SU1196682A1 - Arrangement for measuring surface irregularity - Google Patents

Abstract

A DEVICE FOR MEASUREMENTS OF SURFACE UNIFORMITY, containing a drum with discs along the edges, mounted on a drum of a series of electrodes with m electrodes in each row, a high-voltage power source f, characterized in that, in order to expand its functionality, it is equipped a wave line of delay connected to a high-voltage power source, current transformers, a calibrator connected by the corresponding inputs to the outputs of current transformers, a microprocessor connected to the output of the calibrator 1., electrodes in each row, they are insulated from each other and each of them is connected to a high-voltage power source through separate current-conducting plates, the corresponding current transformer SL and a segment of the delay line, and the high-voltage power source is made in the form of series-connected square pulse generator § and high voltage transformer.

Description

The invention relates to a measurement technique and can be used in the construction industry in particular to determine the roughness parameters of various surfaces, for example, the correlation function of roughness.

The purpose of the invention is to expand the functionality of the device by determining with its help the parameters of the correlation function of the surface roughness.

FIG. 1 is a block diagram of the device; Fig. 2 shows a drum structure with electrodes; in fig. 3 - the location of the isolated electrodes on the drum (two electrodes are shown) and the connection of the electrodes with conductive plates.

The device contains a drum 1 (Figs. 1 and 2), along the edges of which the disks 2 are located, on the drum there are electrodes 3 arranged in rows. The drum 1 is connected to the disks 2 by means of bearings 4, and through the journals 5 (fig. 2) it is movably connected with guides 6 (fig. 1), which are movably connected via an axis to the bed 7.

Each insulated electrode 3 through a separate current-carrying plate 8 (Fig. 3) is connected to the corresponding one; the high-voltage winding of the current transformer 9 and through the inductance of the wave line 10 are embedded to one of the poles of the high-voltage transformer 11.

A high voltage transformer 11 and a generator 12 rectangular pulses (Fig. 1) form a high voltage power source. On the one hand, each current transformer 9 through the calibrator 13 is connected to the microprocessor 14, on the other hand, to the corresponding inductance of the delay wave line 10 and to the power source. Wave line 10 consists, for example, of a system of capacitors 15-21, coils 22-28 of inductance and a wave resistance of 29. In FIG. 1, only seven capacitors and seven inductors are shown. Their actual number is equal to the number of electrodes in one row on the drum, reduced by 1. The multicore cable 30 (Fig. 2) connects the electrodes 3 inside the bar. 96682 2

by 1. Electrodes are located along the surface of the drum in a row. The distance between the individual electrodes 3 in the row and between the rows of electrodes

5 is determined by the sampling interval l t f LC.

The device works as follows.

The linear movement of the plastic controlled surface 31 (the direction of movement is indicated by an arrow on the surface) is beneficial. Coupling it with the disk 2 is converted into an angular movement of the disk 2 and the drum 1 with electrodes 3 (the direction of the angular movement of the disk and the drum is shown by an arrow on the disk), the drum 2 rotates around an axis on the bearings 4 (Fig. 2), and the neck of the axis 5 is fixed on the guide x 6 movably (Fig. 1). The axis of rotation of the guides 6 is fixed on the bed 7. The electrodes 3 (Fig. 1-3) are isolated, each electrode 3 is connected to the power source Flko when it will occupy a vertical position to the plane of adhesion of the disks 2 with the plastic surface 31. In Fig. 2 are electrodes 3 of the lower row, which are connected through the stranded cable 30 to the current-carrying plates 8. The value of the ordinates of different points of the surface 31 is estimated by the currents passing through the individual 3 row electrodes, the value of which will depend on the air gap HL, ( Fig. 2) between the end of the electrode and the nearest point of the surface 31. To eliminate current leaks across the array, which is located at closely spaced electrodes, the device provides for connecting 3 rows of electrodes with a time shift, This is realized by connecting each electrode to the corresponding LC circuit of the delay wave line 10.

The values of the currents passing through 50 each electrode 3 and proportional to the ordinates of the surface under study through the corresponding current transformer 9 and calibrator 13 are recorded in the memory of the microprocessor 14.

Thus, information on the coordinates of surface points is recorded in the microprocessor memory. 3 which characterize the unevenness of the test surface. Further, these ordinates work out 11966824 s according to the appropriate algorithm, for example, the roughness correlation formula is determined.

eight

Claims (1)

DEVICE FOR MEASURING SURFACE Roughness, containing a drum with discs at the edges, mounted on the drum η rows of electrodes along w electrodes in each row, a high-voltage power supply <. . characterized by the fact that, in order to expand functionality ,. it is equipped with a wave delay line connected to a high-voltage power supply, current transformers, a calibrator connected to the outputs of the current transformers, a microprocessor connected to the output of the caliber. two, the electrodes in each row are made isolated from each other and each of them is connected to high-voltage power supply through separate conductive plates corresponding to the current transformer and the length of the delay line, and the high-voltage power supply is made in the form of the last They are connected to a rectangular pulse generator and a high voltage transformer. SU- · "1196682 <1196682