SG120074A1 - Temporary conformable contacts for microelectroniccomponents - Google Patents
Temporary conformable contacts for microelectroniccomponentsInfo
- Publication number
- SG120074A1 SG120074A1 SG202004730A SG202004730A SG120074A1 SG 120074 A1 SG120074 A1 SG 120074A1 SG 202004730 A SG202004730 A SG 202004730A SG 202004730 A SG202004730 A SG 202004730A SG 120074 A1 SG120074 A1 SG 120074A1
- Authority
- SG
- Singapore
- Prior art keywords
- microelectroniccomponents
- temporary
- conformable
- contacts
- conformable contacts
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG202004730A SG120074A1 (en) | 2002-08-06 | 2002-08-06 | Temporary conformable contacts for microelectroniccomponents |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG202004730A SG120074A1 (en) | 2002-08-06 | 2002-08-06 | Temporary conformable contacts for microelectroniccomponents |
Publications (1)
Publication Number | Publication Date |
---|---|
SG120074A1 true SG120074A1 (en) | 2006-03-28 |
Family
ID=36586198
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG202004730A SG120074A1 (en) | 2002-08-06 | 2002-08-06 | Temporary conformable contacts for microelectroniccomponents |
Country Status (1)
Country | Link |
---|---|
SG (1) | SG120074A1 (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5336992A (en) * | 1992-06-03 | 1994-08-09 | Trw Inc. | On-wafer integrated circuit electrical testing |
US5740007A (en) * | 1996-06-10 | 1998-04-14 | Hanwa Electronic Ind. Co., Ltd. | CDM simulator |
US6246250B1 (en) * | 1998-05-11 | 2001-06-12 | Micron Technology, Inc. | Probe card having on-board multiplex circuitry for expanding tester resources |
-
2002
- 2002-08-06 SG SG202004730A patent/SG120074A1/en unknown
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5336992A (en) * | 1992-06-03 | 1994-08-09 | Trw Inc. | On-wafer integrated circuit electrical testing |
US5740007A (en) * | 1996-06-10 | 1998-04-14 | Hanwa Electronic Ind. Co., Ltd. | CDM simulator |
US6246250B1 (en) * | 1998-05-11 | 2001-06-12 | Micron Technology, Inc. | Probe card having on-board multiplex circuitry for expanding tester resources |
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