SG71938A1 - Method and apparatus for inspecting an object - Google Patents

Method and apparatus for inspecting an object

Info

Publication number
SG71938A1
SG71938A1 SG9903910A SG1999003910A SG71938A1 SG 71938 A1 SG71938 A1 SG 71938A1 SG 9903910 A SG9903910 A SG 9903910A SG 1999003910 A SG1999003910 A SG 1999003910A SG 71938 A1 SG71938 A1 SG 71938A1
Authority
SG
Singapore
Prior art keywords
inspecting
Prior art date
Application number
SG9903910A
Inventor
Chin Hiang Tan
Original Assignee
Mfg Integration Technology Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mfg Integration Technology Ltd filed Critical Mfg Integration Technology Ltd
Priority to SG9903910A priority Critical patent/SG71938A1/en
Priority to TW088114356A priority patent/TW432570B/en
Priority to MYPI99003606A priority patent/MY124668A/en
Publication of SG71938A1 publication Critical patent/SG71938A1/en

Links

SG9903910A 1999-08-12 1999-08-12 Method and apparatus for inspecting an object SG71938A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SG9903910A SG71938A1 (en) 1999-08-12 1999-08-12 Method and apparatus for inspecting an object
TW088114356A TW432570B (en) 1999-08-12 1999-08-20 Method and apparatus for inspecting an object
MYPI99003606A MY124668A (en) 1999-08-12 1999-08-23 Method and apparatus for inspecting an object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG9903910A SG71938A1 (en) 1999-08-12 1999-08-12 Method and apparatus for inspecting an object

Publications (1)

Publication Number Publication Date
SG71938A1 true SG71938A1 (en) 2001-03-20

Family

ID=20430408

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9903910A SG71938A1 (en) 1999-08-12 1999-08-12 Method and apparatus for inspecting an object

Country Status (3)

Country Link
MY (1) MY124668A (en)
SG (1) SG71938A1 (en)
TW (1) TW432570B (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619145A (en) * 1993-06-19 1997-04-08 Tokyo Electron Limited Probe apparatus and method for inspecting object using the probe apparatus
JPH09211068A (en) * 1996-01-30 1997-08-15 Matsushita Electron Corp Device for inspecting semiconductor device and method therefor
JPH10209227A (en) * 1997-01-20 1998-08-07 Sony Corp System and device for inspecting semiconductor integrated circuit, and method for inspecting semiconductor circuit
US5839769A (en) * 1996-10-03 1998-11-24 Kinetrix, Inc. Expanding gripper with elastically variable pitch screw
WO1999003764A1 (en) * 1997-07-16 1999-01-28 Systemation Engineered Products, Inc. Tray handling apparatus
DE19731738A1 (en) * 1997-07-23 1999-02-18 Siemens Ag Checking and correcting faulty contact arrangements of integrated semiconductor components
JPH11186323A (en) * 1997-12-19 1999-07-09 Toshiba Corp Electronic component sampling inspection apparatus

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619145A (en) * 1993-06-19 1997-04-08 Tokyo Electron Limited Probe apparatus and method for inspecting object using the probe apparatus
JPH09211068A (en) * 1996-01-30 1997-08-15 Matsushita Electron Corp Device for inspecting semiconductor device and method therefor
US5839769A (en) * 1996-10-03 1998-11-24 Kinetrix, Inc. Expanding gripper with elastically variable pitch screw
JPH10209227A (en) * 1997-01-20 1998-08-07 Sony Corp System and device for inspecting semiconductor integrated circuit, and method for inspecting semiconductor circuit
WO1999003764A1 (en) * 1997-07-16 1999-01-28 Systemation Engineered Products, Inc. Tray handling apparatus
DE19731738A1 (en) * 1997-07-23 1999-02-18 Siemens Ag Checking and correcting faulty contact arrangements of integrated semiconductor components
JPH11186323A (en) * 1997-12-19 1999-07-09 Toshiba Corp Electronic component sampling inspection apparatus

Also Published As

Publication number Publication date
TW432570B (en) 2001-05-01
MY124668A (en) 2006-06-30

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