SG117490A1 - A method for detecting probing stripes - Google Patents

A method for detecting probing stripes

Info

Publication number
SG117490A1
SG117490A1 SG200402723A SG200402723A SG117490A1 SG 117490 A1 SG117490 A1 SG 117490A1 SG 200402723 A SG200402723 A SG 200402723A SG 200402723 A SG200402723 A SG 200402723A SG 117490 A1 SG117490 A1 SG 117490A1
Authority
SG
Singapore
Prior art keywords
stripes
probing
detecting
detecting probing
probing stripes
Prior art date
Application number
SG200402723A
Inventor
Beng Ghee Tan
Original Assignee
Systems On Silicon Mfg Co Pte
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Systems On Silicon Mfg Co Pte filed Critical Systems On Silicon Mfg Co Pte
Priority to SG200402723A priority Critical patent/SG117490A1/en
Publication of SG117490A1 publication Critical patent/SG117490A1/en

Links

SG200402723A 2004-04-23 2004-04-23 A method for detecting probing stripes SG117490A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG200402723A SG117490A1 (en) 2004-04-23 2004-04-23 A method for detecting probing stripes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200402723A SG117490A1 (en) 2004-04-23 2004-04-23 A method for detecting probing stripes

Publications (1)

Publication Number Publication Date
SG117490A1 true SG117490A1 (en) 2005-12-29

Family

ID=35668190

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200402723A SG117490A1 (en) 2004-04-23 2004-04-23 A method for detecting probing stripes

Country Status (1)

Country Link
SG (1) SG117490A1 (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08306748A (en) * 1995-05-02 1996-11-22 Hitachi Ltd Inspection method for semiconductor element and manufacturing system of semiconductor element employing it
JPH0955409A (en) * 1995-08-11 1997-02-25 Hitachi Ltd Method and device for inspection of semiconductor element
JPH09321115A (en) * 1996-05-30 1997-12-12 Nec Yamagata Ltd Method for testing semiconductor integrated circuit and test controller
US6549863B1 (en) * 2000-03-23 2003-04-15 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for generating map data
US20030217317A1 (en) * 1999-07-02 2003-11-20 Oki Electric Industry Co., Ltd. Method and apparatus for displaying test results and recording medium

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08306748A (en) * 1995-05-02 1996-11-22 Hitachi Ltd Inspection method for semiconductor element and manufacturing system of semiconductor element employing it
JPH0955409A (en) * 1995-08-11 1997-02-25 Hitachi Ltd Method and device for inspection of semiconductor element
JPH09321115A (en) * 1996-05-30 1997-12-12 Nec Yamagata Ltd Method for testing semiconductor integrated circuit and test controller
US20030217317A1 (en) * 1999-07-02 2003-11-20 Oki Electric Industry Co., Ltd. Method and apparatus for displaying test results and recording medium
US6549863B1 (en) * 2000-03-23 2003-04-15 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for generating map data

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