SG71938A1 - Method and apparatus for inspecting an object - Google Patents
Method and apparatus for inspecting an objectInfo
- Publication number
- SG71938A1 SG71938A1 SG9903910A SG1999003910A SG71938A1 SG 71938 A1 SG71938 A1 SG 71938A1 SG 9903910 A SG9903910 A SG 9903910A SG 1999003910 A SG1999003910 A SG 1999003910A SG 71938 A1 SG71938 A1 SG 71938A1
- Authority
- SG
- Singapore
- Prior art keywords
- inspecting
- Prior art date
Links
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG9903910A SG71938A1 (en) | 1999-08-12 | 1999-08-12 | Method and apparatus for inspecting an object |
TW088114356A TW432570B (en) | 1999-08-12 | 1999-08-20 | Method and apparatus for inspecting an object |
MYPI99003606A MY124668A (en) | 1999-08-12 | 1999-08-23 | Method and apparatus for inspecting an object |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG9903910A SG71938A1 (en) | 1999-08-12 | 1999-08-12 | Method and apparatus for inspecting an object |
Publications (1)
Publication Number | Publication Date |
---|---|
SG71938A1 true SG71938A1 (en) | 2001-03-20 |
Family
ID=20430408
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG9903910A SG71938A1 (en) | 1999-08-12 | 1999-08-12 | Method and apparatus for inspecting an object |
Country Status (3)
Country | Link |
---|---|
MY (1) | MY124668A (en) |
SG (1) | SG71938A1 (en) |
TW (1) | TW432570B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5619145A (en) * | 1993-06-19 | 1997-04-08 | Tokyo Electron Limited | Probe apparatus and method for inspecting object using the probe apparatus |
JPH09211068A (en) * | 1996-01-30 | 1997-08-15 | Matsushita Electron Corp | Device for inspecting semiconductor device and method therefor |
JPH10209227A (en) * | 1997-01-20 | 1998-08-07 | Sony Corp | System and device for inspecting semiconductor integrated circuit, and method for inspecting semiconductor circuit |
US5839769A (en) * | 1996-10-03 | 1998-11-24 | Kinetrix, Inc. | Expanding gripper with elastically variable pitch screw |
WO1999003764A1 (en) * | 1997-07-16 | 1999-01-28 | Systemation Engineered Products, Inc. | Tray handling apparatus |
DE19731738A1 (en) * | 1997-07-23 | 1999-02-18 | Siemens Ag | Checking and correcting faulty contact arrangements of integrated semiconductor components |
JPH11186323A (en) * | 1997-12-19 | 1999-07-09 | Toshiba Corp | Electronic component sampling inspection apparatus |
-
1999
- 1999-08-12 SG SG9903910A patent/SG71938A1/en unknown
- 1999-08-20 TW TW088114356A patent/TW432570B/en not_active IP Right Cessation
- 1999-08-23 MY MYPI99003606A patent/MY124668A/en unknown
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5619145A (en) * | 1993-06-19 | 1997-04-08 | Tokyo Electron Limited | Probe apparatus and method for inspecting object using the probe apparatus |
JPH09211068A (en) * | 1996-01-30 | 1997-08-15 | Matsushita Electron Corp | Device for inspecting semiconductor device and method therefor |
US5839769A (en) * | 1996-10-03 | 1998-11-24 | Kinetrix, Inc. | Expanding gripper with elastically variable pitch screw |
JPH10209227A (en) * | 1997-01-20 | 1998-08-07 | Sony Corp | System and device for inspecting semiconductor integrated circuit, and method for inspecting semiconductor circuit |
WO1999003764A1 (en) * | 1997-07-16 | 1999-01-28 | Systemation Engineered Products, Inc. | Tray handling apparatus |
DE19731738A1 (en) * | 1997-07-23 | 1999-02-18 | Siemens Ag | Checking and correcting faulty contact arrangements of integrated semiconductor components |
JPH11186323A (en) * | 1997-12-19 | 1999-07-09 | Toshiba Corp | Electronic component sampling inspection apparatus |
Also Published As
Publication number | Publication date |
---|---|
TW432570B (en) | 2001-05-01 |
MY124668A (en) | 2006-06-30 |
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