SU1213443A1 - Apparatus for testing semiconductor instruments - Google Patents

Description

2. The device according to claim 1, about tl and, moreover, in order to reduce the power consumption of the device, the generator is designed as a trigger, the first and second outputs of which are connected to the inputs of the first and second integrating circuits, respectively. different time constants, the outputs of which are connected respectively to the first and second inputs of the diode assembly, the output of which is connected to the input of the blocking generator, the output of which is connected to the counting input of the trigger.

3. The device according to claim 2, characterized in that the trigger is full bridge and contains the first and second capacitors, the first, second, third, fourth and fifth resistors, the first and second diodes, the first, second, third and fourth transistors of the first conductivity type and the fifth and sixth transistors of the second type of conductivity, the emitters of which are connected to the first pin of the first resistor, the second pin of which is connected to the first pin of the second resistor and the base of the second transistor, the emitter of which is connected to the pen

one

The invention relates to control devices of various types of semiconductor devices for their integrity and the direction of their inclusion and can be used in instrument making.

A device for monitoring semiconductors is known, which contains an indicator and a switch m.

A disadvantage of the known device is the low speed, due to the need to perform a significant number of manual operations in the control circuits containing semiconductor elements.

A device for monitoring semiconductor devices is known, comprising a pulse generator with paraphase outputs, the first output of which is connected to the first probe, and the second to the anode of the first and the cathode of the second.

13443

the first capacitor and the third resistor outputs, the second outputs of which are connected to the base of the third transistor, the emitter of which is connected to the emitter of the first transistor, whose collector is connected to the second output of the second resistor and collector of the fifth transistor, whose base is connected to the collector of the second transistor, the collector of the third transistor connected to the first output of the fourth resistor and the collector of the sixth transistor, the base of which is connected to the collector of the fourth transistor, whose emitter is connected n the first outputs of the second capacitor and the fifth resistor, the second outputs of which are connected to the base of the first transistor, the second output of the fourth resistor is connected to the base of the fourth transistor and the type of the first diode, the type of the base of the fourth: transistor, the second The first diode diode is connected to the second diode diode of the same name, the first diode of which is connected to the base of the second transistor.

the LEDs, the cathode of the first and the anode of the second LEDs are connected to the second probe pj.

A disadvantage of this device is the possibility of obtaining false information about the health of a semiconductor device when one of the two display elements, the LED, is deactivated.

In a known device, during the breakdown of the diode being tested, both LEDs light up. If one of the LEDs of the known device fails, then only one LED will illuminate during the check of the breakdown diode, which is typical of a properly working diode.

The aim of the invention is to increase the reliability of the control.

The goal is achieved

. that the device for control of 3

The first device connected to the first output of the pulse generator with paraphase outputs, the display element and the second probe is equipped with a diode bridge, the first diagonal of which is connected between the second output of the generator and the second probe, the second diagonal of the bridge is connected between the first. and the second element of the indication element, and a generator with a duty cycle other than 0.5 was used as a pulse generator.

In order to reduce consumption. the device power generator is made in the form of a trigger, the first and second outputs of which are connected to the inputs of the first and second integrating circuits, respectively, with different time constants, the outputs of which are connected respectively to the first and second inputs of the diode assembly, the output of which is connected to the blocking-generator input whose output connected to the counting trigger input.

. The trigger is made bridge and contains the first and second capacitors, the first, second, third, fourth and fifth resistors, the first and second diodes, the first, second, third and fourth transistors of the first conductivity type and the fifth and sixth transistors of the second conductivity type, whose emitters connected to the first pin of the first resistor, the second pin of which is connected to the first pin of the second resistor and the base of the second transistor, the emitter of which is connected to the first pin, the first capacitor and the third resistor, the second pin to ohs connected to the base of the third transistor, the emitter of which is connected to the emitter of the first transistor, the collector of which is connected to the second output of the second resistor and the collector of the fifth transistor, the base of which is connected to the collector of the second transistor, the collector of the third transistor connected to the first transistor of the fourth resistor and the collector of the sixth transistor , the base of which is connected to the collector of the fourth transistor, the emitter of which is connected to the first transistors of the second capacitor and the fifth resistor, the second The outputs of which are connected to the base of the first transistor, the second

43

The fourth resistor is connected to the base of the fourth transistor and that pin of the first diode, typ. the conductivity of which is opposite to the conductivity type of the base of the fourth transistor, the second one of the first diode is connected to the same diode of the second diode, the first of which is connected to the base of the second transistor. )

Figure 1 shows the block diagram

devices for monitoring semiconductor devices; FIG. 2 is a block diagram of a pulse generator; FIG. Fig. 3 is a schematic diagram of a trigger; in Fig. 4, the status of the LED indicator depending on the output signals from the pulse generator and the state of the tested semiconductor device.

The device for monitoring semiconductor devices contains the first probe I connected to the first generator output 2 pulses with para-phase outputs, the display element 3, the second 1 center 4, diode bridge 5, the first diagonal of which is connected between the second generator output 2 and the second probe 4. As generator 2, a generator with

duty cycle other than 0.5.

The generator 2 pulses contains (figure 2) trigger 6, the first and second outputs of which are connected to the inputs, respectively, of the first 7 and second 8

integrated circuits with different time constants, the outputs of which are connected respectively to the first and second inputs of the diode assembly 9, the output of which is connected to the input of the blocking generator 10, the output of which is connected to the counting input of the trigger.

The trigger 6 (fig.Z) is made bridge and contains the first 11 and second

I 2 capacitors, first 13, second 14, third 15, fourth 16 and fifth fifth resistors, first 18 and second 19 diodes, first 20, second 21, third 22, fourth 23 transistors

the first type of conductivity (and -r-p) and the fifth 24 and test 25 transistors of the second type of conductivity (the emitters of which are connected to the first pin of the first resistor, 13, the second

the output of which is connected to the first output of the second resistor 14 and the baoy of the second transistor 21 of the first conductivity type, the emitter of the second

connected to the first terminals of the first capacitor 1 1 and the third resistor 15, the second terminals of which are connected to the base of the third transistor 22 of the first conductivity type, the emitter of which is connected to the emitter of the first transistor 20, the collector of which is connected to the second output of the second resistor 14 and the collector of the fifth transistor 24 The base is connected to the collector of the second transistor 21, the collector of the third transistor 22 is connected to the collector of the fourth transistor 23, the emitter of which is connected to the first terminals of the second condensate and 12 and the fifth resistor 17, the second vyuody which are connected with the base of the first transistor 20, a second vshod fourth resistor 16 connected to the base of the fourth transistor 23 and the vgoodom; the first diode 18, the conductivity type of which is opposite to the conductivity type of the base of the fourth transistor 23, the second output of the first diode 18 is connected to the same output of the second diode 19, the first pin of which is connected to the base of the second transistor 21.

The device for monitoring semiconductor devices operates as follows.

Before starting the operation, the power is turned on, with rectal pulses with a duty cycle different from 0.5 in antiphase from the codes of the generator 2 (fig. 4a), i.e. if the potential at one output is zero, then the other has a high potential.

The duration of T pulse on one output is significantly longer than the duration of the TC on the other output. The generation frequency is selected within the limits of the human eye's ability to distinguish the damping and ignition of the LED of the display element 3. .

Probes 1 and 4 touch the terminals of the monitored element, such as a diode. In this case, depending on the state of the semiconductor diode, the LED will have four different states.

1. Between the probes 1 and 4, there is a fault in the diode circuit, i.e. diode failure in the form of its circuit failure. When this fault diode current through the LED is missing and it is extinguished (figb).

2. Between the probes I and 4 there is a short i 5 circuit, i.e. faulty semiconductor diode in the form of a short circuit. In this case, the current through the LED will always flow in any states of the output signals at the outputs of generator 2, since the LED of the display element 3 is included in the diagonal of the bridge through which the direct current will flow. In one state of the generator, the current flows through the diodes Q and B, and in the other state through the diodes S and (Fig. 4c.

3. The semiconductor diode is healthy and its polarity corresponds to

0 set. In this case, a current flows only through the LED and the resistor of the display element when it travels its way through the diodes I, probe 4, diode and probe 1 (fig.4g).

5 Since a pulse of short duration T (2) is forced from the second output of generator 2 (2), the LED lights up for a short time, corresponding to the pulse duration

0 output frequency generator 2.

4. The semiconductor diode is normal, but its polarity is wrong, i.e. opposite to the polarity of the previous case. In this case, a current flows through the LED and the limiting resistor of the indication element 3 only when

at the first output of the generator there is a high positive potential, and it flows through the probe 1, the diode, the probe 4, the diode of the bridge a, the LED and the resistor, the diode 5, the second output of the generator 2,

Due to the fact that at the first output the duration of the pulse Tc 1 is large fig.4d), there is a continuous burning, LED with a short flashing.

Thus, the proposed device, with one touch of the diode being tested, informs the operator about the polarity of the diode on and its integrity, with an indication of the type of malfunction (short-circuited diode or in its circuit).

The square pulse generator () allows you to set virtually any required duty cycle of the generated pulses.

0

five

Generator 2 works as follows.

Suppose that trigger 6 is in a state where the voltage at its output 1 is close to the size of the power source, and at the output I is equal to zero, and the capacitors of the integrating circuits are voltage. Since the output And there is a high potential, the capacitor of the integrating circuit 7 through the circuit resistor is charged, and the capacitor of the circuit 8 cannot be charged. At the emitter of the transistor of the blocking generator 10, the voltage is approximately equal to the voltage on the capacitor plate of the integrating circuit 7, which is applied to it through the open diode of the assembly 9.

As long as the voltage on this capacitor is less than the voltage at the base of the blocking generator transistor, the base-transition of this transistor is shifted in the opposite direction and the transistor is locked. At the time when the voltage across the capacitor of the transistor at the base of the transistor is exceeded, a current flows through the emitter winding of the transformer blocking generator and a blocking process occurs, resulting in a pulse at the output winding of its pulse transformer and another triggering state in which at output L, the voltage is equal to the voltage of the power supply, and the voltage at output 1 is zero.

After the trigger 6 transitions to a new stable state, the capacitor of the integrating circuit 7 is quickly discharged, and the capacitor of circuit 8 begins to charge and the process repeats

The time spent by trigger 6 in one and in another position corresponds to the charge time of the corresponding capacitor of integrating circuits 7 and 8 to the voltage on the base of the blocking generator transistor.

The ratio of the charge times of capacitors can be obtained in several tens of orders due to the different capacitors of capacitors and resistors of the integrating circuits 7 and 8.

The trigger (FIG. 3) works as follows.

After the supply voltage is applied to the base of the transistor 21, current flows through the resistor 13, as a result of which transistors 24 and 21, 22 open, the voltage on the collector of the transistor 24 rises, there is a high potential at the first output of the trigger and zero potential at the second. In this case, the voltage on the resistor 15 and the capacitor 11 is almost equal to the voltage of the power source, and the voltage on the resistor 17 is zero, therefore the diode 19 is locked by the reverse voltage of the base of the transistor 21, and there is practically no blocking potential on the diode 18.

The amplitude of the pulses fed to the anodes of diodes 19 and 18 from the block generator is less than the voltage of the power supply, so when a pulse arrives at the trigger code, the current will flow only through the diode 18, the base-emitter junction of the transistor 23, the capacitor 12 and the base -emitter junction of the transistor 20. At the same time, the transistors 25, 23, 20 open, the diode 18 is locked, the transistors 21, 24, 22 are closed, and a high potential appears at the second output of the trigger. Due to the fact that the capacitor 11 was charged almost to the voltage of the power source, transistor 21, despite the continued impact of the output pulse, will be closed for as long as the capacitor 11 is discharged through a resistor 15. Time constant the discharge of capacitors 11 and 12 can be made obviously longer than the largest possible duration of the input pulse, which provides a more reliable transfer of a bridge trigger compared with other types of triggers when exposed to pulses with different parameters both in duration and in amplitude. After switching the trigger, the capacitor 12 is charged by the emitter current of the transistor 23 before the voltage of the power source and the diode 18 is shifted in the opposite direction.

With the arrival of the next pulse, the trigger returns to its original state in a similar manner.

Thus, in the proposed device, the possibility of sorting out a deliberately unsuitable semiconductor device as suitable is excluded, since when the LED of the display element 3 fails to function in the proposed device, in principle, information characteristic of a working diode cannot be displayed. At that time, the proposed device saves the entire scope of the checks provided by the known device. The proposed device can check the presence or absence of a connection between the tested connections (broken or short circuit), it can be used as a probe of the output of the logic element O or 1. At the same time, if the voltage between the probes is absent, then the LED will be if the voltage of the logical unit is present on the probe 4, then the LED will flash with the frequency of the generator 2.

If the duty cycle of the pulses from generator 2 is set to 0.5, then the device can be used to check the condition of the capacitors, while changing the state of generator 2, the LED lights and then goes off as the capacitor under test goes off. When the state changes from the output of the generator, the LED again lights up and then goes out, and the LED time is proportional to the capacitance of the capacitor under test. Thus, a rough check is made of the condition of a capacitor both on its approximate capacity and on an open circuit or short circuit. The advantage of this generator circuit is that when the voltage value changes at the base of the blocking generator transistor, the pulse generation frequency changes when the pulse duty ratio remains constant at 5 times the entire frequency range change.

The advantage of this generator is also that its frequency practically remains unchanged when the voltage of the power source changes, which is important when powering the device from the battery. This is due to the fact that P15I changes the source voltage, for example, in the direction of decreasing it, decreases voltage 5 from the output of the trigger, decreases voltage at the base of the blocking generator transistor, i.e. the compensation of the charge rate of the capacitors of the integrating circuits is compensated; 0, as a result of which the generator operating frequency tends to remain unchanged.

Thanks to the timed control circuits, the pulse duration can be adjusted without changing the time between pulses, and, conversely, the time between pulses can be adjusted without changing the pulse duration.

The use of the proposed flip-flop eliminates power losses on the auxiliary elements and reduces the possibility of an unwanted flip of the trigger when the parameters of the input pulse change, 5 remove from the input pulse various restrictions, for example, on duration, amplitude, shape, input to the trigger for the operation time of the transient process determined by the capacitors 11 and 12) of the pulse train, which is perceived by the trigger as a single pulse.

five

srig.Z

//// l Sdeglodi Orit Sbetod redeemed

Claims (2)

1. DEVICE FOR CONTROL OF SEMICONDUCTOR DEVICES, comprising a first probe connected to the first output of a pulse generator with papase outputs, an indication element and a second probe, which is necessary in order to increase the reliability of control, it is equipped with a diode bridge, the first diagonal of which is connected between the second output of the generator and the second probe, the second diagonal of the bridge is connected between the first and second outputs of the indication element, and a generator with a duty cycle different from 0.5. (rig. 1. The device according to π. 1, with the proviso that, in order to reduce the power consumption of the device, the generator is made in the form of a trigger, the first and second outputs of which are connected to the inputs ; respectively, the first and second integrating circuits with different time constants, the outputs of which are connected respectively to the first and second inputs of the diode assembly, the output of which is connected to the input of the blocking generator, the output of which is connected to the counting input of the trigger. 3. The device pop. 2, characterized in that the trigger is made by a bridge and contains the first and second capacitors, the first, second, third, fourth and fifth resistors, the first and second diodes, the first, second, third and fourth transistors of the first type of conductivity and the fifth and sixth transistors the second type of conductivity, the emitters of which are connected to the first terminal of the first resistor, the second terminal of which is connected to the first terminal of the second resistor and the base of the second transistor, the emitter of which is connected to the first X terminals of the first capacitor and the third resistor the second terminals of which are connected to the base of the third transistor, the emitter of which is connected to the emitter of the first transistor, the collector of which is connected to the second terminal of the second resistor and the collector of the fifth transistor, the base of which is connected to the collector of the second transistor, the collector of the third transistor is connected to the first terminal of the fourth resistor and the collector the sixth transistor, the base of which is connected to the collector of the fourth transistor, the emitter of which is connected to the first terminals of the second capacitor and the fifth resistor RA, the second terminals of which are connected to the base of the first transistor, the second terminal of the fourth resistor is connected to the base of the fourth transistor and that terminal of the first diode, the conductivity type of which is opposite to the type of conductivity of the base of the fourth transistor, the second terminal of the first iodine is connected to the terminal of the same name as the second diode, the first terminal of which connected to the base of the second transistor.