SG117490A1 - A method for detecting probing stripes - Google Patents
A method for detecting probing stripesInfo
- Publication number
- SG117490A1 SG117490A1 SG200402723A SG200402723A SG117490A1 SG 117490 A1 SG117490 A1 SG 117490A1 SG 200402723 A SG200402723 A SG 200402723A SG 200402723 A SG200402723 A SG 200402723A SG 117490 A1 SG117490 A1 SG 117490A1
- Authority
- SG
- Singapore
- Prior art keywords
- stripes
- probing
- detecting
- detecting probing
- probing stripes
- Prior art date
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG200402723A SG117490A1 (en) | 2004-04-23 | 2004-04-23 | A method for detecting probing stripes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SG200402723A SG117490A1 (en) | 2004-04-23 | 2004-04-23 | A method for detecting probing stripes |
Publications (1)
Publication Number | Publication Date |
---|---|
SG117490A1 true SG117490A1 (en) | 2005-12-29 |
Family
ID=35668190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200402723A SG117490A1 (en) | 2004-04-23 | 2004-04-23 | A method for detecting probing stripes |
Country Status (1)
Country | Link |
---|---|
SG (1) | SG117490A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08306748A (en) * | 1995-05-02 | 1996-11-22 | Hitachi Ltd | Inspection method for semiconductor element and manufacturing system of semiconductor element employing it |
JPH0955409A (en) * | 1995-08-11 | 1997-02-25 | Hitachi Ltd | Method and device for inspection of semiconductor element |
JPH09321115A (en) * | 1996-05-30 | 1997-12-12 | Nec Yamagata Ltd | Method for testing semiconductor integrated circuit and test controller |
US6549863B1 (en) * | 2000-03-23 | 2003-04-15 | Mitsubishi Denki Kabushiki Kaisha | Apparatus and method for generating map data |
US20030217317A1 (en) * | 1999-07-02 | 2003-11-20 | Oki Electric Industry Co., Ltd. | Method and apparatus for displaying test results and recording medium |
-
2004
- 2004-04-23 SG SG200402723A patent/SG117490A1/en unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08306748A (en) * | 1995-05-02 | 1996-11-22 | Hitachi Ltd | Inspection method for semiconductor element and manufacturing system of semiconductor element employing it |
JPH0955409A (en) * | 1995-08-11 | 1997-02-25 | Hitachi Ltd | Method and device for inspection of semiconductor element |
JPH09321115A (en) * | 1996-05-30 | 1997-12-12 | Nec Yamagata Ltd | Method for testing semiconductor integrated circuit and test controller |
US20030217317A1 (en) * | 1999-07-02 | 2003-11-20 | Oki Electric Industry Co., Ltd. | Method and apparatus for displaying test results and recording medium |
US6549863B1 (en) * | 2000-03-23 | 2003-04-15 | Mitsubishi Denki Kabushiki Kaisha | Apparatus and method for generating map data |
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