SG114526A1 - Pressure-sensitive system and method of testing electronic device interconnections - Google Patents

Pressure-sensitive system and method of testing electronic device interconnections

Info

Publication number
SG114526A1
SG114526A1 SG200200586A SG200200586A SG114526A1 SG 114526 A1 SG114526 A1 SG 114526A1 SG 200200586 A SG200200586 A SG 200200586A SG 200200586 A SG200200586 A SG 200200586A SG 114526 A1 SG114526 A1 SG 114526A1
Authority
SG
Singapore
Prior art keywords
pressure
electronic device
sensitive system
testing electronic
device interconnections
Prior art date
Application number
SG200200586A
Other languages
English (en)
Inventor
Bohn David
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of SG114526A1 publication Critical patent/SG114526A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200200586A 2001-07-31 2002-01-30 Pressure-sensitive system and method of testing electronic device interconnections SG114526A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/919,256 US6512387B1 (en) 2001-07-31 2001-07-31 Pressure-sensitive system and method of testing electronic device interconnections

Publications (1)

Publication Number Publication Date
SG114526A1 true SG114526A1 (en) 2005-09-28

Family

ID=25441784

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200200586A SG114526A1 (en) 2001-07-31 2002-01-30 Pressure-sensitive system and method of testing electronic device interconnections

Country Status (4)

Country Link
US (1) US6512387B1 (zh)
EP (1) EP1288668A3 (zh)
SG (1) SG114526A1 (zh)
TW (1) TWI225156B (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7190440B2 (en) * 2002-09-17 2007-03-13 Seagate Technology, Llc Controlling compressive force using pressure sensitive film
TWI221531B (en) * 2002-10-25 2004-10-01 Hwan-Chia Chang Method for testing soldering reliability
US20080124528A1 (en) * 2006-11-29 2008-05-29 Motorola, Inc. Printed electronic device and methods of determining the electrical value thereof
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
US9703623B2 (en) * 2014-11-11 2017-07-11 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Adjusting the use of a chip/socket having a damaged pin
KR20180101476A (ko) 2016-01-08 2018-09-12 에어 테스트 시스템즈 일렉트로닉스 테스터 내의 디바이스들의 열 제어를 위한 방법 및 시스템
JP2017129395A (ja) * 2016-01-19 2017-07-27 三菱電機株式会社 半導体装置の検査装置および半導体装置の検査方法
US10345208B2 (en) 2016-07-12 2019-07-09 Deka Products Limited Partnership System and method for applying force to a device
US11299705B2 (en) 2016-11-07 2022-04-12 Deka Products Limited Partnership System and method for creating tissue
US11126195B2 (en) * 2017-06-12 2021-09-21 Faraday & Future Inc. System and method for detecting occluded objects based on image processing
CN112964399B (zh) * 2021-04-05 2022-07-29 西北工业大学 电子器件金属丝/弹簧片接触压力全自动测试仪及测试方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2263980B (en) * 1992-02-07 1996-04-10 Marconi Gec Ltd Apparatus and method for testing bare dies
JP3787185B2 (ja) * 1995-04-28 2006-06-21 アヴェンティス・リサーチ・ウント・テクノロジーズ・ゲーエムベーハー・ウント・コー・カーゲー 配線基板の配線の欠陥を検出する装置
US5894161A (en) * 1997-02-24 1999-04-13 Micron Technology, Inc. Interconnect with pressure sensing mechanism for testing semiconductor wafers

Also Published As

Publication number Publication date
US20030025494A1 (en) 2003-02-06
US6512387B1 (en) 2003-01-28
EP1288668A3 (en) 2003-12-17
TWI225156B (en) 2004-12-11
EP1288668A2 (en) 2003-03-05

Similar Documents

Publication Publication Date Title
AU2003213638A8 (en) Insertion device for an insertion set and method of using the same
IL158007A0 (en) Development and testing system and method
GB0216274D0 (en) Thred ending method and device parallel processor system
GB0207306D0 (en) An enabled device and a method of operating a set of devices
PL351322A1 (en) Methods and devices for enabling displays of electronic devices based on separation thereof
HK1052991A1 (zh) 用於數據輸入和顯示的設備和方法
EP1572265A4 (en) SYSTEM AND METHOD FOR SELECTING DEVICE OR PATIENT INTERFACE COMPONENT
EP1400792A4 (en) DEVICE AND METHOD FOR VIBRATION MEASUREMENT
EP1373467A4 (en) DEVICE AND METHOD FOR DETECTING MULTIPLE ANALYZES
HK1056537A1 (en) Device and method for modernising an elevator system
GB0311342D0 (en) Test system and method
SG106081A1 (en) Apparatus and method for testing semiconductor devices
GB0304664D0 (en) System and method for testing integrated circuit devices
HK1048870A1 (en) Device environment configuration system and deviceenvironment configuration method
SG107596A1 (en) System and method for testing circuits and programming integrated circuit devices
GB2404977B (en) An electronic device cooling system and method of use
TWI319485B (en) Probe card covering system and method for testing integrated circuits
SG114526A1 (en) Pressure-sensitive system and method of testing electronic device interconnections
GB0223715D0 (en) Device configuration method and apparatus
EP1483187A4 (en) MASKING DEVICE AND METHOD
AU2003235192A8 (en) The operational method and system of the telecommunication device for the electronic cash
AU2003232174A8 (en) Method and system for secure electronic transactions using an agent
GB2372767B (en) Anchoring device removal method and apparatus
AU2002362052A8 (en) Device and method using integrated neuronal cells and an electronic device
GB2369005B (en) Electronic device and method of operation