Archimedes and with scale 12, lenses 13 and 14 and arrows 15, rigidly mounted on the spring-loaded shaft 4 diametrically opposite, risk 14 lenses 13 are perpendicular to the arrow 15. On the base 1, the adjusting screws 16, level 17 and limiter 18 are installed ..

The device works as follows.

To measure the width of the lens X defect, the device is installed on the surface area under study so that when you send a line through lens 13 one side of the line coincides with figure 14. At the same time, the rotation: m plate 10 sets the scale to zero pressure 12 against the arrow 15. With the help of adjustment screws 16 bases 1 and level 17 achieve a sharp image of the surface and the edges of the defect. With a rough surface, the image of the edges of the defect should be sharp. .

Then, pressing the device to the surface of the product behind the base 1 and

Observed an enlarged image of a line (defect) section through lens 13, rotate plate 10 until one of the Archimedes spiral lines on the scale 11 touches the measured line on the other side. At that moment, when the line under study is between risk 14 and the nth helix line, the counting is recorded by means of a division of a scientific research institute on scale 12 and the number of the helix line.

To measure the depth of the defect, set the zero division of the scale 12 against the pointer 15 again. Then move the stopper 9 into the groove 8 of the sleeve 7

IJ and thus the mmm are fixedly connected to the sleeve 5 with the sleeve 7. Then, observing an enlarged image of the area of the defect through the lens 13, rotate the plate 10 until a sharp image 2Q appears on the bottom of the defect and take the reading on the scale 12 and arrow 15 to the dollars x units and an integer number of units are determined when the body 5 returns to the BejpxHee position until it stops.

25 of the flange 6 of the housing 5 to the base stop 18. In this case, the width of the bottom of the defect can be determined in the same way as described.

Formula of the invention

A device for measuring the width of defects, containing a base, measuring elements and a reading unit, is so that, with the aim of expanding the field of application and improving the accuracy of measuring j, it is equipped with a hollow on the base, spring-loaded shaft, located inside the hollow stand with the ability to move along Her, body connected to the stand with the possibility of rotation and movement relative to it, sleeve, mounted on the body with the possibility of rotation and fixation and on the shaft rotation, measuring elements And the readout node are imprinted in the shaft mounted on the shaft with the possibility of rotation of a transparent plane-parallel plate with a scale in the form of an Archimedes spiral and with a circular scale, lenses with a risk and an arrow rigidly mounted on a spring-loaded shaft are diametrically opposite, and the risk of a lens is perpendicular the arrow.

/ 3

(fus.2

VidB turned

eight

(fJuff.3

Compiled by I.Garanina Editor A.Ogar .Tehred V.Kadar Proofreader V. But ha

Order 2555/46 Circulation i670 Subscription

VNIIPI USSR State Committee

for inventions and discoveries 113035, Moscow, Zh-35, Raushsk nab., 4/5

Production and printing company, Uzhgorod, Projecto st., 4

RieA

Claims (1)

^ Claims A device for measuring the width of defects, containing a base, made up of measuring elements and a measuring unit, * which, in order to expand the scope and improve the accuracy of measurement, it is equipped with a hollow stand, mounted rigidly on a base, spring-loaded by a shaft located inside the hollow rack with the possibility of movement along it, a housing connected to the rack with the possibility of rotation and movement relative to it, a sleeve mounted on the housing with the possibility of rotation and fixing and on the shaft with With rotation, the measuring elements and the reading unit are made in any case mounted on the shaft with the ability to rotate a transparent ⁵ plane-parallel plate with a scale in the lead of the Archimedes spiral and with a dial, lenses with a risk and arrows, rigidly mounted on a spring-loaded shaft diametrically opposite, and the risk of the lens perpendicular to the arrow. View B rotated view C fieZ fie.4-