SU119613A1 - Method for contactless measurement of high potentials - Google Patents
Method for contactless measurement of high potentialsInfo
- Publication number
- SU119613A1 SU119613A1 SU601732A SU601732A SU119613A1 SU 119613 A1 SU119613 A1 SU 119613A1 SU 601732 A SU601732 A SU 601732A SU 601732 A SU601732 A SU 601732A SU 119613 A1 SU119613 A1 SU 119613A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- high potentials
- contactless measurement
- measurement
- under study
- measuring device
- Prior art date
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
Измерение высоких потенциалов производитс посредством измерительных трансформаторов напр жени , шаровых разр дников или емкостных делителей напр жени . Первые два способа достаточно точны, но требуют значительных капитальных затрат. Третий способ дает большие погрешности. В тех случа х, когда класс измерительного устройства не должен быть очень высоким (например, дл релейной зашиты), целесообразно примен ть более простой способ измерени . Дл этой цели предлагаетс в исследуемое электрическое поле помешать двухэлектродную лампу, в цепь которой включены последовательно источник питапи и электроизмерительный прибор, позвол юший определ ть значение потенциала.The measurement of high potentials is carried out by means of voltage measuring transformers, ball gaps or capacitive voltage dividers. The first two methods are fairly accurate, but require significant capital expenditures. The third method gives large errors. In cases where the class of the measuring device does not have to be very high (for example, for relay protection), it is advisable to use a simpler measuring method. For this purpose, it is proposed to interfere with a two-electrode lamp in the electric field under study, in the circuit of which a power source and electrical measuring device are connected in series, allowing the potential value to be determined.
На чертеже изображена схема бесконтактного измерени высоких потенциалов по предлагаемому способу.The drawing shows a diagram of the contactless measurement of high potentials by the proposed method.
В исследуемое поле помеш,ают двухэлектродную лампу /, в анодную цепь которой последовательно включены источники питани 2 и измерительный прибор 3.In the field under study, the two-electrode lamp / is placed, in the anode circuit of which the power sources 2 and the measuring device 3 are connected in series.
При неизменном анодном напр жении лампы / величина ее анодного тока будет пропорциональна величине измер емого напр жени , так как электрическое поле играет роль управл юш,ей сети. Поэтому по показанию прибора 3 можно определ ть значение потенциала в исследуемом поле.With a constant anode voltage of the lamp / the value of its anode current will be proportional to the magnitude of the measured voltage, since the electric field plays the role of control, it network. Therefore, according to the reading of the device 3, it is possible to determine the potential value in the field under study.
Предмет изобретени Subject invention
Способ бесконтактного измерени высоких потенциалов в электрическом поле, отличаюшийс тем, что, с целью упроидени процесса измерений, в исследуемое поле помеш,ают двухэлектродную лампу, в цепь которой включены последовательно источник питани и электроизмерительный прибор, и значение потенциала определ ют по показанию этого прибора.ДA method of contactless measurement of high potentials in an electric field, characterized in that, in order to streamline the measurement process, a two-electrode lamp is interfered in the field under study, the circuit of which includes a power supply and an electrical measuring device in series, and the potential value is determined by the reading of this device. D
/ II/ II
II
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU601732A SU119613A1 (en) | 1958-06-13 | 1958-06-13 | Method for contactless measurement of high potentials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU601732A SU119613A1 (en) | 1958-06-13 | 1958-06-13 | Method for contactless measurement of high potentials |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU119613A1 true SU119613A1 (en) | 1958-11-30 |
Family
ID=48391556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU601732A SU119613A1 (en) | 1958-06-13 | 1958-06-13 | Method for contactless measurement of high potentials |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU119613A1 (en) |
-
1958
- 1958-06-13 SU SU601732A patent/SU119613A1/en active
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