SG120074A1 - Temporary conformable contacts for microelectroniccomponents - Google Patents

Temporary conformable contacts for microelectroniccomponents

Info

Publication number
SG120074A1
SG120074A1 SG202004730A SG202004730A SG120074A1 SG 120074 A1 SG120074 A1 SG 120074A1 SG 202004730 A SG202004730 A SG 202004730A SG 202004730 A SG202004730 A SG 202004730A SG 120074 A1 SG120074 A1 SG 120074A1
Authority
SG
Singapore
Prior art keywords
microelectroniccomponents
temporary
conformable
contacts
conformable contacts
Prior art date
Application number
SG202004730A
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Priority to SG202004730A priority Critical patent/SG120074A1/en
Publication of SG120074A1 publication Critical patent/SG120074A1/en

Links

SG202004730A 2002-08-06 2002-08-06 Temporary conformable contacts for microelectroniccomponents SG120074A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG202004730A SG120074A1 (en) 2002-08-06 2002-08-06 Temporary conformable contacts for microelectroniccomponents

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG202004730A SG120074A1 (en) 2002-08-06 2002-08-06 Temporary conformable contacts for microelectroniccomponents

Publications (1)

Publication Number Publication Date
SG120074A1 true SG120074A1 (en) 2006-03-28

Family

ID=36586198

Family Applications (1)

Application Number Title Priority Date Filing Date
SG202004730A SG120074A1 (en) 2002-08-06 2002-08-06 Temporary conformable contacts for microelectroniccomponents

Country Status (1)

Country Link
SG (1) SG120074A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5336992A (en) * 1992-06-03 1994-08-09 Trw Inc. On-wafer integrated circuit electrical testing
US5740007A (en) * 1996-06-10 1998-04-14 Hanwa Electronic Ind. Co., Ltd. CDM simulator
US6246250B1 (en) * 1998-05-11 2001-06-12 Micron Technology, Inc. Probe card having on-board multiplex circuitry for expanding tester resources

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5336992A (en) * 1992-06-03 1994-08-09 Trw Inc. On-wafer integrated circuit electrical testing
US5740007A (en) * 1996-06-10 1998-04-14 Hanwa Electronic Ind. Co., Ltd. CDM simulator
US6246250B1 (en) * 1998-05-11 2001-06-12 Micron Technology, Inc. Probe card having on-board multiplex circuitry for expanding tester resources

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